Patent Assignment
Reel/Frame 015195/0525
Re-Record to Correct the Assignee Name Previously Recorded at Reel/Frame 014299/0703
Recorded: 2004-04-09
Received: 2004-04-14
Pages: 5
Assignors
HANDA, NAOKI
Executed: 2003-04-25
KOBAYASHI, KENJI
Executed: 2003-04-25
OUMIYA, ATSUO
Executed: 2003-04-25
TANAKA, KOUTA
Executed: 2003-04-28
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME CHIYODA-KU, TOKYO, JPX, JAPAN
RENESAS NORTHERN JAPAN SEMICONDUCTOR, INC.
1007-39, IZUMISAWA, CHITOSE-SHI, HOKKAIDO, JPX, JAPAN
HITACHI DEVICE ENGINEERING CO., LTD.
3681, HAYANO, MOBARA-SHI, CHIBA, JPX, JAPAN
Covered Property
(1)
Semiconductor Device and a Method of Testing Thereof
Application:
10/614,799 →