Assignment of Assignor's Interest

Recorded: 2003-07-11 Received: 2003-07-16 Pages: 13

Assignor

SCHLUMBERGER TECHNOLOGIES, INC.

Executed: 2002-05-10

Assignee

NPTEST, LLC

150 BAYTECH DRIVE, SAN JOSE, CA, 95134, UNITED STATES

Covered Properties (8)

Method and Apparatus for Accessing Internal Nodes of an Integrated Circuit Using Ic Package Substrate

Application: 10/382,343 →

Signal paths providing multiple test configurations

Application: 10/371,353 →

Precise, in-Situ Endpoint Detection for Charged Particle Beam Processing

Application: 10/288,896 →

Optical Testing of Integrated Circuits with Temperature Control

Application: 10/264,716 →

Test System and Methodology

Application: 10/197,134 →

Method for Determining Thickness of a Semiconductor Substrate at the Floor of a Trench

Application: 10/161,272 →

Method and Apparatus for Forming a Cavity in a Semiconductor Substrate Using a Charged Particle Beam

Application: 10/160,606 →

Sub-Resolution Alignment of Images

Application: 10/159,527 →