Patent Assignment
Reel/Frame 052259/0227
Change of Name and Address
Recorded: 2020-03-30
Pages: 68
Assignor
HITACHI HIGH-TECHNOLOGIES CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties
(2251)
Apparatus Method of Inspecting Foreign Particle or Defect on a Sample
Patent:
6,597,448 →
Application:
09/644,069 →
Method of Inspecting a Semiconductor Device and an Apparatus Thereof
Method and Apparatus for Inspecting a Semiconductor Device
Method of Fabricating a Semiconductor Device
Apparatus and Method for Inspecting Surface of Semiconductor Wafer or the Like
Energy Spectrum Measuring Apparatus, Electron Energy Loss Spectrometer, Electron Microscope Provided Therewith, and Electron Energy Loss Spectrum Measuring Method
Methods and Apparatus to Control Charge Neutralization Reactions in Ion Traps
Patent:
6,570,151 →
Application:
10/081,243 →
Power Supply, a Semiconductor Making Apparatus and a Semiconductor Wafer Fabricating Method Using the Same
Plasma Processing Apparatus
Plasma Processing Apparatus and Method
Data Processing Apparatus for Semiconductor Processing Apparatus
High-Frequency Power Supply Apparatus for Plasma Generation Apparatus
Patent:
6,586,887 →
Application:
10/090,757 →
Method for Analyzing Defect Data and Inspection Apparatus and Review System
Information Processing System Using Nucleotide Sequence-Related Information
Methods and Apparatus to Control Charge Neutralization Reactions in Ion Traps
Apparatus and Method for Wafer Pattern Inspection
Vacuum Processing Device and Vacuum Processing Method
Plasma Processing Apparatus and Method
Electrospray Ionization Mass Analysis Apparatus and System Thereof
Electrospray Ionization Mass Analysis Apparatus and Method Thereof
Etching System and Etching Method
Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device
Method for Manufacturing Semiconductor Devices and Method and Its Apparatus for Processing Detected Defect Data
Method of Forming a Sample Image and Charged Particle Beam Apparatus
Atmospheric Pressure Ionization Mass Spectrometer System
Capillary Electrophoresis Device
Ion Sensor and Clinical Analyzer Using the Same
Mass Spectrometer System
Multi-Capillary Electrophoresis Apparatus
Ion Trap Mass Analyzing Apparatus
Mass Spectrometer
Three-Dimensional Micropattern Profile Measuring System and Method
Micropattern Shape Measuring System and Method
Multi-Capillary Electrophoresis Apparatus
Chemical Analysis Apparatus and Chemical Analysis Method
Method for Manufacturing Semiconductor Devices and Method and Its Apparatus for Processing Detected Defect Data
Ion Trap Type Mass Spectrometer
Exhaust Apparatus and Control Method for Same, and Vacuum-Use Hydrostatic Bearing
Plasma Processing Apparatus
Method of Forming a Sample Image and Charged Particle Beam Apparatus
Information Processing System Using Nucleotide Sequence-Related Information
Semiconductor Fabricating Apparatus with Function of Determining Etching Processing State
Method and Apparatus for Processing Semiconductor
Method for Controlling Semiconductor Processing Apparatus
Chemical Analysis Apparatus and Genetic Diagnostic Apparatus
Mass Spectrometer
Shape Measurement Method and Apparatus
Capillary Array and Electrophoresis Apparatus, and Methods
Automatic Analyzing Apparatus
Mass Spectrometer
Capillary Electrophoresis Device
Capillary Electrophoresis Apparatus and Method
Biomagnetic Measurement Apparatus
Method for Determining Etching Process Conditions and Controlling Etching Process
Electron Microscopic Inspection Apparatus
Mass Spectrometer
Information Processing System Using Information on Base Sequence
Sample Dimension Measuring Method and Scanning Electron Microscope
Information Processing System Using Base Sequence Relevant Information
Method of Detecting Nucleic Acid by Using Dna Microarrays and Nucleic Acid Detection Apparatus
Information Processing System Using Base Sequence-Related Information
Defect Detector and Defect Detecting Method
Standard Member for Length Measurement, Method for Producing the Same, and Electron Beam Length Measuring Device Using the Same
Method of Synthesizing Cdna
Mass Analysis Method and Mass Analysis Apparatus
Electron Microscope Including Apparatus for X-Ray Analysis and Method of Analyzing Specimens Using Same
Automatic Analyzer
Automatic Analyzing System
Multi-Electron Beam Exposure Method and Apparatus
Biomagnetic Field Measuring Apparatus
Sample Dispensing Apparatus and Automatic Analyzer Using the Same
Defect Inspection Method
System for Analyzing Compound Structure
System and Method for Evaluating a Semiconductor Device Pattern, Method for Controlling Process of Forming a Semiconductor Device Pattern and Method for Monitoring a Semiconductor Device Manufacturing Process
Power Supply, a Semiconductor Making Apparatus and a Semiconductor Wafer Fabricating Method Using the Same
Charged Particle Beam Apparatus and Charged Particle Beam Irradiation Method
Vacuum Processing Method
Plasma Processing Method
Plasma Processing Apparatus
Method and Apparatus for Analyzing Defect Data and a Review System
Automatic Analyzer
Method for Measuring Three Dimensional Shape of a Fine Pattern
Mass Spectrometer System
Plasma Processing Method
Mass Analysis Apparatus and Method for Mass Analysis
Pump for Liquid Chromatograph
Charged Particle Beam Apparatus
System for Analyzing Mass Spectrometric Data
Cross-Contamination Prevention System and Automatic Analyzer Wich Equip for It
Nanoscale Standard Sample and Its Manufacturing Method
Capillary Array Apparatus, Method of Manufacturing the Same, and Electrophoresis Analysis Method
Electron Beam Apparatus and Method for Production of Its Specimen Chamber
Scanning Electron Microscope and Sample Observing Method Using It
Electron Beam Device
Automatic Analyzer
Charged Particle Beam Device
Mass Spectrum Analyzing System
Energy Spectrum Measuring Apparatus, Electron Energy Loss Spectrometer, Electron Microscope Provided Therewith, and Electron Energy Loss Spectrum Measuring Method
Mass Analyzing Method Using an Ion Trap Type Mass Spectrometer
Sample Dispensing Apparatus and Automatic Analyzer Including the Same
Deflector, Method of Manufacturing Deflector, and Charged Particle Beam Exposure Apparatus Using Deflector
Defect Classification Using a Logical Equation for High Stage Classification
Xy Stage, Head Carriage and Tester of Magnetic Head or Magnetic Disk
Electron Microscope
Apparatus and Method for Classifying Defects Using Multiple Classification Modules
Vacuum Processing Apparatus
Capillary Electrophoresis Apparatus
Automatic Analyzer
Electron Gun
Charged Particle Beam Apparatus
Automatic Analyzer
Automatic Analyzer Using a Sample Container Having an Information Recording Member
Ion Trap Mass Analyzing Apparatus
Method of Recovering Nucleic Acids and Kit for Recovering Nucleic Acids
Mass Spectrometer System
Genetic Testing Kits and a Method of Bladder Cancer
Magnetic Field Measurement Apparatus
Method, Apparatus and System for Specimen Fabrication by Using an Ion Beam
Focused Ion Beam System
Charged Particle Beam Application Apparatus
Absorption Current Image Apparatus in Electron Microscope
Mass Spectrometer
Automatic Analyzer
Vacuum Processing Method
Biomagnetic Measurement Apparatus
Sample Dimension-Measuring Method and Charged Particle Beam Apparatus
Mass Spectrometer
Automatic Analyzer
Method of Monitoring an Exposure Process
Mass Spectrometer System
Automatic Analyzer
Multi-Charged Beam Lens and Charged Beam Exposure Apparatus Using the Same
Charged Particle Beam Exposure Method and Apparatus and Device Manufacturing Method Using the Apparatus
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Apparatus for Inspecting Three Dimensional Shape of a Specimen and Method of Watching an Etching Process Using the Same
Shape Measuring Device and Shape Measuring Method
Plasma Processing Apparatus
Vacuum Processing Apparatus
Plasma Processing Apparatus
Electron Microscope
Plasma Processing Apparatus Using Active Matching
Reagent Cassette and Automatic Analyzer Using the Same
Information Processing System Using Nucleotide Sequence-Related Information
Method of Measuring Pattern Dimension and Method of Controlling Semiconductor Device Process
Method and Apparatus for Monitoring Exposure Process
Automatic analyzer
Application:
10/994,286 →
Publication:
US 2005/0112025
Method and Apparatus for Observing a Specimen
Mass Spectrometer
Plasma Processing Apparatus and Method
Defective Product Inspection Apparatus, Probe Positioning Method and Probe Moving Method
Mass Spectrometer
Method of Measurement Accuracy Improvement by Control of Pattern Shrinkage
Automatic Analyzer
Method for Accurate Mass Determination with Ion Trap/Time-of-Flight Mass Spectrometer
Patterned Wafer Inspection Method and Apparatus Therefor
Probe Navigation Method and Device and Defect Inspection Device
Mass Spectroscope and Method of Calibrating the Same
Method and Apparatus for Collecting Defect Images
Automatic Analyzer
Standard Sample for Transmission Electron Microscope (Tem) Elemental Mapping and Tem Elemetal Mapping Method Using the Same
Charged Particle System and a Method for Measuring Image Magnification
Mass Spectrometry System
Magnetocardiograph
Stage Control Method, a Stage Control System, and a Semiconductor Manufacturing Equipment
Saccharide Composition Purification Instrument
Control System and Method of Semiconductor Inspection System
Pattern Measuring Method
Method for Processing Semiconductor
Vacuum Processing Apparatus and Vacuum Processing Method
Vacuum Processing Apparatus
Plasma Processing Method and Plasma Processing Apparatus
Electron Beam Inspection Apparatus
Detection Method and Detection Apparatus of Substance in Biological Sample
Micropattern Shape Measuring System and Method
Scanning Electron Microscope
Charged Particle Beam Adjusting Method and Charged Particle Beam Apparatus
Pattern Search Method
Mass Spectrometer
Method for Controlling Charged Particle Beam, and Charged Particle Beam Apparatus
Ion Trap/Time-of-Flight Mass Spectrometer and Method of Measuring Ion Accurate Mass
Mass Spectrometer and Method of Analyzing Isomers
Charged Particle Beam Drawing Apparatus
Defect Inspection and Charged Particle Beam Apparatus
Ion Trap/Time-of-Flight Mass Analyzing Apparatus and Mass Analyzing Method
Focused Ion Beam Apparatus
Method and Apparatus for Measuring Three-Dimensional Shape of Specimen by Using Sem
Scanning Transmission Electron Microscope and Electron Energy Loss Spectroscopy
Charged Particle Beam Exposure Apparatus, Charged Particle Beam Exposure Method and Device Manufacturing Method
Scanning Electron Microscope and Cd Measurement Calibration Standard Specimen
Plasma Processing Apparatus
Evaluation Method of Fine Pattern Feature, Its Equipment, and Method of Semiconductor Device Fabrication
Charged Particle Beam Apparatus and Charged Particle Beam Irradiation Method
Electric Charged Particle Beam Microscopy, Electric Charged Particle Beam Microscope, Critical Dimension Measurement and Critical Dimension Measurement System
Method and Apparatus for Inspecting Semiconductor Device
Focused Ion Beam Apparatus and Focused Ion Beam Irradiation Method
Charged Particle Beam Column
Mesuring Method and Its Apparatus
Method of Cleaning Etching Apparatus
Focused Ion Beam Apparatus and Aperture
Pattern Matching Apparatus and Scanning Electron Microscope Using the Same
Charged Particle Beam Adjustment Method and Apparatus
Scanning Electron Microscope
Multi-Electron Beam Exposure Method and Apparatus
Charged Particle Beam Application System
Automatic Analyzer
Method and Apparatus for Inspecting a Semiconductor Device
Charged Particle Beam Device
Charged Particle Beam Apparatus and Dimension Measuring Method
Charged Particle Beam Apparatus and Sample Manufacturing Method
Defect Inspecting Apparatus
Dimension Measuring Sem System, Method of Evaluating Shape of Circuit Pattern and a System for Carrying Out the Method
Method and Apparatus for Reviewing Defect of Subject to Be Inspected
Fluorescence Detection Method, Detection Apparatus and Fluorescence Detection Program
Semiconductor Fabricating Apparatus with Function of Determining Etching Processing State
Image Forming Method and Charged Particle Beam Apparatus
Charged Particle Beam Equipment and Charged Particle Microscopy
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Patent:
7,205,541 →
Application:
11/305,231 →
Method and Apparatus for Reviewing Defects
Multi-Capillary Electrophoresis Apparatus
Mass Spectrometric Method, Mass Spectrometric System, Diagnosis System, Inspection System, and Mass Spectrometric Program
Method and Apparatus for Mass Spectrometry
Chemical Analysis Apparatus and Chemical Analysis Cartridge
Chemical Analysis Apparatus and Chemical Analysis Cartridge
Apparatus for Measuring a Three-Dimensional Shape
High-Accuracy Pattern Shape Evaluating Method and Apparatus
Method and Apparatus for Measuring Dimension Using Electron Microscope
Automatic Analyzer
Mass Spectrometer and Mass Analysis Method
Method and Apparatus for Inspecting Foreign Particle Defects
Mass Analysis Apparatus and Method for Mass Analysis
Scanning Transmission Electron Microscope and Scanning Transmission Electron Microscopy
Nucleic acid detection method
Method and Apparatus for Measuring Shape of a Specimen
Apparatus and Method for Wafer Pattern Inspection
Aberration Adjusting Method, Device Fabrication Method, and Charged Particle Beam Lithography Machine
Aberration Measuring Apparatus for Charged Particle Beam Optical System, Charged Particle Beam Lithography Machine Having the Aberration Measuring Apparatus, and Device Fabrication Method Using the Apparatus
Charge Control Apparatus and Measurement Apparatus Equipped with the Charge Control Apparatus
Mass Spectrometer
Method for Controlling Semiconductor Processing Apparatus
Charged Particle Beam Device
Processing Instrument and Processing Instrument System
Counting System for Flouescent Molecules
Electron Beam Apparatus and Method for Production of Its Specimen Chamber
Refractive Index Matching in Capillary Illumination
Scanning Electron Microscope
Pattern Measuring Method and Pattern Measuring Device
Vacuum Processing Method and Vacuum Processing Apparatus
Plasma Processing Apparatus
Energy Spectrum Measuring Apparatus, Electron Energy Loss Spectrometer, Electron Microscope Provided Therewith, and Electron Energy Loss Spectrum Measuring Method
Capillary Array and Capillary Electrophoresis Apparatus
Charged Particle Beam Equipment
Probe Navigation Method and Device and Defect Inspection Device
Scanning Electron Microscope
Electrophoretic Apparatus and Electrophoretic Method
Method of Measurement Accuracy Improvement by Control of Pattern Shrinkage
Imaging Method
Inspection Method and Inspection System Using Charged Particle Beam
Method and Its Apparatus for Mass Spectrometry
Calibration Method for Electron-Beam System and Electron-Beam System
Mass Spectrometric Analysis Method and System Using the Method
Apparatus and Method for Specimen Fabrication
Cell Culturel Vessel, Production Process Thereof and Cultured Cell
Mass Analysis Method and Mass Analysis Apparatus
Mass Spectrometer
Plasma Processing Apparatus
Magnetic Signal Measurement Apparatus
Patent:
7,259,570 →
Application:
11/447,086 →
Pattern Defect Inspection Method and Apparatus Thereof
Electron Beam Apparatus and Method for Production of Its Specimen Chamber
Inspection System, Inspection Method, and Process Management Method
Automatic Defect Review and Classification System
Method and Apparatus of Pattern Inspection and Semiconductor Inspection System Using the Same
Method for Analyzing Defect Data and Inspection Apparatus and Review System
Method and Apparatus for Applying Charged Particle Beam
Charged Particle Beam Application System
Method and Apparatus for Reviewing Defects
Method, Apparatus and System for Specimen Fabrication by Using an Ion Beam
Semiconductor Inspection Apparatus
Methods for Sample Preparation and Observation, Charged Particle Apparatus
Magnetic Head Slider Testing Apparatus and Magnetic Head Slider Testing Method
Apparatus of Inspecting Defect in Semiconductor and Method of the Same
Method and Apparatus for Reviewing Defects of Semiconductor Device
Mass Spectrometer
Vacuum Conveying Apparatus and Charged Particle Beam Equipment with the Same
Defect Inspection and Charged Particle Beam Apparatus
Analysis Device
Electron Beam Device
Method and Apparatus for Detecting Defects on a Wafer
Defect Inspection System
Wafer Surface Inspection Apparatus and Wafer Surface Inspection Method
Method and Apparatus for Scanning and Measurement by Electron Beam
Plasma Processing Apparatus
Mass Spectroscope and Method of Calibrating the Same
Plasma Processing Apparatus Capable of Adjusting Temperature of Sample Stand
Disk Transfer Mechanism, and Disk Inspection Apparatus and Disk Inspection Method Using the Same
Automatic Analyzer
Mass Spectrometer
Automatc Analyzer
Electron Beam Apparatus and Method of Generating an Electron Beam Irradiation Pattern
System and Method of Image Processing, and Scanning Electron Microscope
Scanning Electron Microscope and Image Signal Processing Method
Electrostatic Deflection Control Circuit and Method of Electronic Beam Measuring Apparatus
Chemical Analysis Apparatus and Chemical Analysis Method
Field Emission Type Electron Gun Comprising Single Fibrous Carbon Electron Emitter and Operating Method for the Same
Charged Particle Beam Apparatus
Methods for Nucleic Acid Isolation and Instruments for Nucleic Acid Isolation
Tool-To-Tool Matching Control Method and Its System for Scanning Electron Microscope
Logical Cad Navigation for Device Characteristics Evaluation System
Pattern Matching Apparatus and Semiconductor Inspection System Using the Same
Charged Particle Beam Apparatus
Method for Optically Detecting Height of a Specimen and Charged Particle Beam Apparatus Using the Same
Method and Apparatus for Semiconductor Device Production Process Monitoring and Method and Apparatus for Estimating Cross Sectional Shape of a Pattern
Charged Particle Beam Apparatus
Method and Apparatus for Inspecting Pattern Defects and Mirror Electron Projection Type or Multi-Beam Scanning Type Electron Beam Apparatus
Operational Amplifier and Scanning Electron Microscope Using the Same
Capillary Array and Electrophoresis Apparatus, and Methods
Magnetic Field Measurement System and Optical Pumping Magnetometer
Mass Spectrometer
Method for Controlling Charged Particle Beam, and Charged Particle Beam Apparatus
Tandem Type Mass Analysis System and Method
Mass Spectrometer
Method and Apparatus of Reviewing Defects on a Semiconductor Device
Charged Particle Beam Apparatus and Methods for Capturing Images Using the Same
Method and Apparatus for Observing a Specimen
Pattern Measuring Method
Capillary Electrophoresis Apparatus and Electrophoresis Method
Automatic Analyzer
Capillary Electrophoresis Apparatus and Electrophoresis Method
Focused Ion Beam System and a Method of Sample Preparation and Observation
Scanning Electron Microscope
Fault Inspection Method
Scanning Electron Microscope and Apparatus for Detecting Defect
Method and Apparatus of Measuring Pattern Dimension and Controlling Semiconductor Device Process Having an Error Revising Unit
Method and Apparatus for Reviewing Defects
Reaction Cell and Mass Spectrometer
Method for Measuring a Pattern Dimension Using a Scanning Electron Microscope
Method and Apparatus for Monitoring Cross-Sectional Shape of a Pattern Formed on a Semiconductor Device
Scanning Electron Microscope and a Method for Imaging a Specimen Using the Same
Ion Beam Processing Apparatus
Data Acquisition System
Plasma Processing Apparatus and Plasma Processing Method
Vacuum Processing Apparatus
Inspection Apparatus and Inspection Method
Plasma Processing Apparatus and Method for Controlling the Same
Method and Apparatus for Pattern Inspection
Charged Particle Optical Apparatus with Aberration Corrector
Wafer Surface Observing Method and Apparatus
Pattern Matching Method and Computer Program for Executing Pattern Matching
Charged Particle Beam Apparatus
Inspection System and Inspection Method
Charged Particle Beam Apparatus and Pattern Measuring Method
Defect Classifier Using Classification Recipe Based on Connection Between Rule-Based and Example-Based Classifiers
Quality Control System
Image Forming Method and Charged Particle Beam Apparatus
Charged Particle Beam Apparatus and Method for Charged Particle Beam Adjustment
Scanning Electron Microscope
Method, Device and Computer Program of Length Measurement
Charged Particle Beam Apparatus and Dimension Measuring Method
Pattern Matching Method and Pattern Matching Program
Charged Particle Beam System
Control System and Method of Semiconductor Inspection System
Mass Spectrometer and Method of Analyzing Isomers
Plasma Processing Apparatus
Standard Component for Calibration and Calibration Method Using It and Electro Beam System
Chemical Analyzer
Method of Correcting Coordinates, and Defect Review Apparatus
Charged Particle Beam Exposure Apparatus
Pressure Control Device for Low Pressure Processing Chamber
Method for Inspecting Defect and Apparatus for Inspecting Defect
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Defect Inspection Method and Apparatus
Plasma Processing Method
Deflector Array, Exposure Apparatus, and Device Manufacturing Method
Manufacturing Equipment Using Ion Beam or Electron Beam
Charged Particle Beam Apparatus
Method and Apparatus for Measuring Dimension Using Electron Microscope
Inspection apparatus
Automatic Analyzing Apparatus
Charged Particle Beam Equipment with Magnification Correction
Optical Inspection Method and Optical Inspection Apparatus
Charged Particle Beam Column
Charged Particle Beam Apparatus
Fluorescence Analyzing Method, Fluorescence Analyzing Apparatus and Image Detecting Method
Capillary Electrophoresis Apparatus
High-Accuracy Pattern Shape Evaluating Method and Apparatus
System and Method for on-Line Diagnostics
Capillary electrophoresis apparatus
Optical Inspection Method and Optical Inspection Apparatus
Focused Ion Beam Apparatus
Surface Inspection Method and Surface Inspection Apparatus
Surface Inspection Method and Surface Inspection Apparatus
Focused Ion Beam Apparatus
Appearance Inspection Apparatus
Automatic Analyzer
Semiconductor Testing Method and Semiconductor Tester
Surface Inspection Method and Surface Inspection Apparatus
Pattern Inspection Apparatus and Semiconductor Inspection System
Charged Particle Beam System, Sample Processing Method, and Semiconductor Inspection System
Scanning Electron Microscope
Plasma Processing Apparatus
Inspection Apparatus Using Template Matching Method Using Similarity Distribution
Automatic Analyzer
Automatic Analyzer
Application:
11/840,689 →
Publication:
US 2008/0056942
Charged Particle Beam Apparatus and Charged Particle Beam Irradiation Method
Scanning Electron Microscope and Calibration of Image Distortion
Observation Method with Electron Beam
Electron Beam Apparatus and Electron Beam Inspection Method
Separation Column and Liquid Chromatograph Using the Same
Surface Inspection with Variable Digital Filterning
Methods and Instruments for Identification of Glycosylated Proteins and Peptides
Electron Beam Inspection Apparatus
Mini Environment Apparatus, Inspection Apparatus, Manufacturing Apparatus and Cleaning Method of Space
Charged Particle Beam Apparatus, Scanning Electron Microscope, and Sample Observation Method Using the Same
Chromatograph Analyzing Device for Processing a Waveform of Chromatograph Data
Charged Particle Beam Scanning Method and Charged Particle Beam Apparatus
Ion Trap Mass Spectrometry Method
Ion Trap Time-of-Flight Mass Spectrometer
Charged Particle Beam Scanning Method and Charged Particle Beam Apparatus
Automatic Defect Review and Classification System
Pattern Displacement Measuring Method and Pattern Measuring Device
Sample Dimension Measuring Method and Scanning Electron Microscope
Scanning Electron Microscope and Cd Measurement Calibration Standard Specimen
Electron Beam Apparatus and Method for Production of Its Specimen Chamber
Scanning Electron Microscope Having Time Constant Measurement Capability
Standard Reference Component for Calibration, Fabrication Method for the Same, and Scanning Electron Microscope Using the Same
Defect Inspecting Device for Sample Surface and Defect Detection Method Therefor
Charged Particle Beam Orbit Corrector and Charged Particle Beam Apparatus
Sem System and a Method for Producing a Recipe
Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus
Electron Beam Apparatus
Sample Dispensing Apparatus
Primers for Isothermal Amplification of Hepatitis C Virus
Defective Product Inspection Apparatus, Probe Positioning Method and Probe Moving Method
Scanning Electron Microscope and a Method for Pattern Composite Inspection Using the Same
Mass Spectrometer
Electrophoresis Unit and Electrophoretic Analysis Method
Mass Spectrometer and Mass Spectrometry Method
Scanning Electron Microscope
Electrophoretic Apparatus
Information Processing System Using Nucleotide Sequence-Related Information
Apparatus for Ion Beam Fabrication
Apparatus, Method and Program Product for Matching with a Template
Charged Particle Beam Measurement Equipment, Size Correction and Standard Sample for Correction
Plasma Processing Method
Scanning Electron Microscope and Method for Processing an Image Obtained by the Scanning Electron Microscope
Plasma Processing Apparatus And Method For Controlling The Same
Charged Particle Beam Apparatus
Scanning Electron Microscope
Method for Dry Etching AL2O3 Film
Method and System of Displaying an Exposure Condition
Automatic Analyzer and the Analyzing Method Using the Same
Automatic Analyzer
Defect Review Method and Device for Semiconductor Device
Method and Apparatus for Measuring Pattern Dimensions
Vacuum Processing Apparatus
Plasma Processing Apparatus and Method for Venting the Same to Atmosphere
Liquid Chromatograph Device
Charged Particle Beam Apparatus
Electron Microscope
Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images
Pattern Measuring Method and Electron Microscope
Electrostatic Charge Measurement Method, Focus Adjustment Method, and Scanning Electron Microscope
Manufacturing Method in Plasma Processing Apparatus
Analyzing Apparatus, Program, Defect Inspection Apparatus, Defect Review Apparatus, Analysis System, and Analysis Method
Method and Apparatus for Inspecting a Semiconductor Device
Fluorescence Detection Apparatus and Method, and Prism Used Therein
Magnetic Head Slider Testing Apparatus and Magnetic Head Slider Testing Method
Image Processing System and Scanning Electron Microscope
Etching Method and Etching Equipment
Automatic Analyzer
Inspection Apparatus and Inspection Method
Charged Particle Beam Apparatus
Defect Inspection and Charged Particle Beam Apparatus
Plasma Processing Method and Plasma Processing Apparatus
Electron Beam Device
Electrophoresis Device and Electrophoresis Method
Pattern Inspection Apparatus
Capillary Electrophoresis Apparatus
Method of Forming a Sample Image and Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Defect inspection apparatus and method utilizing multiple inspection conditions
Method and Apparatus for Chromatography Mass Spectrometry
Standard Component for Calibration and Electron-Beam System Using the Same
Mass Spectrometer
Mass Spectrometric Analyzer
Evaluation Method of Fine Pattern Feature, Its Equipment, and Method of Semiconductor Device Fabrication
Ion Concentration Measuring Device and Ion Concentration Measuring Element
Charged Particle Beam Equipment
Semiconductor Inspecting Apparatus
Standard Component for Length Measurement, Method for Producing the Same, and Electron Beam Metrology System Using the Same
Ion Source, Ion Beam Processing/Observation Apparatus, Charged Particle Beam Apparatus, and Method for Observing Cross Section of Sample
Defect Review Apparatus and Method of Reviewing Defects
Defect Inspection System and Method of the Same
Method and Apparatus for Observing a Specimen
Method of Apparatus for Detecting Particles on a Specimen
Contamination-Inspecting Apparatus and Detection Circuit
Probe Navigation Method and Device and Defect Inspection Device
Scanning Electron Microscope and Three-Dimensional Shape Measuring Device That Used It
Reaction Cuvette for Automatic Analyzer and Method of Surface Treatment for Reaction Cuvette
Sample Handling System
Biochemical Analyzer
Micro-Sample Processing Method, Observation Method and Apparatus
Charged Particle Beam Apparatus, Aberration Correction Value Calculation Unit Therefor, and Aberration Correction Program Therefor
Method and Apparatus for Inspecting Pattern Defects
Heating Stage for a Micro-Sample
Charged Particle Beam Apparatus
High-Accuracy Pattern Shape Evaluating Method and Apparatus
Specimen Rack and Specimen Carrier System
Capillary Electrophoresis Device
Inspection Device and Inspection Method
Apparatus for Measuring High Density Lipoproteins and Method of Separating High Density Lipoproteins
Method and Its System for Calibrating Measured Data Between Different Measuring Tools
Scanning Electron Microscope and Method of Imaging an Object by Using the Scanning Electron Microscope
Method and Apparatus for Reviewing Defect
Charged Particle Beam Apparatus and Control Method Therefor
Sample Dispensing Apparatus and Method
Mass Spectrometer
Charged Particle Beam Apparatus
Method and System for Observing a Specimen Using a Scanning Electron Microscope
Electrophoresis Apparatus and Pump Mechanism Used in the Same
Charged Particle Beam Apparatus for Forming a Specimen Image
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Charged Particle Beam Equipments, and Charged Particle Beam Microscope
Test Apparatus
Mass Spectrometer
Nucleic Acid Analysis Device and Nucleic Acid Analyzer Using the Same
Electrophoresis Apparatus Using Capillary Array and a Sample Tray
Specimen Preprocessing System
Recipe Generation System and Method
Automatic Analyzer and Method for Using the Same
Charged Particle Beam Irradiation System
Pattern Measurement Method and Pattern Measurement System
Corrector for Charged-Particle Beam Aberration and Charged-Particle Beam Apparatus
Wafer Surface Inspection Apparatus and Wafer Surface Inspection Method
Aberration Corrector and Charged Particle Beam Apparatus Using the Same
Pattern Inspection Method and Pattern Inspection System
Pattern Measurement Apparatus
Scanning Electron Microscope
Length Measurement System
Mass Spectroscopy System and Mass Spectroscopy Method
Vacuum Processing Apparatus
Liquid Delivery Device, Liquid Chromatograph, and Method for Operation of Liquid Delivery Device
Pattern Shape Evaluation Method
Defects Inspecting Apparatus and Defects Inspecting Method
Plasma Processing Apparatus and Plasma Processing Method
Image Processing Method for Determining Matching Position Between Template and Search Image
Vacuum Processing Apparatus and Vacuum Processing Method
Vacuum Processing Apparatus
Automatic Analyzer
Automated Analyzer
Automatic Analyzer
Automatic Multi-Purpose Analyzer
Vacuum Processing Apparatus
Defect Inspection Method
Automatic Analyzer and Operating Method for Same
Charged Particle Beam Apparatus and Specimen Inspection Method
Scanning Electron Microscope and Cd Measurement Calibration Standard Specimen
Localized Static Charge Distribution Precision Measurement Method and Device
Anion Concentration Measuring Device and Anion Concentration Measuring Element
Liquid Medium for Preventing Charge-Up in Electron Microscope and Method of Observing Sample Using the Same
Vacuum Processing Apparatus
Vacuum Processing Apparatus
Vacuum Processing Apparatus and Vacuum Processing Method
Apparatus and Method for Detecting Target Substance, or Device Used for These Apparatus and Method
Charged Particle Beam Equipment and Charged Particle Microscopy
System for Managing Recipes for Operating a Measurement Device
Method for Inspecting and Measuring Sample and Scanning Electron Microscope
Plasma Processing Apparatus
Charged Particle Beam Apparatus
Scanning Electron Microscope
Scanning Electron Microscope
Detection Circuit and Foreign Matter Inspection Apparatus for Semiconductor Wafer
Inspection Apparatus and Inspection Method
Method and Apparatus for Inspecting Foreign Particle Defects
Optical Defect Inspection Apparatus
Sample Dimension Inspecting/Measuring Method and Sample Dimension Inspecting/Measuring Apparatus
Cleaning Apparatus
Charged Particle Beam Device
Defect Review Method and Apparatus
Gas Field Ion Source, Charged Particle Microscope, and Apparatus
Defect Inspection Method and Its System
Inspection Method and Inspection System Using Charged Particle Beam
Plasma Processing Apparatus and Method
Automatic Analyzer
Method and Apparatus for Measuring Dimension Using Electron Microscope
Electrostatic Deflection Control Circuit and Method of Electronic Beam Measuring Apparatus
Electron Beam Measurement Apparatus
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Mass Spectrometer System
Automatic Analyzer
Automatic Analyzer and Sample-Processing System
Method and Apparatus for Image Generation
Capillary Electrophoresis Apparatus
Apparatus and Method for Inspection and Measurement
Charged Particle Beam Trajectory Corrector and Charged Particle Beam Apparatus
Tool-To-Tool Matching Control Method and Its System for Scanning Electron Microscope
Method and Apparatus for Inspecting Defect of Pattern Formed on Semiconductor Device
Inspection Apparatus and Inspection Method
Pattern Defect Analysis Equipment, Pattern Defect Analysis Method and Pattern Defect Analysis Program
Capillary Array Unit and Capillary Electrophoresis Apparatus
Inspection Method for Semiconductor Wafer and Apparatus for Reviewing Defects
Capillary Electrophoresis Device
Methods for Sample Preparation and Observation, Charged Particle Apparatus
Surface Inspection Tool and Surface Inspection Method
Apparatus and Method for Specimen Fabrication
Electronic Microscope Apparatus
Electron Microscope System and Method for Evaluating Film Thickness Reduction of Resist Patterns
Method and Apparatus for Measuring Dimension of Circuit Patterm Formed on Substrate by Using Scanning Electron Microscope
Automatic Analzyer
Review Method and Review Device
Pattern Generating Apparatus and Pattern Shape Evaluating Apparatus
Surface Inspection Method and Inspecting Device Using the Same
Charged Particle Beam Apparatus Including Aberration Corrector
Automatic Analyzer
Nucleic Acid Analyzing Apparatus
Defect Inspection Tool and Method of Parameter Tuning for Defect Inspection Tool
Scanning Electron Microscope System and Method for Measuring Dimensions of Patterns Formed on Semiconductor Device by Using the System
Plasma processing apparatus and operation method thereof
Apparatus and Method for Monitoring Semiconductor Device Manufacturing Process
Mass Spectrometer, Method of Mass Spectrometry and Program for Mass Spectrometry
Etching Process State Judgment Method and System Therefor
Charged Particle Beam Apparatus Permitting High-Resolution and High-Contrast Observation
Automatic Analyzer and Analysis System Using Photomultiplier Tube
Application:
12/388,300 →
Publication:
US 2009/0230291
Vacuum Processing Apparatus
Automatic Analyzer
Application:
12/388,845 →
Publication:
US 2009/0222213
Method and Apparatus of Pattern Inspection and Semiconductor Inspection System Using the Same
Pattern Measurement Methods and Pattern Measurement Equipment
Defect Inspection Apparatus and Method
Vacuum Processing Apparatus
Pattern Measuring Method and Pattern Measuring Device
Scanning Electron Microscope
Edge Detection Technique and Charged Particle Radiation Equipment
Inspection Apparatus and an Inspection Method for Inspecting a Circuit Pattern
Magnetic Head Inspection Method and Magnetic Head Inspection Device
Method for Etching a Sample
Plasma Processing Apparatus and Method for Operating the Same
Plasma Processing Apparatus
Method for Fluorescence Analysis and Fluorescence Analyzer
Method and Apparatus for Computing Degree of Matching
Defect Inspection Apparatus
Apparatus for Data Analysis
Scanning Type Charged Particle Beam Microscope and an Image Processing Method Using the Same
Transmission Electron Microscope Having Electron Spectroscope
Sample Inspection Apparatus
Scanning Microscope
Method and Apparatus for Inspecting Defects
Method and Apparatus for Inspecting Defects
Method and Apparatus for Reviewing Defects
Recipe Parameter Management System and Recipe Parameter Management Method
Plasma Processing Method
Charged particle beam apparatus
Graphical User Interface for Use with Electron Beam Wafer Inspection
Mass Spectrometer
Surface Defect Data Display and Management System and a Method of Displaying and Managing a Surface Defect Data
Way of Method Transfer of Liquid Chromatograph and Liquid Chromatograph System
Inspecting Method and Inspecting Apparatus for Substrate Surface
Defective Product Inspection Apparatus, Probe Positioning Method and Probe Moving Method
Mass Spectrometer and Mass Spectrometry Method
Time-Of-Flight Mass Spectrometer
Cell Made of Polymers for Spectra Measurement and Method for Producing the Same
Appearance Inspection Apparatus
Charged Particle Beam Apparatus
Dry Etching Method
Method and Apparatus of Tilted Illumination Observation
Plasma Processing Apparatus and Maintenance Method Therefor
Substrate Inspection Device and Substrate Inspection Method
Charged Particle Beam Apparatus and Dimension Measuring Method
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Inspection Method and Inspection Apparatus
Optical Inspection Method and Optical Inspection Apparatus
Defect Review and Classification System
Method and Apparatus for Reviewing Defects
Plasma Processing Apparatus and Method
Method and Apparatus for Creating Imaging Recipe
Patent:
45,204 →
Application:
12/614,358 →
Cell Culture Vessel, Production Process Thereof and Cultured Cell
Charged Particle Beam Apparatus
Method and Apparatus for Creating Imaging Recipe
Patent:
45,224 →
Application:
12/621,307 →
Electron Beam Apparatus and Method of Generating an Electron Beam Irradiation Pattern
Chromatograph Analyzing Device
Method and Apparatus for Pattern Position and Overlay Measurement
Charged Particle Beam Apparatus
Vacuum Processing Apparatus
Defect Inspection Apparatus and Defect Inspection Method
Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images
Orientation Identification Label, Reagent Container Carrier Structure, Analyzer Device And Reader Module
Plasma Processing Apparatus
Method and Apparatus for Reviewing Defects
Vacuum Processing Apparatus and Plasma Processing Apparatus with Temperature Control Function for Wafer Stage
Plasma Processing Apparatus
Plasma Etching Method and Plasma Etching Apparatus
Pattern Displacement Measuring Method and Pattern Measuring Device
Vacuum Processing Apparatus
Defect Inspection Method
Defect Inspection and Charged Particle Beam Apparatus
Logical Cad Navigation for Device Characteristics Evaluation System
Sample Inspection System and Operating Method for Management Server Thereof
Dual beam apparatus with tilting sample stage
Surface Inspection Method and Surface Inspection Apparatus
Foreign Matter Inspection Method and Foreign Matter Inspection Apparatus
Pattern Measurement Apparatus
Semiconductor Testing Method and Semiconductor Tester
Scanning Electron Microscope
Inspection Apparatus and Inspection Method
Defect Inspecting Method and Apparatus
Pattern Defect Inspection Apparatus and Method
Network Configuration Method
Information Processing System Using Base Sequence Relevant Information
Chemical Analysis Apparatus and Chemical Analysis Method
Method for Measuring Optimum Seeking Time and Inspection Apparatus Using the Same
Method of Correcting Coordinates, and Defect Review Apparatus
Electrostatic Charge Measurement Method, Focus Adjustment Method, and Scanning Electron Microscope
Surface Inspection Method and Surface Inspection Apparatus
Deflector Array, Exposure Apparatus, and Device Manufacturing Method
Appearance Inspection Apparatus
Scanning Electron Microscope Having Time Constant Measurement Capability
Disk Protrusion Detection/Flatness Measurement Circuit and Disk Glide Tester
Automatic Analyzer
Cleaning Method
Optical Apparatus for Defect Inspection
Plasma Processing Apparatus
Plasma Processing Apparatus and Sample Stage
Vacuum Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Method and Device for Inspecting Defects on Both Surfaces of Magnetic Disk
Plasma Processing Apparatus and Plasma Processing Method
Pattern Inspection Method and Pattern Inspection System
Automatic Analyzer
Scanning Electron Microscope
Vacuum Processing Apparatus and Operating Method of Vacuum Processing Apparatus
Method and Apparatus for Analyzing Defect Data and a Review System
Information Processing System Using Nucleotide Sequence-Related Information
Sample Dispensing Apparatus and Automatic Analyzer Including the Same
Charged Particle Beam Apparatus and Methods for Capturing Images Using the Same
Method of Apparatus for Detecting Particles on a Specimen
Image Forming Method and Charged Particle Beam Apparatus
Transmission Electron Microscope, and Method of Observing Specimen
Method and Device for Dividing Area of Image of Particle in Urine
Image Inspection Apparatus
Liquid Delivery Device, Liquid Chromatograph, and Method for Operation of Liquid Delivery Device
Charged Particle Beam System
Defect Review Apparatus and Method of Reviewing Defects
Heat Treatment Apparatus That Performs Defect Repair Annealing
Micro-Sample Processing Method, Observation Method and Apparatus
Surface Inspection Method and Surface Inspection Apparatus
Semiconductor Processing System and Program
Optical Checking Method and Apparatus for Defects in Magnetic Disks
Surface Inspection Tool and Surface Inspection Method
Electron Beam Measurement Apparatus
Scanning Electron Microscope and Method of Imaging an Object by Using the Scanning Electron Microscope
Method and Apparatus for Reviewing Defects of Semiconductor Device
Automatic Analyzer
Application:
12/990,789 →
Publication:
US 2011/0058984
System for Pretreating Sample
Automatic Analyzer
Method and Apparatus for Analysis of Poly (Biphenyl Chloride) in Electrical Insulating Oil
Method for Assisting Judgment of Abnormality of Reaction Process Data and Automatic Analyzer
Ion Beam Device
Particle Image Analysis Method and Apparatus
Pattern Inspection Method, Pattern Inspection Apparatus and Pattern Processing Apparatus
Nucleic Acid Analyzing Device and Nucleic Acid Analyzer
Charged Particle Beam Apparatus, and Method of Controlling the Same
Semiconductor Inspecting Apparatus
Nucleic Acid Analyzer, Automatic Analyzer, and Analysis Method
Transmission Electron Microscope Apparatus Comprising Electron Spectroscope, Sample Holder, Sample Stage, and Method for Acquiring Spectral Image
Sample Analysis Device
Automatic Analyzing Device
Plasma Processing Method and Plasma Processing Apparatus
Plasma Processing Method
Plasma Processing Method
Plasma Processing Apparatus
Defect Inspection Method and Apparatus
Vacuum Processing Apparatus
Vacuum Processing Apparatus and Program
Vacuum Processing Apparatus and Program
Industrial Network System
Vacuum Processing Apparatus
Magnetic Head Inspection Method and Magnetic Head Manufacturing Method
Method and Apparatus for Measuring Dimension of Circuit Pattern Formed on Substrate by Using Scanning Electron Microscope
Charged Particle Beam Apparatus
Pattern Matching Method and Computer Program for Executing Pattern Matching
Wafer Inspection Data Handling and Defect Review Tool
Sample Dimension Inspecting/Measuring Method and Sample Dimension Inspecting/Measuring Apparatus
Mass Spectroscope and Mass Spectrometry
Total Internal Reflection Fluorescence (Tirf) Observation Device
Circuit Pattern Examining Apparatus and Circuit Pattern Examining Method
Defect Review System and Method, and Program
Standard Member for Correction, Scanning Electron Microscope Using Same, and Scanning Electron Microscope Correction Method
Sample Conveying Mechanism
Specimen Rack
Mass Spectrometer
Light Source Device, Surface Inspecting Apparatus Using the Device, and Method for Calibrating Surface Inspecting Apparatus Using the Device
Inspection Device
Method and Device for Synthesizing Panorama Image Using Scanning Charged-Particle Microscope
Charged Particle Beam Apparatus and Geometrical Aberration Measurement Method Therefor
Charged Particle Beam Device
Automatic Analyzer Including Pressure Sensor for Washing Solution
Automatic Analyzer
Automatic Analyzer and Sample-Processing System
Method for Controlling Charging of Sample and Scanning Electron Microscope
Charged Corpuscular Particle Beam Irradiating Method, and Charged Corpuscular Particle Beam Apparatus
Pretreatment Apparatus and Mass Spectrometer Equipped with the Same Apparatus
Charged Particle Beam Device for Scanning a Sample Using a Charged Particle Beam to Inspect the Sample
Charged Particle Beam Scanning Method and Charged Particle Beam Apparatus
Test Apparatus
Analyzer, Ionization Apparatus and Analyzing Method
Mass Spectrometer
Automatic Analyzer
Defect Inspection Apparatus and Its Method
Heat Treatment Apparatus
Method and Its Apparatus for Inspecting Defects
Method for Inspecting and Measuring Sample and Scanning Electron Microscope
Method of Apparatus for Detecting Particles on a Specimen
Pattern Matching Method and Image Processing Device
Pattern-Searching Condition Determining Method, and Pattern-Searching Condition Setting Device
Charged Particle Beam Apparatus
Circuit Pattern Inspecting Apparatus, Management System Including Circuit Pattern Inspecting Apparatus, and Method for Inspecting Circuit Pattern
Charged Particle Beam Apparatus
Method for Observing Sample and Electronic Microscope
An Inspecting Apparatus and an Inspecting Method
Calibration Standard Member, Method for Manufacturing the Member and Scanning Electronic Microscope Using the Member
Pattern Check Device and Pattern Check Method
Automatic Analysis Device
Automatic Analyzer
Electron Beam Device and Electron Beam Application Device Using the Same
Scanning Electron Microscope
Inspection Method and Inspection Apparatus
Automatic Analyzer
Accuracy Management Method
Charged Particle Radiation Device and Image Capturing Condition Determining Method Using Charged Particle Radiation Device
Analyzer
Charged Beam Device
Dark-Field Defect Inspecting Method, Dark-Field Defect Inspecting Apparatus, Aberration Analyzing Method, and Aberration Analyzing Apparatus
Image Classification Standard Update Method, Program, and Image Classification Device
Defect Observation Method and Device Using Sem
Charged Particle Beam Applied Apparatus
Charged Particle Radiation Device Provided with Aberration Corrector
Etching Apparatus, Analysis Apparatus, Etching Treatment Method, and Etching Treatment Program
Ion Beam Device
Automated Analyzer
Automatic Analyzer
Automatic Analyzer
Automatic Analysis Apparatus and Automatic Analysis Method
Electron Microscope
Defect Observation Method and Defect Observation Apparatus
Charged Particle Beam Device
Automatic Analyzer and Sample Treatment Apparatus
Apparatus for Pretreating Biological Samples, and Mass Spectrometer Equipped with Same
Application:
13/146,656 →
Publication:
US 2012/0121464
Sample Pretreatment Apparatus and Mass Spectrometer Provided with the Same
Immunoanalytical Method and System Using Mass Spectrometry Technology
Device for Automatically Analyzing Microorganisms and Method for Automatically Analyzing Microorganisms
Fluorescence Analyzing Device and Fluorescence Analyzing Method
Autoanalyzer and Pipetting Nozzle for Autoanalyzer
Automatic Analyzer
Total Internal Reflection Microscope Apparatus and Method for Analyzing Fluorescent Sample
Automated Analyzer
Method for Adjusting Optical Axis of Charged Particle Radiation and Charged Particle Radiation Device
Sample Analyzing Device
Charged Particle Radiation Device
Semiconductor Inspection Method and Device That Consider the Effects of Electron Beams
Method for Determining Biopolymer Using Nanopore, and System and Kit Therefor
Work Direction Determining Method and Device, and Work Provided with Direction Determining Function
Mass Spectrometric System
Sample Observing Method and Scanning Electron Microscope
Optical Inspection Method and Optical Inspection Apparatus
Apparatus and Method for Inspecting Defects
Substrate Holding Apparatus, and Inspection or Processing Apparatus
Vacuum Processing Apparatus
Automatic Analyzer
Defect Classifier Using Classification Recipe Based on Connection Between Rule-Based and Example-Based Classifiers
Plasma Processing Apparatus and Plasma Processing Method
Scanning Electron Microscope
Tool-To-Tool Matching Control Method and Its System for Scanning Electron Microscope
Apparatus for Inspecting Defects
Electron Beam Device and Sample Holding Device for Electron Beam Device
Pattern Measurement Apparatus
Charged Particle Beam Device
Electron Microscope, and Specimen Holding Method
Examination Method and Examination Device
Liquid Chromatograph, Liquid Chromatograph Column and Filter for Liquid Chromatograph Column
Inspection Method and Inspection Apparatus
Surface Inspecting Apparatus and Method for Calibrating Same
Plasma Processing Method
Plasma Processing Method
Plasma Processing Method and Plasma Processing Apparatus
Method and Apparatus for Inspecting Pattern Defects
Drug Detection Equipment
Method and Apparatus for Inspecting Defect of Pattern Formed on Semiconductor Device
Plasma Processing Apparatus and Plasma Processing Method
Automatic Analysis Apparatus
Application:
13/262,671 →
Publication:
US 2012/0048036
Capillary Electrophoresis Apparatus
Electrophoresis Device and Pump
Automatic Analysis Device and Dispensing Device
Application:
13/263,454 →
Publication:
US 2012/0020838
Pattern Measuring Apparatus and Computer Program
Sample Holder, Method for Use of the Sample Holder, and Charged Particle Device
Automatic Analyzer
Composite Charged Particle Beams Apparatus
Reviewed Defect Selection Processing Method, Defect Review Method, Reviewed Defect Selection Processing Tool, and Defect Review Tool
Magnetic Disk Inspecting Method and Its System
Information Processing System Using Nucleotide Sequence-Related Information
Vacuum Processing Apparatus
Automatic Analyzer
Mass Spectrometer
Pattern Generating Apparatus and Pattern Shape Evaluating Apparatus
Scanning Electron Microscope
Method and Apparatus for Reviewing Defects
Automatic Analyzer and Analysis Method
Surface Observation Apparatus and Surface Observation Method
Automatic Analyzer
Automatic Analysis Device and Analysis Method
Charged Particle Beam Device and Sample Observation Method
Automatic Analyzer with the Function of Rendering Reagent Information Unreadable
Scanning Electron Microscope Device, Evaluation Point Generating Method, and Program
Sample-Test-Device Management Server, Sample Test Device, Sample Test System, and Sample Test Method
Inspection Apparatus and Inspection Method
System and Method of Image Processing, and Scanning Electron Microscope
Plasma Processing Apparatus
Information Processing System Using Nucleotide Sequence-Related Information
Method and Apparatus of Pattern Inspection and Semiconductor Inspection System Using the Same
Inspection Method and Inspection Apparatus
Scanning Electron Microscope System and Method for Measuring Dimensions of Patterns Formed on Semiconductor Device by Using the System
Pattern Defect Analysis Equipment, Pattern Defect Analysis Method and Pattern Defect Analysis Program
Fault Inspection Method
Gas Field Ion Source, Charged Particle Microscope, and Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Automatic Analyzer
Defect Classifier Using Classification Recipe Based on Connection Between Rule-Based and Example-Based Classifiers
Scanning Electron Microscope and Method for Processing an Image Obtained by the Scanning Electron Microscope
Plasma Processing Method
Plasma Processing Apparatus
Plasma Etching Method
Mass Spectrometer Method and Mass Spectrometer
Defect Inspection Method
Mass Spectrometer
Defect Inspection Apparatus and Its Method
Method of Manufacturing a Template Matching Template, as Well as a Device for Manufacturing a Template
Defect Inspection Method and Apparatus Therefor
Flow Type Particle Image Analysis Method and Device
Defect Image Processing Apparatus, Defect Image Processing Method, Semiconductor Defect Classifying Apparatus, and Semiconductor Defect Classifying Method
Device for Classifying Defects and Method for Adjusting Classification
Charged Particle Radiation Device
Pretreatment Apparatus and Mass Analyzing Apparatus Equipped with the Same
Microcontact Prober
Defect Inspection Device and Inspection Method
Charged Particle Radiation Device
Scanning Electron Microscope Device and Pattern Dimension Measuring Method Using Same
Charged-Particle Microscope Device and Method for Inspecting Sample Using Same
Fluorescence Analyzing Apparatus and Fluorescence Detecting Apparatus
Ion Microscope
Automatic Analyzer
Semiconductor Defect Classifying Method, Semiconductor Defect Classifying Apparatus, and Semiconductor Defect Classifying Program
Mass Spectrometer and Mass Spectrometry Method
Automated Sample Processing System
Specimen Potential Measuring Method, and Charged Particle Beam Device
Automatic Analyzer
Application:
13/384,363 →
Publication:
US 2012/0128534
Sample Conveying System
Apparatus and Method for Inspecting Pattern Defect
Pattern Evaluation Method, Device Therefor, and Electron Beam Device
Centrifugal Separator with Rotor Balancing Mechanism
Application:
13/386,541 →
Publication:
US 2012/0129673
Article Conveying System and Sample Processing System
Particle Image Analysis Apparatus
Application:
13/386,846 →
Publication:
US 2012/0134559
Ion Milling Device
Signal Processing Device, Mass Spectrometer, and Photometer
Scanning Electron Microscope and Sample Observation Method
Specimen Processing System
Defect Inspection Device and Defect Inspection Method
Method of Creating Template for Matching, as Well as Device for Creating Template
Scanning Electron Microscope
Dispensing Device and Analyzer
Biomolecule Fixing Board and Method of Manufacturing the Same
Automatic Analyzing Device, Information Display Method Thereof, and Information Display System
Sample Preprocessing and Conveying System
Automated Sample Testing System
Surface-Defect Inspection Device
Contamination Inspection Method and Contamination Inspection Device
Plasma Processing Method
Charged Particle Beam Apparatus Including Aberration Corrector
Inspecting Method and Inspecting Apparatus for Substrate Surface
Plasma Processing Apparatus
Reagent Transfer Device
Appearance Inspection Apparatus
Scanning Electron Microscope and a Method for Imaging a Specimen Using the Same
Charged Particle Instrument
Object Holding Apparatus, and Inspection Apparatus
Pattern Measuring Method and Pattern Measuring Device
Liquid Chromatograph and Sample Introducing Apparatus
Inspection Apparatus and Inspection Method
Inspection Apparatus and Inspection Method
Sample Dispensing Apparatus and Automatic Analyzer Including the Same
Vacuum Process Device and Vacuum Process Method
Thermally Assisted Magnetic Recording Head Inspection Method and Apparatus
Method and Apparatus for Inspecting Defects
Linear Motor, Movable Stage and Electron Microscope
Charged Particle Beam Apparatus and Film Thickness Measurement Method
Charged Particle Radiation Device
Gas Field Ionization Ion Source and Ion Beam Device
Examination Device and Examination Method
Gas Temperature/Humidity Regulation Method and Gas Supply Device
Application:
13/502,216 →
Publication:
US 2012/0220026
Heat Retaining Device
Scanning Charged Particle Beam Device and Method for Correcting Chromatic Spherical Combination Aberration
Pattern Matching Method and Pattern Matching Apparatus
Charged Particle Beam Device, Position Specification Method Used for Charged Particle Beam Device, and Program
Cover Opener and Automatic Analyzing Device Using Same
Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus
Pattern Dimension Measurement Method and Charged Particle Beam Microscope Used in Same
Scanning Electron Microscope
Device for Harvesting Bacterial Colony and Method Therefor
Electron Microscope
Blood Coagulation Analyzer
Sample Processing Apparatus, Sample Processing System, and Method for Processing Sample
Defect Detection Method and Defect Detection Device and Defect Observation Device Provided with Same
Charged-Particle Microscope and Method for Controlling Same
Charged Particle Beam Device and a Method of Improving Image Quality of the Same
Management System for an Electrolyte Analyzer
Electron Microscope
Etching Apparatus, Control Simulator,and Semiconductor Device Manufacturing Method
Dispensing Nozzle for Automatic Analyzer, and Automatic Analyzer Including Same
Automatic Analyzer
Automatic Analyzing Device
Automated Analyzer and Device for Opening/Closing the Lids of Reagent Vessels
Defect Observation Method and Defect Observation Device
Charged Particle Beam Device and Sample Observation Method
Automatic Analyzer
Application:
13/516,006 →
Publication:
US 2012/0282137
Sample Processing Device, Sample Processing Method, and Reaction Container Used in These Device and Method
Image Processing Device, Measuring/Testing System, and Program
Pattern Measuring Apparatus
Defect Inspection Device and Defect Inspection Method
Analytical Apparatus and Detection Method Employed in Analytical Apparatus
Mass Spectrometer and Mass Spectrometry
Method and Device for Testing Defect Using Sem
Inspecting Apparatus and Inspecting Method
Defect Inspecting Device and Defect Inspecting Method
Defect Inspection Method and Device Thereof
Charged Particle Radiation Device with Bandpass Detection
Electric Charged Particle Beam Microscope and Electric Charged Particle Beam Microscopy
Mass Spectrometry Device and Method Using Ion-Molecule Reaction Ionization
Scanning Electron Microscope
Method of Extracting Contour Lines of Image Data Obtained By Means of Charged Particle Beam Device, and Contour Line Extraction Device
Surface Inspection Apparatus and Surface Inspection Method
Mass Spectrometry Method
Mass Spectrometer and Mass Analyzing Method
Defects Inspecting Apparatus and Defects Inspecting Method
Automatic Analyzer
Electron Beam Apparatus and Electron Beam Inspection Method
Chilled Reagent Container and Nucleic Acid Analyzer
Pattern Defect Inspection Apparatus and Method
Semiconductor Inspecting Apparatus
Electron Microscope System and Method for Evaluating Film Thickness Reduction of Resist Patterns
Vacuum Processing Apparatus And Plasma Processing Apparatus With Temperature Control Function For Wafer Stage
Automatic Analyzer
Heat Treatment Apparatus
Charged Particle Beam Apparatus Permitting High Resolution and High-Contrast Observation
Capillary Electrophoresis Apparatus
Automatic Analyzer and Sample-Processing System
Mass Spectrometer and Mass Analyzing Method for Efficiently Ionizing a Sample with Less Carry-Over
Method for Detecting Information of an Electronic Potential on a Sample and Charged Particle Beam Apparatus
Chromatograph Analyzing Device
Mass Spectrometer
Defect Inspection Device and Method of Inspecting Defect
Automatic Analyzing System
Automatic Analyzer
Apparatus for Forming Image for Pattern Matching
Nucleic Acid Analyzer, Reaction Device for Nucleic Acid Analysis and Substrate of Reaction Device for Nucleic Acid Analysis
Observation Method and Observation Device
Composite Charged-Particle-Beam Apparatus
Surface Inspection Device and Surface Inspection Method
Application:
13/577,348 →
Publication:
US 2013/0010290
Pattern Inspection Method, Pattern Inspection Program, and Electronic Device Inspection System
Circuit-Pattern Inspection Device
Electron Microscope and Sample Holder
Charged Particle Beam Apparatus
Automatic Analysis Device
Field-Emission Electron Gun and Method for Controlling Same
Scanning Electron Microscope Optical Condition Setting Method and Scanning Electron Microscope
Spectrophotometer and Method for Determining Performance Thereof
Image Processing Apparatus, Image Processing Method, and Image Processing Program
Inspection Apparatus and Inspection Method
Application:
13/579,965 →
Publication:
US 2013/0148113
Analysis Device
Electron Beam Irradiation Method and Scanning Electron Microscope
Inspection Apparatus, Substrate Mounting Device and Inspection Method
Method for Superimposing and Displaying Electron Microscope Image and Optical Image
Application:
13/580,576 →
Publication:
US 2012/0326033
Charged Particle Beam Microscope
Vacuum Processing Apparatus and Operating Method of the Same
Defect Inspection System
Ion Beam Device
Inspection Apparatus
Charged Particle Beam Apparatus, and Sample Processing and Observation Method
Plasma Processing Apparatus and Plasma Processing Method
Method and Apparatus for Inspecting Pattern Defects
Plasma Processing Apparatus and Diagnosis Method Thereof
Semiconductor Manufacturing Equipment
Automatic Analyzer
Vacuum Processing Device and Method of Transporting Process Subject Member
Charged Particle Radiation Device
Inspection Method and Device Therefor
Scanning Electron Microscope and Sample Observation Method
Scanning Electron Microscope with a Table Being Guided by Rolling Friction Elements
Apparatus and Method for Probe Shape Processing by Ion Beam
Automatic Analysis Device and Automatic Analysis Method
Defect Inspection System
Plasma Etching Method
Charged Particle Beam Apparatus, and Method of Controlling the Same
Inspecting Method and Inspecting Apparatus for Substrate Surface
Sample Pretreatment Apparatus and Mass Spectrometer Provided with the Same
Plasma Processing Apparatus and Plasma Processing Method
Inspection Apparatus and Inspection Method
Template Matching Processing Device and Template Matching Processing Program
Nucleic Acid Amplifier and Nucleic Acid Inspection Device Employing the Same
Nucleic Acid Analysis Reaction Cell and Nucleic Acid Analyzer
Defect Inspection Method, and Device Thereof
Automatic Analysis System and Device Management Server
Automatic Analyzer for Biological Samples
Pattern Dimension Measurement Method, Pattern Dimension Measurement Device, Program for Causing Computer to Execute Pattern Dimension Measurement Method, and Recording Medium Having Same Recorded Thereon
Sample Test Automation System
Pattern Measuring Apparatus, and Pattern Measuring Method and Program
Image Processing Device, Charged Particle Beam Device, Charged Particle Beam Device Adjustment Sample, and Manufacturing Method Thereof
Defect Inspecting Apparatus and Defect Inspecting Method
Method and Device for Inspecting for Defects
Defect Inspection Method and Device Therefor
Light Quantity Detection Method and Device Therefor
Defect Inspection Method and Device Using Same
Sample Analyzing Device and Sample Analyzing Method
Method for Optimizing Observed Image Classification Criterion and Image Classification Apparatus
Method and Apparatus for Inspecting Defect
Fault Inspection Device and Fault Inspection Method
Charged Particle Radiation Device and Soundproof Cover
Liquid Mixing Device and Liquid Chromatograph
Mass Spectroscope and Its Adjusting Method
Phase Plate
Mass Spectrometer and Mass Spectrometry
Method and Apparatus for Reviewing Defects
Method and Apparatus for Monitoring Cross-Sectional Shape of a Pattern Formed on a Semiconductor Device
Plasma Processing Apparatus
Method for Detecting Particles and Defects and Inspection Equipment Thereof
Patent:
44,840 →
Application:
13/743,245 →
Method for Detecting Particles and Defects and Inspection Equipment Thereof
Patent:
44,977 →
Application:
13/743,315 →
Method of Manufacturing Magnetoresistive Element
Plasma Processing Apparatus and Plasma Processing Method
Pattern Generating Apparatus and Pattern Shape Evaluating Apparatus
Method and Apparatus for Optically Inspecting a Magnetic Disk
Method and Apparatus for Inspecting Surface of a Disk
Mass Spectrometric System
Plasma Etching Method
Charged Particle Beam Apparatus
Plasma Etching Method
Patent:
8,728,946 →
Application:
13/767,913 →
Pattern Matching Method and Apparatus
Electron Beam Irradiation Apparatus
Inspection Apparatus
Defect Inspection Apparatus And Defect Inspection Method
Pattern Measuring Apparatus
Charged Particle Beam Apparatus
Dimension Measuring Apparatus and Computer Readable Medium
Sample Stage Device
Electron Beam Irradiation Method and Scanning Electronic Microscope
Pattern Matching Method, Image Processing Device, and Computer Program
Charged Particle Beam Device and Sample Production Method
Charged Particle Beam Apparatus
Pump for Liquid Chromatograph, and Liquid Chromatograph
Automatic Analyzer for Identifying a Cause of Abnormalities of Measurement Results
Analytical Apparatus and Analytical Method
Automatic Analyzer
Automatic Analyzer
Charged Particle Beam Device, Defect Observation Device, and Management Server
Quality Control System
Image Processing Method, Image Processing System, and X-Ray Computed Tomography System
Inspection Method and Device
Method for Detecting Nucleic Acid Amplification in Sample and Device Therefor
Gas Field Ion Source and Method for Using Same, Ion Beam Device, and Emitter Tip and Method for Manufacturing Same
Dispensing Device and Nucleic Acid Analyzer
Ion Trap Type Mass Spectrometer and Mass Spectrometry
Scanning Electron Microscope
Biopolymer Optical Analysis Device and Method
Charged Particle Beam Device
Device for Setting Image Acquisition Conditions, and Computer Program
Charged Particle Beam Microscope
Specimen Holder for Charged-Particle Beam Apparatus
Automated Sample Test System, and Method for Controlling Same
Inspection System, Inspection Method, and Program
Sample Transfer Mechanism
Charged Particle Beam Device and Sample Observation Method Using a rotating detector
Image Forming Device and Computer Program
Image Processing Device and Computer Program
Photoelectric Conversion Element, Defect Inspecting Apparatus, and Defect Inspecting Method
Defect Inspecting Apparatus and Defect Inspecting Method
Sample Processing System
Plasma Processing Apparatus
Defect Inspection Method and Apparatus
Method and Apparatus for Measuring Displacement Between Patterns and Scanning Electron Microscope Installing Unit for Measuring Displacement Between Patterns
Processing Chamber Allocation Setting Device and Processing Chamber Allocation Setting Program
Plasma Processing Apparatus and Plasma Processing Method
Semiconductor Circuit Pattern Measuring Apparatus and Method
Charged Particle Beam Apparatus Permitting High-Resolution and High-Contrast Observation
Automatic Analyzer Using a Sample Container Having an Information Recording Member
Laboratory Automation Apparatus, Automated Analytical Apparatus and System
Method for Scanning Electron Microscope Observation of Sample Floating on Liquid Surface
Multipole Segments Aligned in an Offset Manner in a Mass Spectrometer
Method of Evaluating Systematic Defect, and Apparatus Therefor
Sample Device for Charged Particle Beam
Shape Measurement Method, and System Therefor
Defect Inspection Method and Device Therefor
Pattern Determination Device and Computer Program
Image Processing Apparatus
Pattern Measuring Method, Pattern Measuring Apparatus, and Program Using Same
Defect Inspection Method, Low Light Detecting Method and Low Light Detector
Charged Particle Optical Equipment and Method for Measuring Lens Aberration
Genetic Testing Method and Testing Apparatus
Charged Particle Beam Apparatus Having Noise Absorbing Arrangements
Reaction Plate Assembly, Reaction Plate and Nucleic Acid Analysis Device
Electron Microscope, Electron-Microscope Image-Reconstruction System and Electron-Microscope Image-Reconstruction Method
Mass Spectrometer and Mass Spectrometry Method
Appearance Inspection Apparatus
Pattern Measuring Apparatus, Pattern Measuring Method, and Computer-Readable Recording Medium on Which a Pattern Measuring Program Is Recorded
Defect Inspection Method and Defect Inspection Apparatus
Mass Spectrometer
Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus
Ion Source, Ion Beam Processing/Observation Apparatus, Charged Particle Beam Apparatus, and Method for Observing Cross Section of Sample
Automatic Analyzer
Surface Inspecting Apparatus and Surface Inspecting Method
Measuring/Inspecting Apparatus and Measuring/Inspecting Method Enabling Blanking Control of Electron Beam
Charged Particle Beam Apparatus
Analysis Method, Analysis Device, and Etching Processing System
Plasma Processing Apparatus
Plasma Heat Treatment Apparatus
Application:
13/956,492 →
Publication:
US 2014/0202995
Surface-Defect Inspection Device
Semiconductor Device Manufacturing Method
Pattern Generating Apparatus and Pattern Shape Evaluating Apparatus
Method and Apparatus for Plasma Processing
Method and Apparatus for Inspecting Thermal Assist Type Magnetic Head
Measurement or Inspecting Apparatus
Operation Method for Vacuum Processing Apparatus
Electrophoresis Apparatus, Capillary Array, and Capillary Unit
Defect Inspection Method and Defect Inspection Apparatus
Automatic Centrifuge, Pre-Analysis System with Automatic Centrifuge and the Control Techniques of That System
Mass Analyzing Apparatus, Analyzing Method and Calibration Sample
Automatic Analyzer
Charged Particle Beam Device
Charged Particle Beam Device, and Image Analysis Device
Sample Transport System and Method for Controlling the Same
Analyzing Device
Scanning Electron Microscope
Charged Particle Microscope and Measurement Image Correction Method Thereof
Automatic Analysis System with Removal, Tracking, and Mounting of Stopper Bodies
Charged Particle Beam Apparatus for Removing Charges Developed on a Region of a Sample
Pattern Matching Apparatus and Computer Program
Microparticle having single-molecule nucleic acid probe, method for producing same, method for analyzing nucleic acid using same, device for nucleic acid analysis, and apparatus for analyzing nucleic acid
Genetic Analyzer
Automatic Analyzer
Analyzer
Charged Particle Beam Device
Analyzer
Device for Detecting Foreign Matter and Method for Detecting Foreign Matter
Electron Microscope
Ion Milling Device and Ion Milling Processing Method
Global Alignment Using Multiple Alignment Pattern Candidates
Automatic Analyzer
Automatic Analyzer
Automatic Analyzer
Application:
13/988,812 →
Publication:
US 2013/0243652
Defect Inspection Device and Defect Inspection Method
Charged Particle Beam Apparatus
Electrode for Electrochemical Measurement, Electrolysis Cell for Electrochemical Measurement, Analyzer for Electrochemical Measurement, and Methods for Producing Same
Surface Shape Measuring Apparatus
Charged Particle Beam Device and Method for Correcting Detected Signal Thereof
Inspection Apparatus
Charged Particle Beam Applied Apparatus, and Irradiation Method
Method and Apparatus for Observing Defects
Defect Inspection Method and Device Therefor
Scanning Electron Microscope
Charged Particle Beam Apparatus with Cleaning Photo-Irradiation Apparatus
Standard Member for Calibration and Method of Manufacturing the Same and Scanning Electron Microscope Using the Same
Defect Inspection Method and Defect Inspection Device
Device for Nucleic Acid Analysis and Nucleic Acid Analyzer
Apparatus for Inspecting Defect with Time/Spatial Division Optical System
Image Processing Device and Computer Program for Performing Image Processing
Multipole and Charged Particle Radiation Apparatus Using the Same
Plasma Spectrometer
Pattern Dimension Measurement Method and Charged Particle Beam Apparatus
Mass Spectrometer and Ion Source Used Therefor
Electron Microscope Sample Holder and Sample Observation Method
Nucleic Acid Analysis Device and Nucleic Acid Analyzer
Ion Beam Device and Machining Method
Charged Particle Ray Apparatus and Pattern Measurement Method
Device and Method for Detecting Angle of Rotation from Normal Position of Image
Plasma Processing Apparatus and Plasma Processing Method
Charged Particle Beam Device and Image Display Method for Stereoscopic Observation and Stereoscopic Display
Inspection Apparatus
Plasma Processing Apparatus and Analyzing Apparatus
Plasma Processing Method and Plasma Processing Apparatus
Electron Beam Irradiation Apparatus
Charged Particle Microscope Device and Image Capturing Method
Charged Particle Beam Apparatus
Defect Classification Method, and Defect Classification System
Sample Holding Apparatus for Electron Microscope, and Electron Microscope Apparatus
Automatic Analysis Device
Automatic Analysis Device and Automatic Analysis Program
Automatic Analytical Device and Method
Diffraction Grating Manufacturing Method, Spectrophotometer, and Semiconductor Device Manufacturing Method
Application:
14/118,375 →
Publication:
US 2014/0092384
Charged Particle Beam Apparatus and Electrostatic Chuck Apparatus
Semiconductor Device Defect Inspection Method and System Thereof
Charged Particle Beam Device and Sample Production Method
Sample Processing Device, Sample Treatment Method, and Reaction Container Used in These Device and Method
Automatic Analyzer
Mass Spectrometry Device Including Self-Cleaning Unit
Method and Device for Optical Analysis of Biopolymer
Application:
14/123,345 →
Publication:
US 2014/0110259
Electron Microscope and Image Capturing Method Using Electron Beam
Nucleic Acid Amplification Apparatus and Nucleic Acid Analysis Apparatus
Automatic Analyzer
Charged Particle Beam Device Having an Energy Filter
Phase Plate and Electron Microscope
Automatic Analysis System
Cap Opening and Closing Mechanism and Automatic Analyzer Including the Same
Optical Type Inspection Apparatus, Inspection System and the Wafer for Coordinates Management
Electron Microscope
Solid-Phase Extraction Apparatus and Viscosity Measurement Apparatus
Information Processing System Using Nucleotide Sequence-Related Information
Defect Inspecting Method and Defect Inspecting Apparatus
Scanning Electron Microscope and a Method for Imaging a Specimen Using the Same
Chemical Analysis Apparatus and Chemical Analysis Method
Method for Controlling Plasma Processing Apparatus
Plasma Etching Method
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Vacuum Processing Apparatus and Operating Method Thereof
Sample Dispensing Apparatus and Automatic Analyzer Including the Same
Charged Particle Beam Apparatus
Inspection Apparatus
Charged-Particle Microscope
Charged Particle Beam Apparatus
Scanning Electron Microscope and Scanning Transmission Electron Microscope
Defect Inspection Method and Defect Inspection Device
Pattern Measurement Device and Pattern Measurement Method
Method and Apparatus for Nucleic Acid Analysis
Semiconductor Inspection System
Charged Particle Beam Device
Genetic Test System
Charged Particle Beam Device, Method for Adjusting Charged Particle Beam Device, and Method for Inspecting or Observing Sample
Defect Inspecting Apparatus and Defect Inspecting Method
Automatic Analyzer
Automatic Analyzer
Nanopore-Based Analysis Device
Automated Analyzer and Analyzing Method
Defect Inspection Method and Defect Inspection Device
Automatic Analyzer
Ion Beam Device Having Gas Introduction Port Disposed on Structure Maintained at Ground Potential
Charged Particle Beam Apparatus That Performs Image Classification Assistance
Sample Inspection Automation System
Emitter, Gas Field Ion Source, and Ion Beam Device
Electric Field Discharge-Type Electron Source
Automatic Analyzer
Automated Analyzer and Maintenance Method for Same
Region-Of-Interest Determination Apparatus, Observation Tool or Inspection Tool, Region-of-Interest Determination Method, and Observation Method or Inspection Method Using Region-of-Interest Determination Method
Method for Estimating Shape Before Shrink and Cd-Sem Apparatus
Automatic Analyzer and Method for Determining Malfunction Thereof
Charged Particle Beam Device
Optical Microscope Device and Testing Apparatus Comprising Same
Electron Gun and Charged Particle Beam Device Having an Aperture with Flare-Suppressing Coating
Surface Shape Measuring Apparatus
Scanning Electron Microscope
Automatic Analyzer
Charged Particle Beam Device and Measuring Method Using the Same
Plasma Etching Method
Plasma Etching Method
Surface Inspection Apparatus and Method Thereof
Observation Device and Observation Method
Liquid Chromatograph Apparatus and Liquid Chromatograph Analysis Method
Charged Particle Microscope Apparatus and Image Acquisition Method of Charged Particle Microscope Apparatus Utilizing Image Correction Based on Estimated Diffusion of Charged Particles
Plasma Processing Apparatus
Back Scattered Electron Detector
Transmission Electron Microscope, and Method of Observing Specimen
Plasma Processing Apparatus
Automated Analyzer
Processing Apparatus and Method Using a Scanning Electron Microscope
Analysis Method and Semiconductor Etching Apparatus
Automatic Analyzer Using a Sample Container Having an Information Recording Member
Ion Beam Device
Defect Inspection Apparatus and Defect Inspection Method
Gas Field Ionization Ion Source and Ion Beam Device
Plasma Processing Apparatus and Operational Method Thereof
Charged Particle Beam Apparatus Permitting High-Resolution and High-Contrast Observation
Method and Substrate for Nucleic Acid Amplification, and Method and Apparatus for Nucleic Acid Analysis
Method and Apparatus for Reviewing Defect
Automatic Analysis Device
Measuring Method, Data Processing Apparatus and Electron Microscope Using Same
Method for Analyzing Biomolecules and Biomolecule Analyzer
Inspection or Observation Apparatus and Sample Inspection or Observation Method
Sample Processing System
Phase Shift Mask, Method of Forming Asymmetric Pattern, Method of Manufacturing Diffraction Grating, and Method of Manufacturing Semiconductor Device
Scanning Electron Microscope
Automated Analyzer
Automated Analysis System
Specimen Transfer Device and System
Observation Specimen for Use in Electron Microscopy, Electron Microscopy, Electron Microscope, and Device for Producing Observation Specimen
Holder for Transferring Test Tube
Charged Particle Beam Apparatus and Method of Correcting Landing Angle of Charged Particle Beam
Charged-Particle Radiation Apparatus
Defect Inspection Method and Device for Same
Defect Classification Apparatus and Defect Classification Method
Pattern Evaluation Method and Pattern Evaluation Device
Exposure Device and Method for Producing Structure
Inspection Apparatus
Method for Measuring Cells, and Reagent for Cell Measurement
Scanning Ion Microscope and Secondary Particle Control Method
Flow Cell and Liquid Analyzer
Automatic Analyzer
Application:
14/364,227 →
Publication:
US 2014/0377132
Sample Pretreatment System That Supports Multisystem Configuration
Data Processing Device, Semiconductor External View Inspection Device, and Data Volume Increase Alleviation Method
Scanning Electron Beam Device with Focus Adjustment Based on Acceleration Voltage and Dimension Measurement Method Using Same
Nucleic Acid Amplification Method
Automatic Analyzer and Method for Washing Sample-Pipetting Probe
Automatic Analysis Device
Automatic Analyzer and Method for Detecting Measurement Value Abnormalities
Defect Observation Method and Device Therefor
Automatic Analyzer and Reagent Processing Method in Automatic Analyzer
Image Processing Apparatus, Distortion-Corrected Map Creation Apparatus, and Semiconductor Measurement Apparatus
Method for Measuring Overlay and Measuring Apparatus, Scanning Electron Microscope, and Gui
Charged Particle Beam Device and Inclined Observation Image Display Method
Charged Particle Beam Irradiation Apparatus
Sample Holder for Electron Microscope
Mass Spectrometer
Charged Particle Beam Device and Arithmetic Device
Charged Particle Beam Microscope, Sample Holder for Charged Particle Beam Microscope, and Charged Particle Beam Microscopy
Automated Analyzer
Methods for Observing Samples and Preprocessing Thereof
Surface Measurement Device
Charged Particle Device and Wiring Method
Charged Particle Beam Apparatus
Scanning-Electron-Microscope Image Processing Device and Scanning Method
System for Adjusting Automatic Analysis, Method for Adjusting Automatic Analysis
Image-Forming Device, and Dimension Measurement Device
Image Evaluation Apparatus and Pattern Shape Evaluation Apparatus
Defect Inspection Method and Its Device
Charged Particle Beam Apparatus
Automatic Analyzer
Automatic Analyzer
Pattern Sensing Device and Semiconductor Sensing System
Pattern Dimension Measuring Device, Charged Particle Beam Apparatus, and Computer Program
Charged Particle Beam Device
Scanning Electron Microscope
Scanning Electron Microscope
Scanning Electron Microscope
System for Pretreating Sample
Ion Milling Device
Charged Particle Beam Device
Plasma Spectrometer
Ionization Method, Ionization Apparatus, and Mass Analysis System
Charged Particle Beam Apparatus, Specimen Observation System and Operation Program
Charged Particle Beam Apparatus, Specimen Observation System and Operation Program
Gas Field Ionization Ion Source and Ion Beam Apparatus
Switch Circuit, Mass Spectrometer, and Control Method for Switch Circuit
Flow Cell, Analysis Equipment and Analysis Method Using Same
Electronic Microscope, Setting Method of Observation Condition of Electronic Microscope, and Observation Method Using Electronic Microscope
Automatic Analyzer
Application:
14/390,434 →
Publication:
US 2015/0044096
Charged Particle Beam Apparatus
Inspection Device and Image Capture Element
Charged Particle Beam Apparatus
Charged Particle Beam Device
Semiconductor Defect Categorization Device and Program for Semiconductor Defect Categorization Device
Mass Spectrometer and Mass Spectrometry
Charged Particle Beam Apparatus
Defect Inspection Device and Defect Inspection Method
Scanning Electron Microscope
Centrifuge Module, Preprocessing System Having Centrifuge Module, and Control Method for the System
Defect Analysis Assistance Device, Program Executed by Defect Analysis Assistance Device, and Defect Analysis System
Inspection System
Automatic Analysis Apparatus
Automatic Analyzer
Pattern Inspection Device and Pattern Inspection Method
Measurement Method, Image Processing Device, and Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Charged Particle Beam Device
Light Signal Detecting Circuit, Light Amount Detecting Device, and Charged Particle Beam Device
Overlay Error Measuring Device and Computer Program
Automatic Analyzer
Specimen Cryo Holder and Dewar
Charged Particle Beam Device
Filtering Member and Filtering Method
Luminescence Measuring Device
Stage Apparatus and Sample Observation Apparatus
Automatic Analysis Apparatus and Sample Measuring Method
Analysis Device and Analysis Method
Kit for Nucleic Acid Extraction and a Nucleic Acid Extractor
Overlay Error Measuring Device and Computer Program for Causing Computer to Measure Pattern
Automatic Analyzer
Automatic Analyer
Automated Analyzer
Automatic Analysis Device, and Automatic Analysis Method
Mass Spectrometer and Method
Automatic Analyzer
Cartridge for Biochemical Use and Biochemical Processing Device
Pre-Processing/Electrophoresis Integrated Cartridge, Pre-Processing Integrated Capillary Electrophoresis Device, and Pre-Processing Integrated Capillary Electrophoresis Method
Automatic Analyzer and Maintenance Supporting System
Inspection Device
Analysis Device Including Solid-Phase Extraction Material Filling and Discharging Mechanisms
Electron Microscope and Electron Microscope Sample Retaining Device
Matching Process Device, Matching Process Method, and Inspection Device Employing Same
Charged Particle Beam Apparatus
Data Processing Device and Automatic Analysis Device Using Same
Biomolecule Detection Method, Biomolecule Detection Device and Analysis Device
Automatic Analyzer
Immunoanalysis Method and Immunoanalysis Device
Charged Particle Beam Apparatus and Sample Observation Method
Nucleic Acid Analysis Device
Charged Particle Beam Device and Sample Observation Method
Spectrophotometer
Automatic Analyzer
Scanning Electron Microscope
Charged-Particle-Beam Device and Method for Correcting Aberration
Observation Apparatus and Optical Axis Adjustment Method
Charged Particle Beam Device and Sample Observation Method
Defect Inspection Device and Defect Inspection Method
Pattern Measurement Device, Evaluation Method of Polymer Compounds Used in Self-Assembly Lithography, and Computer Program
Sample Conveyor Apparatus and Specimen Testing Automation System
Sample Inspection Automation System and Sample Transfer Method
Electron Microscope and Electron Beam Detector
Defect Observation System and Defect Observation Method
Specimen Storage Apparatus, Specimen Processing System, and Controlling Method Thereof
Charged Particle Beam Device, Position Adjusting Method for Diaphragm, and Diaphragm Position Adjusting Jig
Pattern Inspecting and Measuring Device and Program
Method for Removing Foreign Substances in Charged Particle Beam Device, and Charged Particle Beam Device
Charged-Particle Radiation Apparatus
Charged Particle Beam Device and Sample Preparation Method
Method for Manufacturing Electron Source
Charged Particle Beam Device and Overlay Misalignment Measurement Method
Automatic Analyzer
Application:
14/436,097 →
Publication:
US 2015/0269513
Reagent Container and Automatic Analysis Apparatus
Automatic Analyzer
Automatic Analyzer
Sample Storage Container, Charged Particle Beam Apparatus, and Image Acquiring Method
Charged Particle Beam Apparatus
Pipe Connection Joint
Method and Device for Detecting Defects and Method and Device for Observing Defects
Hybrid Ion Source, Mass Spectrometer, and Ion Mobility Device
Charged Particle Beam Device, Sample Stage Unit, and Sample Observation Method
Electron Beam Equipment
Charged Particle Beam Apparatus
Plasma Processing Apparatus with Lattice-Like Faraday Shields
Plasma Processing Method
Plasma Etching Method
Data Processing Method, Data Processing Apparatus and Processing Apparatus
Dry Etching Method
Plasma Processing Method
Plasma Processing Method
Pattern Critical Dimension Measurement Equipment and Method for Measuring Pattern Critical Dimension
Charged Particle Radiation Apparatus
Stage Apparatus, and Charged Particle Beam Apparatus Using Same
Detector for Liquid Chromatography
Automatic Analyzer
Mass Spectrometer
Analyzer
Plasma Processing Method and Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Orientation Identification Label, Reagent Container Carrier Structure, Analyzer Device and Reader Module
Inspection Apparatus
Defect Inspection Apparatus and Defect Inspection Method
Charged Particle Beam Apparatus
Device for Bacteria Classification and Pretreatment Device for Bacteria Test
Plasma Processing Apparatus and Plasma Processing Method
Inspection or Observation Apparatus and Sample Inspection or Observation Method
Anomaly Detecting Method, and Apparatus for the Same
Charged Particle Beam Device Having an Energy Filter
Transport Line Cover
Apparatus for Pretreating Biological Samples, and Mass Spectrometer Equipped with Same
Application:
14/578,619 →
Publication:
US 2015/0111300
Defect Detection Method and Defect Detection Device and Defect Observation Device Provided with Same
Terminal Communication Apparatus, and Distributed Control System
Method and Apparatus for Plasma Processing
Plasma Processing Apparatus and Plasma Processing Method
Aberration Corrector and Charged Particle Beam Apparatus Using the Same
Plasma Processing Apparatus and Plasma Processing Method
Charged Particle Beam Apparatus and Image Forming Method
Charged Particle Beam Apparatus
Data Analysis Method for Plasma Processing Apparatus, Plasma Processing Method and Plasma Processing Apparatus
Stage Device and Charged Particle Beam Apparatus Using the Stage Device
Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus
Plasma Processing Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus with Gas Feed and Evacuation Conduit
Plasma Processing Apparatus
Defect Inspection Method and Defect Inspection Device
Nucleic Acid Analysis Device, Method for Producing Same, and Nucleic Acid Analyzer
Mass Spectrometer
Automated Analyzer and Automated Analysis Method
Sample Base, Charged Particle Beam Device and Sample Observation Method
Liquid Chromatograph
Glass/Resin Composite Structure and Method for Manufacturing Same
Charged Particle Beam Apparatus and Program
Automatic Analysis Device
Method of Transmitting Control Data for System Conversion Among Liquid Chromatographs
Defect Observation Method and Defect Observation Device
Automated Analyzer
Automatic Analyzer
Defect Observation Method and Defect Observation Device
Genetic Testing Device, Genetic Testing Method and Program
Pattern Shape Evaluation Method, Semiconductor Device Manufacturing Method, and Pattern Shape Evaluation Device
Device for Genotypic Analysis and Method for Genotypic Analysis
Charged Particle Beam Device and Method for Analyzing Defect Therein
Automatic Analyzer
Defect Review Apparatus and Method for Correcting Coordinate Misalignment Using Two Light Sources
Immunological Analyzing Apparatus
Plasma Processing Method and Plasma Processing Apparatus
Charged Particle Beam Application Device
Method of Evaporation Control of a Sample Stored in a Cold Container
Charged Particle Beam Apparatus, Stage Controlling Method, and Stage System
Inspection Apparatus and Adjusting Method
Defect Inspection Method and Defect Inspection Device
Measurement and Inspection Device
Charged-Particle Beam Device For Irradiating a Charged Particle Beam on a Sample
Biomolecule Measuring Device
Charged-Particle Beam Device
Surface Measurement Apparatus
Electrochemical Measurement Device
Charged Particle Beam Apparatus and Trajectory Correction Method in Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Apparatus and Method for Processing Sample, and Charged Particle Radiation Apparatus
Method for Pattern Measurement, Method for Setting Device Parameters of Charged Particle Radiation Device, and Charged Particle Radiation Device
Specimen Processing System
Automatic Analysis Device
Automatic Analysis Device
Composite Charged Particle Beam Detector, Charged Particle Beam Device, and Charged Particle Beam Detector
Biochemical Cartridge, and Biochemical Cartridge and Cartridge Holder Set
Charged Particle Beam Device
Data Analysis Device and Method Therefor
Method and Device for Mass Spectrometry
Automatic Analysis Apparatus
Automated Analyzing Apparatus
Centrifuging System, Sample Preprocessing System, and Control Method
Automatic Analyzer
Sample Observation Device Having a Selectable Acceleration Voltage
Charged Particle Radiation Apparatus
Defect Inspection Device and Defect Inspection Method
Pattern-Measuring Apparatus and Semiconductor-Measuring System
Bioanalysis Device and Biomolecule Analyzer
Plasma Processing Method
Liquid Feeder and Chemical Analyzer Including Same
Defect Inspection Method and Device Using Same
Defect Inspection Method and Defect Inspection Device
Mass Spectrometer with Ion Frequency Selection
Charged Particle Beam Device, Sample Observation Method, Sample Platform, Observation System, and Light Emitting Member
Analyzer and Automatic Analyzer
Curved Grating, Method for Manufacturing the Same, and Optical Device
Automatic Coagulation Analyzing Apparatus and Analyzing Method
Electron Microscope and Sample Observation Method
Analysis System
Charged Particle Beam Device and Filter Member
Automatic Analyzing Device
Automatic Analyzer
Sample Observation Device
Automatic Analysis Device and Automatic Analysis Method
Charged Particle Radiation Device and Specimen Preparation Method Using Said Device
Charged Particle Beam Device
Electron Gun, Charged Particle Gun, and Charged Particle Beam Apparatus Using Electron Gun and Charged Particle Gun
Charged Particle Beam Apparatus for Measuring Surface Potential of a Sample
Method for Reviewing a Defect and Apparatus
Charged Particle Beam Apparatus and Image Generation Method
Method and Apparatus for Inspecting Defects
Plasma Processing Apparatus, Plasma Processing Method and Plasma Processing Analysis Method
Method for Controlling Plasma Processing Apparatus
Plasma Processing Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus
Automatic Analyzer
Charged Particle Beam Device, Method for Adjusting Charged Particle Beam Device, and Method for Inspecting or Observing Sample
Plasma Processing Apparatus
Plasma Processing Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Electrolyte Concentration Measuring Apparatus and Measuring Method Using Same
Superposition Measuring Apparatus, Superposition Measuring Method, and Superposition Measuring System
Wafer Appearance Inspection Apparatus
Nucleic Acid Analyzer and Nucleic Acid Analysis Method Using Same
Automatic Analyzer
Surface Profile Measurement Method and Device Used Therein
Ion Milling Device
Charged-Particle-Beam Device and Specimen Observation Method
Conductive Interface System Between Vacuum Chambers in a Charged Particle Beam Device
Automatic Analyzer
Anion Sensor
Method for Determining Cell State and Autoanalyzer Using Said Method
Method for Adjusting Charged Particle Beam Device and Adjusting Beam Aperture Based on a Selected Emission Condition and Charged Particle Beam Device for Same
Method and Device for Line Pattern Shape Evaluation
Detection Device That Calculates a Center of Gravity of a Container Gap Region
Mass Spectrometric Device and Mass Spectrometric Device Control Method
Nucleic Acid Amplification/Detection Device and Nucleic Acid Inspection Device Using Same
Analysis Device
Pattern Shape Evaluation Device and Method
Scanning Electron Microscope
Automatic Analyzer
Ion Milling Device and Processing Method Using the Ion Milling Device
Charged Particle Beam Device Enabling Facilitated EBSD Detector Analysis of Desired Position and Control Method Thereof
Flow Cell for Nucleic Acid Analysis and Nucleic Acid Analyzer
Mass Spectrometer
Vacuum Processing Apparatus
Automatic Analyzer
Analysis Device and Analysis Method
Hybrid Ion Source and Mass Spectrometric Device
Diaphragm Mounting Member and Charged Particle Beam Device
Automated Analyzer
Anti-Contamination Trap, and Vacuum Application Device
Charged Particle Beam Apparatus and Sample Image Acquiring Method
Electron Microscope
Sample Holder and Charged Particle Device
Nucleic Acid Analysis Device and Diagnosis Method
Componential Analyzer, Drug Efficacy Analyzer, and Analysis Method
Electron Microscope
Nozzle Cleaning Method and Automated Analyzer
Defect Detection Method and Defect Detection Device and Defect Observation Device Provided with Same
Charged Particle Beam Apparatus and Inspection Method Using the Same
Electrode for Electrochemical Measurement, Electrolysis Cell for Electrochemical Measurement, Analyzer for Electrochemical Measurement, and Methods for Producing Same
Automatic Analyzer and Sample-Processing System
Holder for Transferring Test Tube
Automated Analyzer
Charged Particle Beam Device
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Operation Method Thereof
Defect Inspection Method and Device for Same
Defect Inspecting Method and Defect Inspecting Apparatus
Inspection Equipment
Automatic Analyzer
Plasma Processing Method and Plasma Processing Apparatus
Plasma Etching Method
Dry Etching Apparatus and Method
Cartridge for Dispensing a Fluid, Automatic Analyzer and Method of Analyzing a Biological Sample
Charged Particle Beam Device
Ion Milling Device
Far-Ultraviolet Absorbance Detection Device for Liquid Chromatography
Plasma Processing Apparatus and Sample Stage Thereof
Charged Particle Beam Device and Charged Particle Beam Measurement Method
Ion Beam Device and Emitter Tip Adjustment Method
Ion-Selective Electrode
Electron Microscope
Charged Particle Beam Device
Charged Particle Beam Device and Sample Holder for Charged Particle Beam Device
Charged Particle Beam Device and Charged Particle Beam Device Control Method
Charged Particle Beam Device
Automatic Analyzer
Charged Particle Beam Inclination Correction Method and Charged Particle Beam Device
Biomolecule Measuring Device
Sample Transfer Device and Sample Processing System
Specimen Transport Device, Specimen Pretreatment System, Analysis System, and Specimen Testing Automation System
Liquid Mixing Device, and Liquid Chromatography Apparatus
Automatic Analysis Device
DNA Transport Control Device and Method for Producing Same, as Well as DNA Sequencing Device
Specimen Pre-Processing Connection Device and System Provided with Device
Analyte Testing Automation System, Biological Sample Check Module, and Biological Sample Check Method
Automatic Analysis Device and Analysis Method
Charged-Particle-Beam Device
Automatic Analysis Device
Light Measuring Device and Light Measuring Method
Fluid Switching Valve and Liquid Chromatograph Apparatus Using the Same
Scanning Electron Microscope System, Pattern Measurement Method Using Same, and Scanning Electron Microscope
Charged Particle Beam Apparatus, Image Forming Method Using a Charged Particle Beam Apparatus, and Image Processing Apparatus
Defect Inspection Method and Defect Inspection Device
Plasma Processing Apparatus and Data Analysis Apparatus
Plasma Processing Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus, Data Processing Apparatus and Data Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Vacuum Processing Apparatus
Data Analysis Method for Plasma Processing Apparatus, Plasma Processing Method and Plasma Processing Apparatus
Stage Apparatus with Braking System for Lens, Beam, or Vibration Compensation
Method for Stirring a Mixed Liquid in an Automatic Analyzer Including First and Second Stirring Mechanisms
Defect Inspection Device and Defect Inspection Method
Far-Infrared Imaging Device and Far-Infrared Imaging Method
Pattern Measurement Device and Computer Program
Pattern Measurement Device and Computer Program for Evaluating Patterns Based on Centroids of the Patterns
Pattern Measurement Device, and Computer Program for Measuring Pattern
Dispensing Device and Dispensing Method
Cell Culture Device
Flow-Path Control Method, and Cell Culture Device
Charged Particle Beam Device
Automated Analyzer Device
Charged Particle Beam Device, Image Generation Method, Observation System
Inspection Device and Measurement Device
Automatic Analyzer
Liquid Chromatography-Mass Spectrometry Device
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, and Program Recording Medium
Automatic Analyzer
Automatic Analysis Apparatus
Automatic Analytical Apparatus
Electron Scanning Microscope and Image Generation Method
Automatic Analysis Device
Automatic Analyzer
Automatic Analyzer
Method of Improving Quality of Scanning Charged Particle Microscope Image, and Scanning Charged Particle Microscope Apparatus
Terahertz Wave Phase Difference Measurement Device
Pattern-Measuring Device and Computer Program
Sample Holder with Light Emitting and Transferring Elements for a Charged Particle Beam Apparatus
Microspectroscopy Device
Stage Device and Charged Particle Beam Device Using the Same
Scanning Electron Microscope
Charged Particle Beam Device and Spherical Aberration Correction Method
Defect Reviewing Method and Device
Defect Inspection Device and Defect Inspection Method
Fluorescence Spectrometer
Plasma Processing Apparatus and Plasma Processing Method
Defect Inspection Method and Device Using Same
Charged Particle Beam Apparatus
Reagent Vessel Holder for an Analytical Instrument, Reagent Supply System for an Analytical Instrument and an Analytical Instrument
Defect Image Classification Apparatus
Charged Particle Beam Apparatus
Plasma Processing Device
Plasma Processing Apparatus
Pattern Measurement Method and Measurement Apparatus
Evaluation Condition Setting Method of Semiconductor Device, and Evaluation Condition Setting Apparatus
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus, Specimen Observation System and Operation Program
Automated Analyzer
Dry-Etching Method
Method for Releasing Sample and Plasma Processing Apparatus Using Same
Charged Particle Radiation Apparatus
Manufacturing Method of Magnetoresistive Element and Vacuum Processing Apparatus
Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Orientation Identification Label, Reagent Container Carrier Structure, Analyzer Device and Reader Module
Measurement Device, Calibration Method of Measurement Device, and Calibration Member
Plasma Processing Apparatus
Automatic Analyzer
Plasma Processing Apparatus and Operating Method of Plasma Processing Apparatus
Inspection Apparatus and Method Using Pattern Matching
Charged Particle Beam Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Defect Inspection Method and Its Device
Electron Beam Device
Scanning Electron Microscope and Method for Controlling Same
Microscope Observation Container and Observation Device
Measurement System and Measurement Method
Ion Milling Apparatus and Sample Processing Method
Charged Particle Beam Device and Detection Method Using Said Device
Sample Processing Method and Charged Particle Beam Device
Sample Dispensing Device and Nozzle Tip for Sample Dispensing Device
Charged-Particle-Beam Device
Automatic Analyzer
Chromatograph Mass Spectrometer and Control Method Therefor
Electron Microscope Device and Imaging Method Using Same
Automatic Analysis Device
Automatic Analyzer
Defect Observation Method and Device and Defect Detection Device
Charged Particle Beam Device and Installation Method
Mass Spectrometer
Automatic Analysis Device
Automatic Analyzer
Automatic Analysis Apparatus
Liquid Stirring Method
Pattern Measurement Condition Setting Device and Pattern Measuring Device
Pattern Measurement Method and Pattern Measurement Device
Electron Microscope and Sample Observation Method
Mass Spectrometry Device
Charged Particle Beam Apparatus and Aberration Corrector
Multichannel Analysis Device
Automatic Analyzing Apparatus
Automatic Analyzing Apparatus
Automatic Analysis Device
Automatic Analysis Apparatus
Cell Concentration Adjustment Device, and Automatic Subculture System Using Same
Particle Suction Capture Mechanism and Unstopping Device Equipped with Particle Suction Capture Mechanism
Automatic Analyzing Apparatus
Defect Quantification Method, Defect Quantification Device, and Defect Evaluation Value Display Device
Pattern Height Measurement Device and Charged Particle Beam Device
Overlay Measurement Method, Device, and Display Device
Plasma Processing Apparatus
Charged Particle Beam Apparatus and Image Forming Method of Charged Particle Beam Apparatus
Plasma Etching Method
Defect Inspection Device and Defect Inspection Method
Plasma Processing Equipment and Plasma Generation Equipment
Defect Inspection Method, Low Light Detecting Method, and Low Light Detector
Charged Particle Beam Device
Plasma Processing Apparatus and Plasma Processing Method
Plasma Processing Apparatus and Method for Releasing Sample
Plasma Processing Method
Plasma Processing Apparatus and Plasma Processing Method
Charged Particle Beam Apparatus and Vibration Damper for Charged Particle Beam Apparatus
Plasma Processing Method
Scanning Electron Microscope
Automatic Analyzer
Operation Method of Plasma Processing Apparatus
Charged Particle Beam Apparatus
Ion Milling Device and Ion Milling Method
Ion Milling Device, Ion Source and Ion Milling Method
Ion Beam Apparatus and Ion Beam Irradiation Method
Scanning Electron Microscope
Charged Particle Beam Device, Electron Microscope and Sample Observation Method
Ion Beam Device
Automatic Analysis Device
Cytometric Mechanism, Cell Culture Device Comprising Same, and Cytometric Method
Fixed Position Controller and Method
Charged Particle Beam Device and Information-Processing Device
Sterile Connector and Cell Culture Device Provided Therewith
Application:
15/521,348 →
Publication:
US 2019/0153377
Ion Beam Device
Charged Particle Beam Apparatus
Charged Particle Beam Device
Sample for Coordinates Calibration and Method for Fabricating the Same
Spot Array Substrate, Method for Producing Same, and Nucleic Acid Polymer Analysis Method and Device
X-Ray Inspection Method and Device
Defect Inspection Device, Display Device, and Defect Classification Device
Biomolecule Measurement System and Biomolecule Measurement Method
Nucleic Acid Analysis Device
Defect Observation Device and Defect Observation Method
Height Measurement Device and Charged Particle Beam Device
Charged Particle Beam Device
Composite Charged Particle Beam Apparatus and Control Method Thereof
Mass Spectrometer
Sampling Nozzle, Automatic Analyzer Using the Same, and Method of Manufacturing Sampling Nozzle
Analysis Method and Analysis Device
Application:
15/537,541 →
Publication:
US 2017/0343540
Multicolor Fluorescence Analysis Device
Charged Particle Beam Device
Optical Analyzing Device
Mass Spectrometry Device
Liquid Surface Inspection Device, Automated Analysis Device, and Processing Device
Sample Observation Method and Sample Observation Device
Charged Particle Beam Device, and Method of Manufacturing Component for Charged Particle Beam Device
Pattern Measurement Apparatus and Defect Inspection Apparatus
Charged Particle Beam Device
Examination Device
Mask Position Adjustment Method of Ion Milling, Electron Microscope Capable of Adjusting Mask Position, Mask Adjustment Device Mounted on Sample Stage and Sample Mask Component of Ion Milling Device
Automated Analysis Device, and Lid Opening/Closing Mechanism
Composite Charged Particle Beam Device
Multicolor Detection Device
Ion Guide and Mass Spectrometer Using Same
Automatic Analysis Device
Automated Analyzer and Liquid Reservoir
Terahertz Wave Generating Device and Spectroscopic Device Using Same
Automatic Analyser
Automatic Analyser
Automatic Analyzer
Automatic Analyzer
Automated Analysis Device
Automatic Analysis Device and Automatic Analysis Method
Electron Microscope
Automatic Analyzer
Charged Particle Beam Apparatus, Alignment Method of Charged Particle Beam Apparatus, Alignment Program, and Storage Medium
Plasma Processing Method and Plasma Processing Device
Cytologic Diagnosis Support Apparatus, Cytologic Diagnosis Support Method, Remote Diagnosis Support System, Service Providing System, and Image Processing Method
Charged Particle Beam Device and Image Forming Method Using Same
Plasma Processing Method and Plasma Processing Apparatus
Charged Particle Beam Device and Sample Observation Method in Charged Particle Beam Device
Light Amount Detection Device, Immune Analyzing Apparatus and Charged Particle Beam Apparatus That Each Use the Light Amount Detection Device
The Plasma Processing Apparatus and Plasma Processing Method
Specimen Conveyance Device and Specimen Processing System
Charged Particle Beam Device and Evacuation Method for Same
Component Analysis Device, Drug Component Analysis Device, Component Analysis Method, and Drug Component Analysis Method
Specimen Container Inclination Correction Mechanism, and Method for Controlling Same
Automatic Analyser and Method
Sample Fragmentation Device Using Heating and Pressure Regulation Between Sample Injector and Separation Column
Inspection Device
Charged Particle Beam Device Provided with Ion Pump
Charged Particle Beam Apparatus and Sample Elevating Apparatus
Ion Milling Apparatus and Ion Milling Method
Automated Analyzer
Blood Collecting Device
Method for Adjusting Height of Sample and Observation System
Ultrasonic Cleaner and Automatic Analyzer Using the Same
Charged Particle Beam Device
Automatic Analyzer
Charged Particle Beam Device
Sample Test Automation System
Plasma Processing Apparatus and Plasma Processing Method
Composite Charged Particle Beam Detector, Charged Particle Beam Device, and Charged Particle Beam Detector
Defect Detection Method and Defect Detection Device and Defect Observation Device Provided with Same
Etching Method and Etching Apparatus
Plasma Etching Method
Vacuum Processing Apparatus
Plasma Processing Apparatus and Plasma Processing Method
Sample Injection Device
Sample Dispensing Apparatus and Automatic Analyzer Including the Same
Automatic Analyzing Device
Detection Device for Luminescence Analysis and Automated Analyzer
Rail Check Device and Rail Check System
Automated Analyzer
Aberration Correction Method, Aberration Correction System, and Charged Particle Beam Apparatus
Automatic Analysis Device and Specimen Inspection Automation System
Dispensing Device
Automatic Analyzer
Charged Particle Beam Device
Automatic Analyzer
Automatic Analysis Device, Automatic Analysis System, and Automatic Analysis Method
Automatic Analyzer
Ion Concentration Measurement Device
Application:
15/751,544 →
Publication:
US 2018/0238829
Automatic Analyzer and Reagent Bottle Loading Method
Observation Support Unit for Charged Particle Microscope and Sample Observation Method Using Same
Automated Analyzer
Automatic Analyzer
Specimen Inspection Automation System
Charged Particle Beam Device and Pattern Measurement Device
Ion Milling System
Flow Passage Module and Cell Culture Apparatus Using Same
Application:
15/761,114 →
Publication:
US 2018/0258377
Ion Analysis Device
Transmission Scanning Microscopy Including Electron Energy Loss Spectroscopy and Observation Method Thereof
Charged Particle Beam Apparatus, Observation Method Using Charged Particle Beam Apparatus, and Program
Cell Analysis Device, Apparatus, and Cell Analysis Method Using Same
Charged Particle Beam Device and Image Processing Method in Charged Particle Beam Device
Charged Particle Beam Device and Phase Plate
Measuring Reagent and Analysis Device for Analyzing Biopolymer
Biomolecule Measurement Apparatus
Charged Particle Beam Device and Optical-Axis Adjusting Method Thereof
Defect Inspecting Method and Defect Inspecting Apparatus
Automatic Analyzer
Sample Handling System
Automated Analyzer
Electron Scanning Microscope and Image Generation Method
Automatic Analyzer
Charged Particle Beam Apparatus
Automatic Analyzer and Method for Washing Sample-Pipetting Probe
Sample Observation Device and Sample Observation Method
Plasma Processing Method
Patent:
10,184,173 →
Application:
15/899,588 →
Stage Apparatus and Charged Particle Beam Apparatus
Plasma Processing Apparatus and Plasma Processing Method
A Semiconductor Manufacturing Apparatus for Manufacturing a Semiconductor Device Having a High-K Insulating Film, and A Method for Manufacturing the Semiconductor Device
Automatic Analyzing Device
Etching Method and Etching Apparatus
Plasma Etching Method
Pattern-Measuring Apparatus and Semiconductor-Measuring System
Glass/Resin Composite Structure and Method for Manufacturing Same
Glass/Resin Composite Structure and Method for Manufacturing Same
Scanning Electron Microscope and Sample Observation Method
Automatic Analyzer and Sample-Processing System
High Voltage Power Supply Device and Charged Particle Beam Device
Mass Spectrometry Device and Ion Detection Method Therefor
Automatic Analysis Device
Specimen-Container Loading/Storing Unit
Application:
16/075,215 →
Publication:
US 2019/0041412
Automatic Analyzer
Automated Analysis Device
Automatic Analyzer
Automatic Analyzer and Cleaning Method
Automated Analyzer
Sample Transport System
Application:
16/083,942 →
Publication:
US 2020/0191809
Automatic Analyzer
Flaw Inspection Device and Flaw Inspection Method
Automatic Analyzer
Specimen Inspection Automation System
Charged Particle Beam Device and Method for Adjusting Charged Particle Beam Device
Electron Microscope and Imaging Method
Charged Particle Beam Device and Sample Holder
Device and Method for Fabricating Three-Dimensional Structure from Cells
Application:
16/097,286 →
Publication:
US 2019/0136176
Vibration-Suppressing Mechanism to Be Attached to Charged Particle Beam Device, and Charged Particle Beam Device
Charged Particle Beam Device
Stage Device and Charged Particle Beam Device
Examination Device
System and Method for Measuring Patterns
Automatic Analyzer
Multicolor Detection Device
Plasma Processing Apparatus and Plasma Processing Method
Ion Guide and Mass Spectrometer Using Same
Container and Temperature Control System
Application:
16/239,639 →
Publication:
US 2020/0216253
Temperature Control Apparatus, Temperature Control Method, Non-Transitory Computer Readable Medium and Temperature Control System
Application:
16/239,648 →
Publication:
US 2020/0216254
Temperature Control Apparatus, Temperature Control Method, Non-Transitory Computer Readable Medium and Temperature Control System
Application:
16/239,729 →
Publication:
US 2020/0218318
Stage Device and Charged Particle Beam Device
Charged Particle Beam Apparatus Comprising a Controller to Set Control Parameters Based on Movement of the Sample Stage
Charged Particle Beam Apparatus
Automatic Analysis Device and Automatic Analysis Method
Pattern Evaluation Device
Inspection Apparatus and Inspection Method
Automated Sample Inspection System and Method for Controlling Same
Bubble Eliminating Structure, Bubble Eliminating Method, and Agitating Method Using the Same
Stage Device and Charged Particle Beam Device
Charged Particle Beam Device
Method for Generating Text String Dictionary, Method for Searching Text String Dictionary, and System for Processing Text String Dictionary
Automatic Analyzer
Automatic Analyzer
Automatic Analyzer
Automatic Analyzer
Automatic Analyzer
Automatic Analyzer, Automatic Analysis System, and Display Method of Reagent List
Automatic Analyzer, Remote Maintenance System, and Maintenance Method
Drive Screw Device, Liquid Delivery Mechanism, and Liquid Delivery Method
Electron Beam Apparatus
Holder and Charged Particle Beam Apparatus
Height Detection Apparatus and Charged Particle Beam Apparatus
Vacuum Processing Apparatus
Biomolecule Measurement System and Biomolecule Measurement Method
Nanopore-Forming Method, Nanopore-Forming Device and Biomolecule Measurement Device
Culture Instrument
Biological Sample Analyzer
Ultrasonic Cleaner and Automatic Analyzer Using the Same
Ultrasonic Cleaner and Automatic Analyzer Using the Same
Nozzle Cleaner and Automatic Analyzer Using the Same
Automatic Analyzer
Charged Particle Detector and Charged Particle Beam Apparatus
Automated Analyzer
Automated Analyzer
Automatic Analysis Device
Automatic Analysis Device
Automatic Analysis Device
Automatic Analyzer
Analysis System and Analysis Method
Automatic Analysis Device
Automatic Analysis Device
Automated Analyzer
Automated Analysis System
Image Processing System and Computer Program for Performing Image Processing
Sample Handling System
Plasma Processing Apparatus and Plasma Processing Method
Automatic Analyzer
Charged Particle Beam Device with Vibration Attenuating Friction Bodies
Application:
16/608,926 →
Publication:
US 2020/0357601
Automatic Analysis Device
Automatic Analysis Device
Automatic Analysis Device with Syringe Pump
Automatic Analysis Device
Method for Releasing Sample and Plasma Processing Apparatus Using Same
Automatic Analyzer
Plasma Processing Apparatus and Data Analysis Apparatus
Stage Apparatus and Charged Particle Beam Apparatus
Cover Ring for a Plasma Processing Apparatus
Patent:
557,425 →
Application:
29/236,933 →
Electrode Cover for a Plasma Processing Apparatus
Patent:
557,226 →
Application:
29/236,981 →
Grounded Electrode for a Plasma Processing Apparatus
Patent:
556,704 →
Application:
29/236,982 →
Semiconductor Manufacturing Apparatus
Patent:
546,354 →
Application:
29/237,008 →
Sample Holder
Patent:
579,120 →
Application:
29/304,364 →
Sample Holder
Patent:
578,653 →
Application:
29/304,367 →
Sample Holder
Patent:
578,655 →
Application:
29/304,373 →
Adapter for a Sample Rack
Patent:
595,420 →
Application:
29/309,858 →
Sample rack
Patent:
674,507 →
Application:
29/309,872 →
Portion of a Sample Rack
Patent:
603,524 →
Application:
29/309,873 →
Sample Rack
Patent:
675,338 →
Application:
29/309,874 →
Adapter for a Sample Rack
Patent:
595,862 →
Application:
29/309,875 →
Adapter for a Sample Rack
Patent:
595,421 →
Application:
29/309,876 →
Adapter for a Sample Rack
Patent:
595,863 →
Application:
29/309,877 →
Graphical User Interface for a Computer Display
Patent:
602,496 →
Application:
29/309,975 →
Graphical user interface for a computer display
Patent:
614,191 →
Application:
29/309,978 →
Graphical User Interface for a Computer Display
Patent:
614,192 →
Application:
29/309,979 →
Capillary Array for Dna Sequencer
Patent:
679,832 →
Application:
29/337,690 →
Capillary Dna Sequencer
Patent:
621,523 →
Application:
29/337,698 →
Electron Microscope
Patent:
625,749 →
Application:
29/339,397 →
Electron Microscope
Patent:
623,211 →
Application:
29/343,661 →
Graphical User Interface for a Computer Display
Patent:
630,648 →
Application:
29/352,967 →
Graphical User Interface for a Computer Display
Patent:
630,645 →
Application:
29/352,972 →
Graphical User Interface for a Computer Display
Patent:
630,649 →
Application:
29/352,979 →
Computer Display with Graphical User Interface
Patent:
633,514 →
Application:
29/352,984 →
Sample Buffer Unit for Clinical Analyzer
Patent:
631,975 →
Application:
29/354,617 →
Ise Analytical Unit for Clinical Analyzer
Patent:
637,730 →
Application:
29/354,618 →
Sampler Unit for Clinical Analyzer
Patent:
631,976 →
Application:
29/354,619 →
Portion of an Electron Microscope
Patent:
635,167 →
Application:
29/356,716 →
Portion of an Electron Microscope
Patent:
635,168 →
Application:
29/356,722 →
Electron Microscope
Patent:
632,323 →
Application:
29/356,731 →
Electron Microscope
Patent:
626,579 →
Application:
29/356,738 →
Electron Microscope
Patent:
633,537 →
Application:
29/356,742 →
Electron Microscope
Patent:
633,538 →
Application:
29/356,748 →
Semiconductor Testing Machine
Patent:
637,098 →
Application:
29/360,394 →
Spectrophotometer
Patent:
640,581 →
Application:
29/363,404 →
Graphical User Interface for a Computer Display
Patent:
652,839 →
Application:
29/363,421 →
Holder for Test Tube
Patent:
637,311 →
Application:
29/365,382 →
Portion of a Holder for Test Tube
Patent:
637,312 →
Application:
29/365,386 →
Electron Microscope
Patent:
638,046 →
Application:
29/366,697 →
Controller for an Electron Microscope
Patent:
638,045 →
Application:
29/366,699 →
Controller for an Electron Microscope
Patent:
637,638 →
Application:
29/366,703 →
Electron Microscope
Patent:
644,258 →
Application:
29/366,707 →
Clinical Analyzer
Patent:
663,040 →
Application:
29/383,151 →
Portion of a Clinical Analyzer
Patent:
653,765 →
Application:
29/383,157 →
Reagent Autoloader with a Sample Buffer Unit for a Clinical Analyzer
Patent:
654,183 →
Application:
29/383,163 →
Reagent Autoloader with a Sample Buffer Unit for a Clinical Analyzer
Patent:
654,184 →
Application:
29/383,169 →
Centrifuge Module for Clinical Laboratory Automation System
Patent:
655,822 →
Application:
29/384,358 →
Portion of Module for Clinical Laboratory Automation System
Patent:
646,397 →
Application:
29/384,361 →
Aliquot Module for Clinical Laboratory Automation System
Patent:
655,823 →
Application:
29/384,364 →
Input Buffer Module for Clinical Laboratory Automation System
Patent:
653,766 →
Application:
29/384,365 →
Sample Tube Destopper Module for Clinical Laboratory Automation System
Patent:
653,351 →
Application:
29/384,370 →
Sample Tube Holder Stocker for Clinical Laboratory Automation System
Patent:
658,776 →
Application:
29/384,376 →
Identification Labeler Module for Clinical Laboratory Automation System
Patent:
655,422 →
Application:
29/384,380 →
Grounded Electrode for a Plasma Processing Apparatus
Patent:
703,160 →
Application:
29/397,274 →
Sample Tube Holder Stocker for Clinical Laboratory Automation System
Patent:
685,493 →
Application:
29/411,274 →
Sample Holder for an Electron Microscope
Patent:
679,411 →
Application:
29/411,275 →
Sample Holder for an Electron Microscope
Patent:
684,274 →
Application:
29/411,276 →
Clinical Analyzer
Patent:
681,226 →
Application:
29/427,876 →
Clinical Analyzer
Patent:
681,227 →
Application:
29/427,877 →
Input and Output Buffer Module for Clinical Analyzer
Patent:
681,228 →
Application:
29/427,878 →
Cover for Reagent Disk for Clinical Analyzer
Patent:
685,494 →
Application:
29/427,879 →
Input and Output Buffer Module for Clinical Analyzer
Patent:
685,495 →
Application:
29/427,880 →
Column Oven for Liquid Chromatograph Analyzer
Patent:
692,155 →
Application:
29/429,035 →
Auto Sampler for Liquid Chromatograph Analyzer
Patent:
692,156 →
Application:
29/429,038 →
Auto Sampler for Liquid Chromatograph Analyzer
Patent:
692,157 →
Application:
29/429,040 →
Pump for Liquid Chromatograph Analyzer
Patent:
692,158 →
Application:
29/429,043 →
Liquid Chromatograph Analyzer
Patent:
693,938 →
Application:
29/429,045 →
Solid-Phase Extraction Cartridge
Patent:
687,563 →
Application:
29/431,885 →
Sample Transfer Module for Clinical Laboratory Automation System
Patent:
700,975 →
Application:
29/431,886 →
Electron Microscope
Patent:
687,475 →
Application:
29/431,888 →
Organizer for Liquid Chromatograph Analyzer
Patent:
712,065 →
Application:
29/445,415 →
Pump for Liquid Chromatograph Analyzer
Patent:
693,712 →
Application:
29/445,416 →
Detector for Liquid Chromatograph Analyzer
Patent:
699,609 →
Application:
29/445,417 →
Liquid Chromatograph Analyzer
Patent:
693,713 →
Application:
29/445,418 →
Auto Sampler for Liquid Chromatograph Analyzer
Patent:
693,714 →
Application:
29/445,419 →
Detector for Liquid Chromatograph Analyzer
Patent:
699,610 →
Application:
29/445,423 →
Column Oven for Liquid Chromatograph Analyzer
Patent:
712,066 →
Application:
29/445,424 →
Portion of a Cover for an Electron Microscope
Patent:
711,950 →
Application:
29/456,329 →
Portion of a Biochemical Analyzer
Patent:
722,177 →
Application:
29/456,756 →
Portion of a Biochemical Analyzer
Patent:
722,178 →
Application:
29/456,758 →
Light Shielding Cover of a Biochemical Analyzer
Patent:
715,425 →
Application:
29/456,759 →
Light Shielding Cover of a Biochemical Analyzer
Patent:
715,426 →
Application:
29/456,761 →
Portion of a Biochemical Analyzer
Patent:
721,822 →
Application:
29/456,764 →
Portion of a Biochemical Analyzer
Patent:
728,124 →
Application:
29/456,765 →
Portion of a Biochemical Analyzer
Patent:
715,455 →
Application:
29/456,768 →
Portion of a Biochemical Analyzer
Patent:
722,179 →
Application:
29/456,771 →
Portion of a Biochemical Analyzer
Patent:
727,528 →
Application:
29/456,773 →
Biochemical Analyzer
Patent:
715,456 →
Application:
29/456,775 →
Add-On Sample Buffer Module
Patent:
717,461 →
Application:
29/467,208 →
Biochemical Analyzer
Patent:
721,820 →
Application:
29/475,891 →
Cover of a Biochemical Analyzer
Patent:
720,079 →
Application:
29/475,892 →
Biochemical Analyzer
Patent:
729,399 →
Application:
29/475,895 →
Display Screen with Graphical User Interface
Patent:
780,767 →
Application:
29/477,544 →
Display Screen with Graphical User Interface
Patent:
774,074 →
Application:
29/477,550 →
Display Screen with Graphical User Interface
Patent:
778,920 →
Application:
29/477,560 →
Display Screen with Graphical User Interface
Patent:
774,045 →
Application:
29/477,566 →
Display Screen with Graphical User Interface
Patent:
774,075 →
Application:
29/477,568 →
Display Screen with Graphical User Interface
Patent:
774,516 →
Application:
29/477,569 →
Display Screen with Graphical User Interface
Patent:
774,046 →
Application:
29/477,571 →
Display Screen with Graphical User Interface
Patent:
774,047 →
Application:
29/477,573 →
Display Screen with Graphical User Interface
Patent:
774,048 →
Application:
29/477,574 →
Base of a Thin Membrane Holder for an Electron Microscope
Patent:
730,962 →
Application:
29/484,245 →
Thin Membrane Holder for an Electron Microscope
Patent:
731,570 →
Application:
29/484,248 →
Sample Holder for an Electron Microscope
Patent:
794,816 →
Application:
29/488,729 →
Cover Stopper for a Sample Transporting Apparatus
Patent:
734,485 →
Application:
29/493,658 →
Cover Stopper for a Sample Transporting Apparatus
Patent:
735,349 →
Application:
29/493,659 →
Leg for a Sample Transporting Apparatus
Patent:
733,904 →
Application:
29/493,660 →
Cover for a Sample Transporting Apparatus
Patent:
734,486 →
Application:
29/493,661 →
Cover for a Sample Transporting Apparatus
Patent:
734,864 →
Application:
29/493,662 →
Sample Transporting Apparatus
Patent:
733,905 →
Application:
29/493,663 →
Sample Transporting Apparatus
Patent:
733,906 →
Application:
29/493,664 →
Sample Transporting Apparatus
Patent:
733,907 →
Application:
29/493,665 →
Sample Transporting Apparatus
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750,271 →
Application:
29/493,666 →
Thin Membrane Holder for an Electron Microscope
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Application:
29/511,491 →
Clinical Analyzer
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740,435 →
Application:
29/516,029 →
Clinical Analyzer
Patent:
740,956 →
Application:
29/516,037 →
Cover for Clinical Analyzer
Patent:
740,957 →
Application:
29/516,041 →
Clinical Analyzer
Patent:
751,725 →
Application:
29/516,095 →
Upper Chamber for a Plasma Processing Apparatus
Patent:
804,436 →
Application:
29/544,068 →
Cover Ring for a Plasma Processing Apparatus
Patent:
802,790 →
Application:
29/544,069 →
Electrode Cover for a Plasma Processing Apparatus
Patent:
770,992 →
Application:
29/544,070 →
Lower Chamber for a Plasma Processing Apparatus
Patent:
802,545 →
Application:
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Upper Chamber for a Plasma Processing Apparatus
Patent:
812,578 →
Application:
29/572,169 →
Gene Analysis Apparatus
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Application:
29/586,483 →
Column
Patent:
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Application:
29/594,886 →
Column Pipe
Patent:
827,150 →
Application:
29/594,888 →
Column End Cap
Patent:
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Application:
29/594,889 →
LED Holder
Patent:
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Application:
29/598,018 →
Lamp
Patent:
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Application:
29/598,021 →
Substrate Processing Unit
Patent:
831,085 →
Application:
29/606,718 →
Substrate Processing Unit
Patent:
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Application:
29/606,724 →
Substrate Processing Unit
Patent:
847,237 →
Application:
29/606,730 →
Electrode Cover for a Plasma Processing Apparatus
Patent:
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Application:
29/610,995 →
Electrode Cover for a Plasma Processing Apparatus
Patent:
840,364 →
Application:
29/610,996 →
Ring for a Plasma Processing Apparatus
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Application:
29/610,998 →
Cover Ring for a Plasma Processing Apparatus
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840,365 →
Application:
29/610,999 →
Clinical Analyzer
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Application:
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Light Shielding Cover of a Clinical Analyzer
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838,381 →
Application:
29/615,613 →
Clinical Analyzer
Patent:
838,382 →
Application:
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Clinical Analyzer
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846,138 →
Application:
29/627,767 →
Clinical Analyzer with Graphical User Interface
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Application:
29/627,774 →
Clinical Analyzer
Patent:
846,139 →
Application:
29/627,777 →
Clinical Analyzer
Patent:
846,140 →
Application:
29/627,778 →
Clinical Analyzer
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838,383 →
Application:
29/627,780 →
Electrode Plate for a Plasma Processing Apparatus
Patent:
868,993 →
Application:
29/635,287 →
Gas Ring for a Plasma Processing Apparatus
Patent:
871,608 →
Application:
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Electrode Cover for a Plasma Processing Apparatus
Patent:
870,314 →
Application:
29/635,292 →
Electrode Plate Peripheral Ring for a Plasma Processing Apparatus
Patent:
871,609 →
Application:
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Infrared Lamp Heater Transmission Window for Semiconductor Manufacturing Apparatus
Patent:
864,885 →
Application:
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Gas Diffusion Plate for a Plasma Processing Apparatus
Patent:
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Application:
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