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App. No. 10/614,799 · Confirmation No. 8019

SEMICONDUCTOR DEVICE AND A METHOD OF TESTING THEREOF

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2004-12-21 C.AD Change of Address 1 View
2004-06-18 IFEE Issue Fee Payment (PTO-85B) 1 View
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2004-03-18 892 List of references cited by examiner 1 View
2004-03-18 1449 List of References cited by applicant and considered by examiner 1 View
2004-03-18 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-03-18 SRFW Search information including classification, databases and other search related notes 1 View
2004-03-18 FWCLM Index of Claims 1 View
2004-03-17 SRNT Examiner's search strategy and results 1 View
2003-07-09 TRNA Transmittal of New Application 4 View
2003-07-09 SPEC Specification 24 View
2003-07-09 CLM Claims 5 View
2003-07-09 ABST Abstract 1 View
2003-07-09 DRW Drawings-only black and white line drawings 10 View
2003-07-09 OATH Oath or Declaration filed 4 View
2003-07-09 FOR Foreign Reference 10 View
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Quick Facts
App. No.
10/614,799
Filed
2003-07-09
Granted
2004-08-24
Pub. No.
US20040042279A1
Art Unit
2824
PTA
0 days