Patent Assignment
Reel/Frame 013769/0159
Assignment of Assignor's Interest
Recorded: 2003-06-30
Received: 2003-06-30
Pages: 3
Assignors
CONWAY, CHRISTOPHER J.
Executed: 2003-06-26
MACKENZIE, DARRIN H.
Executed: 2003-06-26
RAYMOND, TERRY N.
Executed: 2003-06-26
YOUNG, MARTIN
Executed: 2003-06-26
Assignee
THERMAL DYNAMICS CORPORATION
82 BENNING ST., WEST LEBANON, NH, 03745, UNITED STATES
Covered Properties
(5)
Method of Formation of Gate Stack Spacer and Charge Storage Materials Having Reduced Hydrogen Content in Charge Trapping Dielectric Flash Memory Device
Application:
10/430,471 →
Birdcage Attachment
Application:
29/180,987 →
Alignment System for Planar Charge Trapping Dielectric Memory Cell Lithography
Application:
10/394,565 →
Ono Fabrication Process for Increasing Oxygen Content at Bottom Oxide-Substrate Interface in Flash Memory Devices
Application:
10/358,586 →
Torch, Lead and Connector Assembly
Application:
29/167,063 →