Patent Assignment
Reel/Frame 014371/0618
Assignment of Assignor's Interest
Recorded: 2003-08-11
Pages: 3
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1 SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit, Design Support Apparatus, and Test Method