IP Library Granted Patent US 7,807,966
Granted Patent B2
US 7,807,966 · App. 12/250,763 · Granted Oct 5, 2010

Scanning electron microscope

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,807,966
App. No.
12/250,763
Granted
Oct 5, 2010
Kind
B2
Abstract

A scanning electron microscope for digitally processing an image signal to secure the largest focal depth and the best resolution in accordance with the magnification for observation is disclosed. The angle of aperture of an optical system having a plurality of convergence lenses is changed by changing the convergence lenses and the hole diameter of a diaphragm. The angle α of aperture of the electron beam is changed in accordance with the visual field range corresponding to a single pixel, i.e. what is called the pixel size.

Claims (5)

1. A scanning electron microscope for displaying on the screen an image obtained by analog-to-digital conversion of signals generated by irradiating an electron beam to a sample, comprising;

a display device having a setting area where a magnification and a number of pixels of an image are input and a display area displaying a resolution, a focal depth, and an angle of aperture; and

an arithmetic device comprising a computer readable medium containing instructions that, when executed, cause the arithmetic device to perform functions for calculating a resolution, a focal depth, and an angle of aperture from the magnification and the number of pixels of the image, input from the setting area, and displaying calculated results on the display device;

wherein the computer readable medium further contains instructions such that, when the instructions are executed and when a second magnification is lower than a first magnification input from the setting area, if an image is to be obtained at the first magnification, the arithmetic device causes the display device to display the angle of aperture, calculated from the number of pixels of an image at the first magnification, or if an image is to be obtained at the second magnification, the arithmetic device causes the display device to display a smaller value of the angle of aperture than the angle of aperture calculated from the number of pixels of the image at the first magnification.

2. The scanning electron microscope according to claim 1 , wherein if an image is to be obtained at a larger magnification than the first magnification, the arithmetic device causes the display device to display an angle of aperture, calculated from the number of pixels of an image at the first magnification.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →