IP Library › Assignment 013658/0096
Patent Assignment
Reel/Frame 013658/0096

Assignment of Assignor's Interest

Recorded: 2003-01-13 Pages: 4
Assignor
YAHIRO, TAKEHISA
Executed: 2002-12-11
Assignee
NIKON CORPORATION
2-3 MARUNOUCHI 3-CHOME CHIYODA-KU, TOKYO 100-8331, JAPAN
Covered Property (1)
Methods and Devices for Evaluating Imaging Characteristics of a Charged-Particle-Beam Microlithography System
Patent: 6,861,187 →
Application: 10/236,681 →
Publication: US 2003/0085365