Assignment of Assignor's Interest

Recorded: 2003-07-23 Received: 2003-07-31 Pages: 2

Assignor

ROTSCH, CHRISTIAN

Executed: 2002-01-16

Assignee

INFINEON TECHNOLOGIES AG

RIDLERSTRASSE 55, PATENTABTEILUNG, MUENCHEN, DEX, 80339, GERMANY

Covered Property (1)

Method for Determining the Distance Between Periodic Structures on an Integrated Circuit or a Photomask

Application: 10/034,930 →