Patent Assignment
Reel/Frame 014040/0336
Assignment of Assignor's Interest
Recorded: 2003-05-06
Pages: 3
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Probe Microscope and Specimen Observation Method and Semiconductor Device Manufacturing Method Using Said Scanning Probe Microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.