Appearance inspection apparatus
View Patent ↗An appearance inspection apparatus analyzes a difference in detection characteristics of detection signals obtained by detectors to flexibly meet various inspection purposes without changing a circuit or software. The apparatus includes a signal synthesizing section that synthesizes detection signals from the detectors in accordance with a set condition. An input operating section sets a synthesizing condition of the detection signal by the signal synthesizing section, and an information display section displays a synthesizing map structured based on a synthesized signal which is synthesized by the signal synthesizing section in accordance with a condition set by the input operating section.
1. An appearance inspection apparatus comprising:
a sample stage for supporting a sample,
an illumination light source for irradiating the sample on the sample stage with illumination light,
a plurality of detectors which are disposed at different positions from each other with respect to an illumination light spot of the illumination light source, and which detect scattered light generated from a surface of the sample when illumination light is emitted from the illumination light source,
a condition setting section including a plurality of operators,
a display section for displaying the condition setting section, and
a signal synthesizing section which produces a synthesized signal by synthesizing detection signals from the plurality of detectors in accordance with a synthesizing condition including the operators.
2. The appearance inspection apparatus according to claim 1 , wherein the display section displays a synthesizing map of a synthesized signal obtained based on the synthesizing condition including the operators.
3. The appearance inspection apparatus, comprising:
a sample stage for supporting a sample,
an illumination light source for irradiating the sample on the sample stage with illumination light,
a plurality of detectors which are disposed at different positions from each other with respect to an illumination light spot of the illumination light source, and which detect scattered light generated from a surface of the sample when illumination light is emitted from the illumination light source,
a condition setting section including a plurality of operators,
a display section for displaying the condition setting section, and
a signal synthesizing section which produces a synthesized signal by synthesizing detection signals from the plurality of detectors in accordance with a synthesizing condition including the operators,
wherein the display section displays a synthesizing map of a synthesized signal obtained based on the synthesizing condition including the operators, and
wherein the plurality of individual sample images are displayed on the same screen as that of the synthesized sample image.
4. The appearance inspection apparatus according to claim 2 , wherein a change in the synthesizing condition including the operators is reflected on the synthesizing map.
5. The appearance inspection apparatus according to claim 1 , wherein the display portion displays a combination of the operators.