Patent Assignment
Reel/Frame 014306/0354
Assignment of Assignor's Interest
Recorded: 2003-07-18
Pages: 3
Assignors
YAMAGISHI, YASUO
Executed: 2003-07-08
SHIOGA, TAKESHI
Executed: 2003-07-08
BANIECKI, JOHN DAVID
Executed: 2003-07-08
KURIHARA, KAZUAKI
Executed: 2003-07-08
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property
(1)
Probe Card and Testing Method of Semiconductor Chip, Capacitor and Manufacturing Method Thereof