Charged particle beam apparatus
View Patent ↗The present invention provides a charged particle beam apparatus which is provided with a tilting deflector which is disposed between a charged particle source and an objective lens and tilts a charged particle beam, wherein a first optical element includes an electromagnetic quadrupole which generates dispersion to suppress the dispersion which is generated by deflection by the tilting deflector, and a second optical element is composed of a deflector for deflecting the charged particle beam which enters the first optical element or an electromagnetic quadrupole which causes the charged particle beam to generate a dispersion different from the dispersion generated by the first optical element.
1. A charged particle beam apparatus comprising an objective lens which focuses a charged particle beam emitted from a charged particle source to impinge a specimen, and a tilting deflector which is disposed between the charged particle source and the objective lens and tilts the charged particle beam,
wherein a first optical element comprising an electromagnetic quadrupole which causes a dispersion to suppress a dispersion which is generated by a deflection by the tilting deflector is provided, and a second optical element comprising a deflector which deflects the charged particle beam which enters the first optical element or an electromagnetic quadrupole which causes the charged particle beam to generate a dispersion different from the dispersion generated by the first optical element.
2. The charged particle beam apparatus according to claim 1 , wherein the first optical element is a first Wien filter.
3. The charged particle beam apparatus according to claim 2 , wherein the first Wien filter is a Wien filter which generates an electromagnetic dipole field and a quadrupole field at a same place.
4. The charged particle beam apparatus according to claim 2 , wherein a control unit is provided to control an electromagnetic-field strength which is applied to the first Wien filter when the charged particle beam is tilted by the tilting deflector, a deflector which is disposed above the Wien filter, and an excitation strength with respect to the tilting deflector.
5. The charged particle beam apparatus according to claim 1 , wherein the second optical element is a two-stage deflector and deflects the charged particle beam so as to separate the charged particle beam from an ideal optical axis and to enter it into the first optical element.
6. The charged particle beam apparatus according to claim 1 , wherein the second optical element is a second Wien filter.
7. The charged particle beam apparatus according to claim 6 , wherein the first optical element is a first Wien filter, and a two-stage deflector is disposed above the first Wien filter and the second Wien filter.