Assignment of Assignor's Interest

Recorded: 2003-08-26 Pages: 2

Assignors

MORI, HISAYA

Executed: 2003-06-24

FUNAKURA, TERUHIKO

Executed: 2003-06-24

HANAI, HISAYOSHI

Executed: 2003-06-25

Assignee

RENESAS TECHNOLOGY CORP.

4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-6334, JAPAN

Covered Property (1)

Apparatus for Testing Semiconductor Integrated Circuit

Patent: 7,058,865 →

Application: 10/647,267 →

Publication: US 2004/0177302

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.