IP Library › Assignment 014230/0517
Patent Assignment
Reel/Frame 014230/0517

Assignment of Assignor's Interest

Recorded: 2003-07-03 Pages: 3
Assignor
OHZAWA, SUMITO
Executed: 2003-05-19
Assignee
HORIBA, LTD.
2, MIYANOHIGASHI-CHO, KISSHOIN, MINAMI-KU, KYOTO, JAPAN
Covered Property (1)
X-Ray Analysis Apparatus and Method
Patent: 6,965,663 →
Application: 10/396,847 →
Publication: US 2003/0215060