Patent Assignment
Reel/Frame 014179/0339
Assignment of Assignor's Interest
Recorded: 2003-06-12
Pages: 6
Assignors
FURMAN, DOV
Executed: 2003-05-28
NEUMANN, GAD
Executed: 2003-05-21
WAGNER, MARK
Executed: 2003-05-22
DOTAN, NOAM
Executed: 2003-05-22
SEGAL, RAM
Executed: 2003-05-21
SILBERSTEIN, SHAI
Executed: 2003-05-25
Assignee
NEGEVTECH LTD.
12 HAMADA STREET,, REHOVOT 76122, ISRAEL
Covered Property
(1)
System for Detection of Wafer Defects
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement
Jun 19, 2008
From: NEGEVTECH LTD.
To: KREOS CAPITAL II LIMITED
Reel/Frame 021109/0971 →
Security Agreement
Jun 19, 2008
From: NEGEVTECH LTD.
To: PLENUS II, L.P.; PLENUS II (D.C.M)
Reel/Frame 021118/0061 →
Assignment of Assignor's Interest
Jun 29, 2009
From: NEGEVTECH LTD.
To: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD.
Reel/Frame 022878/0815 →