IP Library Assignment 013909/0312
Patent Assignment
Reel/Frame 013909/0312

Assignment of Assignor's Interest

Recorded: 2003-03-24 Pages: 5
Assignors
WADA, HIROYUKI
Executed: 2001-06-27
HIRATA, YOSHIMI
Executed: 2001-06-06
TAGUCHI, AYUMU
Executed: 2001-06-11
TATSUKI, KOICHI
Executed: 2001-06-11
UMEZU, NOBUHIKO
Executed: 2001-06-11
KUBOTA, SHIGEO
Executed: 2001-06-11
ABE, TETSUO
Executed: 2001-06-12
OOSHIMA, AKIFUMI
Executed: 2001-06-12
HATTORI, TADASHI
Executed: 2001-06-12
TAKATOKU, MAKOTO
Executed: 2001-06-13
SUGANO, YUKIYASU
Executed: 2001-06-21
Assignee
SONY CORPORATION
7-35 KITASHINAGAWA 6-CHOME, SHINAGAWA-KU, TOKYO, 141-0001, JAPAN
Covered Property (1)
Polysilicon Evaluating Method, Polysilicon Inspection Apparatus and Method for Preparation of Thin Film Transistor
Patent: 6,933,185 →
Application: 10/394,223 →
Publication: US 2003/0183853
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 8, 2013
From: SONY CORPORATION
To: JAPAN DISPLAY WEST INC.
Reel/Frame 031377/0803 →