Patent Assignment
Reel/Frame 014467/0222
Assignment of Assignor's Interest
Recorded: 2003-09-08
Pages: 3
Assignors
HOLSTEYNS, FRANK
Executed: 2003-06-11
IACOPI, FRANCESCA
Executed: 2003-06-11
MAEX, KAREN
Executed: 2003-07-09
Assignee
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC VZW), A BELGIUM CORPORATION
KAPELDREEF 75, 3001 LEUVEN, BELGIUM
Covered Property
(1)
Method and Apparatus for Defect Detection
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.