Patent Assignment
Reel/Frame 014170/0378
Assignment of Assignor's Interest
Recorded: 2003-06-12
Pages: 2
Assignors
KANAMARU, MASATOSHI
Executed: 2003-04-25
AONO, TAKANORI
Executed: 2003-04-18
NAGATA, TATSUYA
Executed: 2003-04-21
KAWAKAMI, KENJI
Executed: 2003-04-25
AOKI, HIDEYUKI
Executed: 2003-04-23
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.