IP Library › Assignment 014494/0462
Patent Assignment
Reel/Frame 014494/0462

Record to Correct the 5TH Assignor's Name. Document Previously Recorded on Reel 013891 Frame 0010. Assignor Hereby Confirms the Assignment of the Entire Interest.

Recorded: 2003-09-15 Pages: 4
Assignors
OKADA, HIROYUKI
Executed: 2003-03-03
SHIBATA, MIKI
Executed: 2003-03-03
ECHIGO, TADAHIRO
Executed: 2003-03-03
NAKA, SHIGEKI
Executed: 2003-03-03
ONNAGAWA, HIROYOSHI
Executed: 2003-03-03
Assignee
TOYAMA UNIVERSITY, PRESIDENT OF
3190, GOFUKU, TOYAMA-SHI, TOYAMA-KEN, JAPAN
Covered Property (1)
Film Thickness Measuring Method and Measuring Apparatus for Organic Thin Film for Use in Organic Electroluminesce Device
Patent: 6,992,781 →
Application: 10/389,751 →
Publication: US 2003/0193672
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 18, 2003
From: OKADA, HIROYUKI; SHIBATA, MIKI; ECHIGO, TADAHIRO; NAKA, SHIGEKI
To: PRESIDENT OF TOYAMA UNIVERSITY
Reel/Frame 013891/0010 →