Patent Assignment
Reel/Frame 021118/0061
Security Agreement
Recorded: 2008-06-19
Pages: 9
Assignor
NEGEVTECH LTD.
Executed: 2008-03-30
Assignees
PLENUS II, L.P.
16 ABBA EBEN AVENUES, HERZELIYA PITUACH, 46726, ISRAEL
PLENUS II (D.C.M)
16 ABBA EBEN AVENUES, HERZELIYA PITUACH, 46726, ISRAEL
Covered Properties
(28)
Method and System for Fast on-Line Electro-Optical Detection of Wafer Defects
Fiber Optical Illumination System
System for Detection of Wafer Defects
System for Detection of Wafer Defects
Method and Apparatus for Detecting Defects in Wafers Including Alignment of the Wafer Images So as to Induce the Same Smear in All Images
Method and Apparatus for Detecting Defects in Wafers
Fiber Optical Illumination System
Multi Mode Inspection Method and Apparatus
Printed Fourier Filtering in Optical Inspection Tools
System for Detection of Wafer Defects
System for Detection of Wafer Defects
System for detection of wafer defects
Application:
11/476,356 →
Publication:
US 2006/0244957
System for Detection of Wafer Defects
Speckle reduction using a fiber bundle and light guide
Application:
11/503,859 →
Publication:
US 2008/0037933
Apparatus for Determining Optimum Position of Focus of an Imaging System
Defect Detection Through Image Comparison Using Relative Measures
Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination
Advanced Cell-to-Cell Inspection
Fiber Optical Illumination System
Optical Inspection Including Partial Scanning of Wafers
Optical Inspection Tool Featuring Multiple Speed Modes
Multi Mode Inspection Method and Apparatus
Image Splitting in Optical Inspection Systems
Image Splitting in Optical Inspection Systems
Multi mode inspection method and apparatus
Application:
60/587,675 →
Wafer inspection using short-pulsed continuous broadband illumination
Application:
60/808,816 →
Image splitting in optical inspection systems
Application:
60/861,303 →
Inspection Tools Supporting Multiple Operating States For Multiple Detector Arrangements
Application:
61/027,586 →
Related Assignments
(14)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 11, 2003
From: FURMAN, DOV; NEUMANN, GAD; DOTAN, NOAM
To: NEGEVTECH LTD.
Reel/Frame 014158/0911 →
Assignment of Assignor's Interest
Jun 12, 2003
From: FURMAN, DOV; NEUMANN, GAD; WAGNER, MARK; DOTAN, NOAM
To: NEGEVTECH LTD.
Reel/Frame 014179/0339 →
Assignment of Assignor's Interest
Feb 28, 2005
From: DORPHAN, YUVAL; WAGNER, MARK; SILBERSTEIN, SHAI; ZASLAVSKY, RAN
To: NEGEVTECH LTD.
Reel/Frame 016340/0013 →
Assignment of Assignor's Interest
Feb 28, 2005
From: SALI, EREZ; WAGNER, MARK; DORPHAN, YUVAL; YANIR, TOMER
To: NEGEVTECH LTD.
Reel/Frame 016348/0089 →
Assignment of Assignor's Interest
Sep 29, 2005
From: FURMAN, DOV; DOTAN, NOAM; MIKLATZKY, EFRAIM
To: NEGEVTECH LTD.
Reel/Frame 017051/0388 →
Assignment of Assignor's Interest
Jul 31, 2006
From: FUCHS, DAN T.; SILBERSTEIN, SHAI
To: NEGEVTECH OF REHOVOT
Reel/Frame 018139/0607 →
Assignment of Assignor's Interest
Oct 10, 2006
From: FURMAN, DOV; MANDELIK, DANIEL
To: NEGEVTECH, LTD.
Reel/Frame 018400/0158 →
Assignment of Assignor's Interest
Jan 19, 2007
From: SALI, EREZ; COHEN, OREN
To: NEGEVTECH, LTD.
Reel/Frame 018813/0163 →
Assignment of Assignor's Interest
Mar 29, 2007
From: LITICHEVER, ZEEV; SALI, EREZ; COHEN, OREN
To: NEGEVTECH, LTD.
Reel/Frame 019082/0842 →
Assignment of Assignor's Interest
May 14, 2007
From: FURMAN, DOV; SILBERSTEIN, SHAI
To: NEGEVTECH, LTD.
Reel/Frame 019288/0116 →
Security Agreement
Jun 19, 2008
From: NEGEVTECH LTD.
To: KREOS CAPITAL II LIMITED
Reel/Frame 021109/0971 →
Assignment of Assignor's Interest
Oct 23, 2008
From: FUCHS, DAN; SILBERSTEIN, SHAI
To: NEGEVTECH, LTD. OF REHOVOT
Reel/Frame 021724/0237 →
Assignment of Assignor's Interest
Jun 29, 2009
From: NEGEVTECH LTD.
To: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD.
Reel/Frame 022878/0815 →
Assignment of Assignor's Interest
Jan 25, 2010
From: NEGEVTECH LTD.
To: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD.
Reel/Frame 023832/0904 →