IP Library › Assignment 014144/0832
Patent Assignment
Reel/Frame 014144/0832

Assignment of Assignor's Interest

Recorded: 2003-06-06 Pages: 2
Assignors
OGURA, KIYONORI
Executed: 2003-05-27
MURASE, YASUNORI
Executed: 2003-05-26
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Memory Circuit Testing System, Semiconductor Device, and Memory Testing Method
Patent: 7,577,884 →
Application: 10/455,304 →
Publication: US 2003/0212925
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 11, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021977/0219 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0851 →