Patent Assignment
Reel/Frame 014553/0559
Assignment of Assignor's Interest
Recorded: 2003-09-25
Pages: 3
Assignee
HITACHI HIGH TECHNOLOGIES CORPORATION
124-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Apparatus for Analyzing Defect Data and a Review System
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.