IP Library › Assignment 014206/0149
Patent Assignment
Reel/Frame 014206/0149

Assignment of Assignor's Interest

Recorded: 2003-06-17 Pages: 3
Assignors
SUGIMOTO, MASARU
Executed: 2003-04-26
FUNAKURA, TERUHIKO
Executed: 2003-04-26
NAGASAWA, HIDEKAZU
Executed: 2003-04-26
Assignee
RENESAS TECHNOLOGY CORP.
4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-6334, JAPAN
Covered Property (1)
Interface Circuit Coupling Semiconductor Test Apparatus with Tested Semiconductor Device
Patent: 6,954,079 →
Application: 10/462,743 →
Publication: US 2004/0113642
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 10, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0001 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →