IP Library Assignment 014155/0693
Patent Assignment
Reel/Frame 014155/0693

Assignment of Assignor's Interest

Recorded: 2003-06-06 Pages: 19
Assignors
LEHMAN, KURT
Executed: 2003-05-06
CHEN, CHARLES
Executed: 2003-05-06
ALLEN, RONALD L.
Executed: 2003-05-06
SHINAGAWA, ROBERT
Executed: 2003-05-06
SETHURAMAN, ANANTHA R.
Executed: 2003-05-06
BEVIN, CHRISTOPHER F.
Executed: 2003-05-06
TRIKAS, TOM
Executed: 2003-05-06
CHEN, HAIGUANG
Executed: 2003-05-06
MENG, CHING LING
Executed: 2003-05-06
Assignee
KLA-TENCOR TECHNOLOGIES CORP.
ONE TECHNOLOGY WAY, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Methods and Systems for Monitoring a Parameter of a Measurement Device During Polishing, Damage to a Specimen During Polishing, or a Characteristic of a Polishing Pad or Tool
Patent: 7,030,018 →
Application: 10/358,101 →
Publication: US 2003/0180973