IP Library Granted Patent US 10,074,511
Granted Patent B2
US 10,074,511 · App. 15/163,725 · Granted Sep 11, 2018

Defect image classification apparatus

Inventors: Takehiro Hirai (Tokyo, JP); Yohei Minekawa (Tokyo, JP); Yutaka Tandai (Tokyo, JP)
Assignee: Hitachi High-Technologies Corporation
H01J37/222H01J37/28H01J37/285H01J2237/221H01J2237/24592
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Quick Facts
Patent No.
US 10,074,511
App. No.
15/163,725
Granted
Sep 11, 2018
Kind
B2
Abstract

A defect image classification apparatus includes a control unit that selects images obtained from at least some detectors among a plurality of detectors, associated with kinds of defects to be a classification result of an automatic defect classification processing unit, as images displayed initially on a display unit. The control unit associates the kinds of the defects and the images displayed initially on the display unit, on the basis of a switching operation log when a user classifies images of defects determined previously as the same kinds as the kinds of the defects determined by the automatic defect classification processing unit.

Claims (25)

1. A defect image classification apparatus comprising:

an image acquisition unit which acquires images corresponding to a plurality of detectors, on the basis of signals obtained by detecting secondary particles obtained by emitting charged particle beams to a sample by the plurality of detectors;

an automatic defect classification processing unit which automatically classifies kinds of defects included in the images, on the basis of the images;

a display unit which displays the automatically classified kinds of the defects and images used for the automatic classification;

a manual defect classification processing unit which classifies the kinds of the defects included in the images, according to an instruction input by a user, and modifies an automatic classification result;

a control unit which selects images obtained from at least some detectors among the plurality of detectors, associated with the kinds of the defects to be the classification result of the automatic defect classification processing unit, as images displayed initially on the display unit when the instruction is input by the user; and

an image switching instruction input unit which receives an input of the user showing switching the images displayed on the display unit into images obtained by other detectors at the same time as acquisition of the images, wherein

the control unit calculates an appearance frequency of image kinds at a time of determining a defect kind, on the basis of a switching operation log of the user for the image switching instruction input unit when images of defects determined previously as the same kinds as the kinds of the defects determined by the automatic defect classification processing unit are classified in accordance with an instruction from the user; and

the control unit associates the kinds of the defects and the images displayed initially on the display unit, based on the appearance frequency.

2. The defect image classification apparatus according to claim 1 , wherein:

the images to be displayed initially are images displayed first when the kinds of the defects are selected to start processing of the manual defect classification processing unit.

3. The defect image classification apparatus according to claim 1 , wherein:

the control unit combines the images obtained from some detectors among the plurality of detectors and selects a combined image as the images to be displayed initially.

4. The defect image classification apparatus according to claim 1 , wherein:

the control unit displays the images obtained from some detectors among the plurality of detectors as the image to be displayed initially in parallel, on the display unit.

5. The defect image classification apparatus according to claim 1 , wherein:

the switching operation log includes at least information of kinds of final images when the kinds of the defects are determined in processing of the manual defect classification processing unit.

6. The defect image classification apparatus according to claim 5 , wherein:

the switching operation log includes a plurality of image switching histories until the kinds of the defects are determined in the processing of the manual defect classification processing unit.

7. The defect image classification apparatus according to claim 1 , wherein:

the control unit associates the kinds of the defects and the images displayed initially on the display unit, according to the magnitude of an effect on the automatic classification result.

8. The defect image classification apparatus according to claim 1 , wherein:

the display unit displays a list of images obtained from some detectors among the plurality of detectors, for each of the kinds of the defects to be the automatic classification result.

9. The defect image classification apparatus according to claim 1 , wherein:

the display unit displays a list of a plurality of defect kinds of images when processing of the manual defect classification processing unit starts.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2016
From: HIRAI, TAKEHIRO; MINEKAWA, YOHEI; TANDAI, YUTAKA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 038711/0225 →
Priority Claims (1)
JP 2015-114689 · Jun 5, 2015 · national
Continuity (1)
Related Publication 20160358746A1 · Dec 8, 2016