IP Library › Assignment 021048/0579
Patent Assignment
Reel/Frame 021048/0579

Assignment of Assignor's Interest

Recorded: 2008-05-22 Pages: 2
Assignors
SUTANI, TAKUMICHI
Executed: 2007-08-23
MATSUOKA, RYOICHI
Executed: 2007-08-07
MOROKUMA, HIDETOSHI
Executed: 2007-08-01
SUGIYAMA, AKIYUKI
Executed: 2007-08-08
SHINDO, HIROYUKI
Executed: 2007-08-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Displacement Measuring Method and Pattern Measuring Device
Patent: 7,679,055 →
Application: 11/892,675 →
Publication: US 2008/0224035
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →