IP Library Granted Patent US 11,143,665
Granted Patent B2
US 11,143,665 · App. 16/331,594 · Granted Oct 12, 2021

Automatic analyzer

Inventors: Akihiro Yasui (Tokyo, JP); Gorou Yoshida (Tokyo, JP); Yoshiki Muramatsu (Tokyo, JP); Isao Yamazaki (Tokyo, JP)
Assignee: HITACHI HIGH-TECH CORPORATION
G01N35/025G01N35/00722G01N35/1081G01N2035/009G01N2035/00702G01N2035/0432G01N2035/0443G01N2035/0444
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Quick Facts
Patent No.
US 11,143,665
App. No.
16/331,594
Granted
Oct 12, 2021
Kind
B2
Abstract

An automatic analyzer ( 100 ) includes: a storage unit ( 21 b ) that stores various parameters of the automatic analyzer ( 100 ) in association with each of elevations used in the automatic analyzers ( 100 ), the parameters being optimized for each of the elevations; an input unit ( 21 d ) that acquires information of an elevation at which the automatic analyzer ( 100 ) is provided; and a controller ( 21 a ) that reads the parameters stored in the storage unit ( 21 b ) and sets the read parameters to the automatic analyzer ( 100 ) based on the elevation acquired by the input unit ( 21 d ). As a result, various parameters can be easily adjusted according to a usage environment of the device.

Claims (20)

1. An automatic analyzer comprising:

a reagent disk on which a plurality of reagent containers each containing a reagent used for analyzing a sample are loaded;

a reaction disk on which a plurality of reaction containers where the sample and the reagent react with each other are arranged;

a sample dispensing mechanism that dispenses the sample by absorbing the sample by dipping a sample dispensing nozzle into the sample contained in a sample container and discharging the absorbed sample into the reaction container of the reaction disk by using a syringe pump, the sample dispensing mechanism including a pressure sensor provided in a flow path between the syringe pump and the sample dispensing nozzle;

a reagent dispensing mechanism that dispenses the reagent by absorbing the reagent by dipping a reagent dispensing nozzle into the reagent contained in the reagent container and discharging the absorbed reagent into the reaction container of the reaction disk;

a reaction measuring unit that measures a reaction from a reaction solution of the sample and the reagent in the reaction container;

a storage device configured to store a plurality of parameters of the automatic analyzer in association with each of a plurality of stored elevations in which the automatic analyzer is used, the plurality of parameters being optimized for each of the plurality of stored elevations, respectively; and

a processor configured to:

acquire information of an input elevation at which the automatic analyzer is provided;

read a parameter of the plurality of parameters stored in the storage device for absorption abnormalities determination and set the read parameter to the automatic analyzer based on the input elevation; and

determine the absorption abnormalities of the sample dispensing nozzle using pressures detected by the pressure sensor and the parameter set to the automatic analyzer,

wherein at least one of the plurality of parameters of the automatic analyzer stored in association with each of the plurality of stored elevations includes information of a replacement cycle of a component included in the automatic analyzer.

2. The automatic analyzer according to claim 1 , wherein

the processor is further configured to obtain the information of the input elevation by receiving an input of the input elevation from an operator or by calculating the input elevation based on automatic acquisition of a position.

3. The automatic analyzer according to claim 1 , wherein

the storage device is configured to store a parameter table in which one value is associated with one of the plurality of stored elevations for each of the plurality of parameters.

4. The automatic analyzer according to claim 1 , wherein

when the input elevation at which the automatic analyzer is provided is out of specification, an alarm indicating that a setting of at least one of the plurality of parameters is not reflected is issued.

5. The automatic analyzer according to claim 1 , wherein

the absorption abnormality determination is a clogging determination associated with foreign object absorption.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 8, 2019
From: YASUI, AKIHIRO; YOSHIDA, GOROU; MURAMATSU, YOSHIKI; YAMAZAKI, ISAO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048540/0173 →