Patent Assignment
Reel/Frame 014299/0703
Assignment of Assignor's Interest
Recorded: 2003-07-09
Received: 2003-07-18
Pages: 3
Assignors
HANDA, NAOKI
Executed: 2003-04-25
KOBAYASHI, KENJI
Executed: 2003-04-25
OUMIYA, ATSUO
Executed: 2003-04-25
TANAKA, KOUTA
Executed: 2003-04-28
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME CHIYODA-KU, TOKYO, JPX, JAPAN
Covered Property
(1)
Semiconductor Device and a Method of Testing Thereof
Application:
10/614,799 →