Pattern displacement measuring method and pattern measuring device
View Patent ↗An evaluation method and apparatus is provided for evaluating a displacement between patterns of a pattern image by using design data representative of a plurality of patterns superimposed ideally. A first distance is measured for an upper layer pattern between a line segment of the design data and an edge of the charged particle radiation image, a second distance is measured for a lower layer pattern between a line segment of the design data and an edge of the charged particle radiation image; and an superimposition displacement is detected between the upper layer pattern and lower layer pattern in accordance with the first distance and second distance.
1. A pattern displacement measuring method of measuring a distance between a line segment of design data and an edge of a charged particle radiation image, wherein:
a first distance is measured for an upper layer pattern between a line segment of the design data and an edge of the charged particle radiation image in accordance with a pattern matching between the line segment of the design data of the upper layer pattern and the charged particle radiation image;
a second distance is measured for a lower layer pattern between a line segment of the design data and an edge of the charged particle radiation image in accordance with a pattern matching between the line segment of the design data of the lower layer pattern and the charged particle radiation image; and
a superimposition displacement is detected between said upper layer pattern and said lower layer pattern in accordance with said first distance and said second distance.
2. A pattern measuring apparatus having a control unit for measuring a size of a pattern formed on a sample, by scanning an electron beam emitted from an electron source and using an electron emitted from said sample, wherein:
said control unit measures a first distance of an upper layer pattern between a line segment of the design data and an edge of the charged particle radiation image in accordance with a pattern matching between the line segment of the design data of the upper layer pattern and the charged particle radiation image;
measures a second distance of a lower layer pattern between a line segment of the design data and an edge of the charged particle radiation image in accordance with a pattern matching between the line segment of the design data of the lower layer pattern and the charged particle radiation image; and
detects a superimposition displacement between said upper layer pattern and said lower layer pattern in accordance with said first distance and said second distance.
3. The pattern measuring apparatus according to claim 2 , wherein said control unit divides the edge of the charged particle radiation image into said upper layer pattern and said lower layer pattern, and measures a distance from the design data of said upper layer pattern and said lower layer pattern.
4. The pattern measuring apparatus according to claim 2 , wherein said control unit forms a template removing a line segment of said lower layer pattern in an area where said upper layer pattern said lower layer pattern of said design data are superimposed.