Patent Assignment
Reel/Frame 014543/0590
Assignment of Assignor's Interest
Recorded: 2003-08-21
Pages: 3
Assignors
TAKAHASHI, HIROYUKI
Executed: 2003-04-17
KATOU, YOSHIYUKI
Executed: 2003-04-17
INABA, HIDEO
Executed: 2003-04-17
UCHIDA, SHOUZOU
Executed: 2003-04-17
SONODA, MASATOSHI
Executed: 2003-04-17
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Semiconductor Memory Device and Its Test Method as Well as Test Circuit
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.