IP Library Assignment 014328/0226
Patent Assignment
Reel/Frame 014328/0226

Assignment of Assignor's Interest

Recorded: 2004-02-11 Pages: 2
Assignors
JAU, JACK Y.
Executed: 2004-01-09
CHEN, ZHONGWEI
Executed: 2004-01-09
Assignee
HERMES-MICRVISON, INC.
1595 MCCANDLESS DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Method and Apparatus for Scanning Semiconductor Wafers Using a Scanning Electron Microscope
Patent: 6,881,956 →
Application: 10/649,599 →
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 19, 2004
From: CHEN, ZHONG WEI
To: HERMES-MICROVISION (TAIWAN) INC.
Reel/Frame 015225/0702 →
Corrective Coversheet to Correct the Assignor Previously Recorded on Reel 015225, Frame 0702. Nov 10, 2004
From: HERMES-MICROVISION, INC.
To: HERMES-MICROVISION (TAIWAN) INC.
Reel/Frame 015381/0028 →