Granted Patent
Utility
US 6,800,551
· Confirmation No. 2657
CHEMICAL AMPLIFICATION TYPE PHOTORESIST COMPOSITION, METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE USING THE COMPOSITION , AND SEMICONDUCTOR SUBSTRATE
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-08-31 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-06-03 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-03 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 5 | View | |
| 2004-06-03 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-06-03 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-05-25 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-05-12 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-05-12 | SPEC |
Specification | 1 | View | |
| 2004-05-12 | CLM |
Claims | 8 | View | |
| 2004-05-12 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2004-05-12 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-05-12 | XT/ |
Extension of Time | 1 | View | |
| 2004-01-14 | CTNF |
Non-Final Rejection | 12 | View | |
| 2004-01-14 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-01-14 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-01-14 | FWCLM |
Index of Claims | 1 | View | |
| 2004-01-14 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-01-07 | SRNT |
Examiner's search strategy and results | 3 | View | |
| 2002-12-03 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-12-03 | ADS |
Application Data Sheet | 4 | View | |
| 2002-12-03 | SPEC |
Specification | 44 | View | |
| 2002-12-03 | CLM |
Claims | 6 | View | |
| 2002-12-03 | ABST |
Abstract | 1 | View | |
| 2002-12-03 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2002-12-03 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-12-03 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-12-03 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2002-12-03 | SPEC |
Specification | 44 | View | |
| 2002-12-03 | CLM |
Claims | 6 | View | |
| 2002-12-03 | ABST |
Abstract | 1 | View | |
| 2002-12-03 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-12-03 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-12-03 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-12-03 | ADS |
Application Data Sheet | 4 | View | |
| 2002-12-03 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 11 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 9 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 27 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 33 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 38 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 5 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 26 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 7 | View | |
| 2002-12-03 | FOR |
Foreign Reference | 39 | View | |
| 2002-12-03 | FRPR |
Certified Copy of Foreign Priority Application | 49 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
438/638
H10P14/665
H10P76/2041
H10W20/085
H10W20/081
H10W20/0888
H10W20/097
G03F7/0045
G03F7/0392
Y10S438/949
Prosecution
- Examiner
- SARKAR, ASOK K
- Art Unit
- 2829
- Customer No.
- 466
- Docket No.
- 8045-1006
- Confirmation No.
- 2657
Foreign Priority
2001-369039
·
2001-12-03
·
JAPAN
Publication
- Pub. No.
- US20030157806A1
- Pub. Date
- 2003-08-21
Patent Term Adjustment
-28days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-12-03
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Quick Facts
- Patent No.
- US 6,800,551
- App. No.
- 10/308,115
- Filed
- 2002-12-03
- Granted
- 2004-10-05
- Pub. No.
- US20030157806A1
- Examiner
- SARKAR, ASOK K
- Art Unit
- 2829
- PTA
- -28 days
External Links