Patent Assignment
Reel/Frame 016348/0089
Assignment of Assignor's Interest
Recorded: 2005-02-28
Pages: 4
Assignors
SALI, EREZ
Executed: 2005-02-22
WAGNER, MARK
Executed: 2005-02-22
DORPHAN, YUVAL
Executed: 2005-02-22
YANIR, TOMER
Executed: 2005-02-22
DOTAN, NOAM
Executed: 2005-02-22
ZASLAVSKY, RAN
Executed: 2005-02-22
Assignee
NEGEVTECH LTD.
12 HAMADA STREET, REHOVOT, 76701, ISRAEL
Covered Property
(1)
Method and Apparatus for Detecting Defects in Wafers
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement
Jun 19, 2008
From: NEGEVTECH LTD.
To: KREOS CAPITAL II LIMITED
Reel/Frame 021109/0971 →
Security Agreement
Jun 19, 2008
From: NEGEVTECH LTD.
To: PLENUS II, L.P.; PLENUS II (D.C.M)
Reel/Frame 021118/0061 →
Assignment of Assignor's Interest
Jun 29, 2009
From: NEGEVTECH LTD.
To: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD.
Reel/Frame 022878/0815 →