System for detection of wafer defects
View Patent ↗Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.
1. A method for compensating for changes in the output level of an illumination source for a system for the inspection of objects, comprising the steps of:
sampling said output level of said illumination source;
determining changes in said output level;
generating a digital output representative of said object; and
adjusting the gray-scale level of said digital output to compensate for said changes in the output level of said illumination source.
2. A method according to claim 1 and wherein said digital output representative is a digital image.
3. A method according to claim 2 and wherein said illumination source comprises a laser.
4. A method according to claim 2 and wherein said generating comprises employing a first detector to generate said digital output representative, and wherein said sampling comprises employing a second detector to sample said output level.
5. A method according to claim 1 and wherein said illumination source comprises a laser.
6. A method according to claim 1 and wherein said generating comprises employing a first detector to generate said digital output representative, and wherein said sampling comprises employing a second detector to sample said output level.
7. A method according to claim 1 and wherein said sampling said output level of said illumination source comprises employing an auto-focus detector for sampling said output level of said illumination source.
8. An inspection system for inspecting objects, comprising:
an imager operative to image said objects, while said objects are illuminated and are in motion along a travel path, and comprising an imager detector operative to generate a digital output representative of said objects;
a transporter for providing relative motion between said imager and said objects along said travel path;
an illumination source for illuminating said objects as they travel along said travel path; and
a subsystem for compensating for changes in the output level of said illumination source, said subsystem comprising:
a sampling detector operative to sample said output level of said illumination source;
change determining functionality operative to determine changes in said output level; and
adjusting functionality operative to adjust the gray-scale level of said digital output representative to compensate for said changes in the output level of said illumination source.
9. A system according to claim 8 and wherein said digital output representative is a digital image.
10. A system according to claim 9 and wherein said illumination source comprises a laser.
11. A system according to claim 8 and wherein said illumination source comprises a laser.
12. A system according to claim 8 and wherein said sampling detector and said imager detector comprise a single detector.
13. A system according to claim 8 and wherein said sampling detector is different from said imager detector.
14. A system according to claim 8 and wherein said sampling detector comprises an auto-focus detector.
15. A method for compensating for changes in the output level of an illumination source for a system for the inspection of objects, comprising the steps of:
employing a detector for sampling said output level of said illumination source;
employing said detector for auto-focusing an inspected object;
determining changes in said output level using an output of said detector;
generating a digital output representative of said object; and
adjusting the gray-scale level of said digital output to compensate for said changes in the output level of said illumination source.
16. An inspection system for inspecting objects, comprising:
an imager operative to image said objects, while said objects are illuminated and are in motion along a travel path, and comprising an imager detector operative to generate a digital output representative of said objects;
a transporter for providing relative motion between said imager and said objects along said travel path;
an illumination source for illuminating said objects as they travel along said travel path;
an auto-focusing mechanism including an auto-focus detector, also operative to sample an output level of said illumination source; and
a subsystem for compensating for changes in said output level of said illumination source, said subsystem comprising:
change determining functionality operative to determine changes in said output level; and
adjusting functionality employing said auto-focus detector and operative to adjust the gray-scale level of said digital output representative to compensate for said changes in the output level of said illumination source.