Multi mode inspection method and apparatus

1. An inspection system for inspecting an object, the system comprising:

an illuminator including at least one pulsed light source, said illuminator being operative to selectively provide at least one mode of illumination according to an illumination schedule;

a detector assembly comprising a plurality (n) of 2-dimensional detectors disposed so that on an image plane of said object, said plurality of 2-dimensional detectors are arranged at intervals, and said plurality (n) of 2-dimensional detectors in said detector assembly are arranged in a plurality of columns, such that the layout of at least one of said plurality of columns is different from the layout of at least one other of said plurality of columns; and

a relative motion provider operative to provide motion of the object relative to the detector assembly, along an axis of motion according to a motion schedule,

wherein said motion schedule and said illumination schedule are selected to provide images of at least part of said object in said at least one mode of illumination and wherein each of said plurality (n) of 2-dimensional detectors provides a 2-dimensional output.

2. An inspection system according to claim 1 , and wherein said plurality (n) of 2-dimensional detectors in said detector assembly are arranged in a plurality of rows including even numbered rows and odd numbered rows, such that a layout of detectors in said even numbered rows is identical for all said even numbered rows and a layout of detectors in said odd numbered rows is identical for all said odd numbered rows.

3. An inspection system according to claim 1 , and wherein said plurality of columns includes even numbered columns and odd numbered columns, such that said layout of detectors in said even numbered columns is identical for all said even numbered columns and said layout of detectors in said odd numbered columns is identical for all said odd numbered columns.

4. An inspection system according to claim 2 , and wherein a layout of said plurality of 2-dimensional detectors is symmetric along said plurality of rows.

5. An inspection system according to claim 3 , and wherein a layout of said plurality of 2-dimensional detectors is symmetric along said plurality of columns.

6. An inspection system according to claim 1 , wherein said detector assembly comprises an array of detector active areas operative to simultaneously scan a slice of said object, said slice being n active areas wide, said array of detector active areas comprising a first group of non adjacent active areas covering said slice, and a second group of non adjacent active areas covering said slice, said non adjacent active areas in said second group being spaced an even number of active areas behind said non adjacent active areas in said first group along said axis of motion.

7. An inspection system for inspecting an object, the system comprising:

an illuminator including at least one pulsed light source, said illuminator being operative to selectively provide at least one mode of illumination;

a detector assembly comprising a plurality (n) of 2-dimensional detectors disposed so that on an image plane of said object, said plurality of 2-dimensional detectors are arranged at intervals, and said plurality (n) of 2-dimensional detectors in said detector assembly are arranged in a plurality of columns, such that the layout of at least one of said plurality of columns is different from the layout of at least one other of said plurality of columns; and

a relative motion provider operative to provide motion of the object relative to said detector assembly, along an axis of motion,

wherein at least two of said plurality (n) of 2-dimensional detectors are at essentially the same position parallel to a direction of motion of said object relative to said detector assembly.

8. An inspection system according to claim 7 , and wherein said plurality (n) of 2-dimensional detectors in said detector assembly are arranged in a plurality of rows including even numbered rows and odd numbered rows, such that a layout of detectors in said even numbered rows is identical for all said even numbered rows and a layout of detectors in said odd numbered rows is identical for all said odd numbered rows.

9. An inspection system according to claim 7 , and wherein said plurality of columns includes even numbered columns and odd numbered columns, such that said layout of detectors in said even numbered columns is identical for all said even numbered columns and said layout of detectors in said odd numbered columns is identical for all said odd numbered columns.

10. An inspection system according to claim 8 , and wherein a layout of said plurality of 2-dimensional detectors is symmetric along said plurality of rows.

11. An inspection system according to claim 9 , and wherein a layout of said plurality of 2-dimensional detectors is symmetric along said plurality of columns.

12. A method for inspecting an object, the method comprising:

operating an illuminator, including at least one pulsed light source, and being operative to selectively provide a plurality of modes of illumination according to an illumination schedule;

operating a detector assembly comprising a plurality of 2-dimensional detectors; and

providing motion of the object relative to said detector assembly, along an axis of motion, in accordance with a motion schedule,

wherein said motion schedule and said illumination schedule are selected to provide images of at least part of said object in at least two of said plurality of modes of illumination thereby inspecting said object,

wherein each of said plurality (n) of 2-dimensional detectors provides a 2-dimensional output,

and wherein said plurality of 2-dimensional detectors are arranged at intervals, and said plurality (n) of 2-dimensional detectors in said detector assembly are arranged in a plurality of columns, such that the layout of at least one of said plurality of columns is different from the layout of at least one other of said plurality of columns.