IP Library Granted Patent US 8,941,060
Granted Patent B2
US 8,941,060 · App. 14/001,711 · Granted Jan 27, 2015

Mass spectrometer and ion source used therefor

Inventors: Hiroyuki Satake (Tokyo, JP); Hideki Hasegawa (Tokyo, JP); Masuyuki Sugiyama (Tokyo, JP); Yuichiro Hashimoto (Tokyo, JP)
Assignee: Hitachi High-Technologies Corporation
H01J49/10H01J49/0431H01J49/165
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Quick Facts
Patent No.
US 8,941,060
App. No.
14/001,711
Granted
Jan 27, 2015
Kind
B2
Abstract

The quantitative accuracy of analysis is improved without reducing the dynamic range for measurement of concentrations by performing stable ionization through electrospray or the like which repeats sampling and ionization using a movable probe electrode. A voltage is applied from a high-voltage power source 4 to a sample transport electrode 7 having a plurality of probe electrodes 1 and a driving section 3 drives the sample transport electrode 7 to rotate. The plurality of probe electrodes 1, to which a sample solution 5 is adhered, are sequentially transported to an inlet 21 of a mass spectrometer 20, thus electrospray ionization is continuously performed.

Claims (42)

1. A mass spectrometer comprising: an ion source; a mass spectrometer section having a counter electrode provided with an inlet through which an ionized sample is introduced; and a control section that controls the ion source, wherein

the ion source includes:

a sample retaining section that retains a sample;

a sample transport electrode that has a plurality of probe electrodes;

a power source that applies a voltage between the sample transport electrode and the counter electrode; and

a driving section that drives the sample transport electrode such that the plurality of probe electrodes sequentially pass by the sample retaining section and the inlet.

2. The mass spectrometer according to claim 1 , wherein

the sample transport electrode includes a disk electrode that rotates about a rotation axis, and has a structure in which the plurality of probe electrodes are provided in a peripheral portion of the disk electrode such that each tip end faces toward a direction perpendicular to the plane of the disk electrode, and the axial direction of the rotation axis faces toward a direction substantially parallel to the stream of ions introduced from the tip end of the probe electrode into the inlet.

3. The mass spectrometer according to claim 1 , wherein

the sample transport electrode includes a disk electrode that rotates about a rotation axis, and has a structure in which the plurality of probe electrodes are radially provided in the in-plane direction of the disk electrode, and the axial direction of the rotation axis faces toward a direction substantially perpendicular to the direction of the stream of ions introduced from the tip end of the probe electrode into the inlet.

4. The mass spectrometer according to claim 1 , wherein

the sample transport electrode includes a plate electrode that rotates about a rotation axis, the plate electrode includes a plurality of convex portions having a sharp tip end in an outer peripheral portion, the convex portion constitutes the probe electrode, and the axial direction of the rotation axis faces toward a direction substantially perpendicular to the direction of the stream of ions introduced from the tip end of the probe electrode into the inlet.

5. The mass spectrometer according to claim 1 , wherein

the sample transport electrode includes a disk electrode that rotates about a rotation axis, the disk electrode has a shape such that an outer peripheral portion is thin like a blade along the circumferential direction, and the axial direction of the rotation axis faces toward a direction substantially perpendicular to the direction of the stream of ions introduced from the tip end of the probe electrode into the inlet.

6. The mass spectrometer according to claim 1 , wherein

the sample transport electrode includes a rod electrode, and has a structure in which the plurality of probe electrodes are provided in the rod electrode, and the driving section reciprocates the sample transport electrode.

7. The mass spectrometer according to claim 1 , wherein

the driving section intermittently drives the sample transport electrode such that each of the plurality of probe electrodes stops in front of the inlet for a predetermined time.

8. The mass spectrometer according to claim 1 , wherein

the mass spectrometer further comprises a washing section that washes the probe electrodes, and after passing by the inlet, the probe electrodes pass through the washing section and are washed, and then, move to the sample retaining section.

9. The mass spectrometer according to claim 1 , wherein

the control section monitors an ion intensity detected by the mass spectrometer section, and controls the driving section based on the monitoring results.

10. The mass spectrometer according to claim 9 , wherein

the control section controls the rotation speed when the sample transport electrode is driven to rotate by the driving section according to the monitoring results.

11. An ion source used for a mass spectrometer, comprising:

a sample retaining section that retains a sample;

a sample transport electrode that has a plurality of probe electrodes;

a power source that applies a voltage between the sample transport electrode and a counter electrode of a mass spectrometer section; and

a driving section that drives the sample transport electrode, wherein

the driving section drives the sample transport electrode such that the plurality of probe electrodes sequentially pass by the sample retaining section and the inlet provided in the counter electrode.

12. The ion source according to claim 11 , wherein

the sample transport electrode includes a disk electrode that rotates about a rotation axis, and has a structure in which the plurality of probe electrodes are provided in a peripheral portion of the disk electrode such that each tip end faces toward a direction perpendicular to the plane of the disk electrode, and the axial direction of the rotation axis faces toward a direction substantially parallel to the stream of ions introduced from the tip end of the probe electrode into the inlet.

13. The ion source according to claim 11 , wherein

the sample transport electrode includes a disk electrode that rotates about a rotation axis, and has a structure in which the plurality of probe electrodes are radially provided in the disk electrode, and the axial direction of the rotation axis faces toward a direction substantially perpendicular to the direction of the stream of ions introduced from the tip end of the probe electrode into the inlet.

14. The ion source according to claim 11 , wherein

the sample transport electrode includes a plate electrode that rotates about a rotation axis, the plate electrode includes a plurality of convex portions having a sharp tip end in an outer peripheral portion, the convex portion constitutes the probe electrode, and the axial direction of the rotation axis faces toward a direction substantially perpendicular to the direction of the stream of ions introduced from the tip end of the probe electrode into the inlet.

15. The ion source according to claim 11 , wherein

the sample transport electrode includes a disk electrode that rotates about a rotation axis, the disk electrode has a shape such that an outer peripheral portion is thin like a blade along the circumferential direction, and the axial direction of the rotation axis faces toward a direction substantially perpendicular to the direction of the stream of ions introduced from the tip end of the probe electrode into the inlet.

16. The ion source according to claim 11 , wherein

the sample transport electrode includes a rod electrode, and has a structure in which the plurality of probe electrodes are provided in the rod electrode, and the driving section reciprocates the sample transport electrode.

17. The ion source according to claim 11 , wherein

the driving section intermittently drives the sample transport electrode such that each of the plurality of probe electrodes stops in front of the inlet for a predetermined time.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2013
From: SATAKE, HIROYUKI; HASEGAWA, HIDEKI; SUGIYAMA, MASUYUKI; HASHIMOTO, YUICHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 031089/0142 →
Priority Claims (1)
JP 2011-061487 · Mar 18, 2011 · national
Continuity (1)
Related Publication 20130334416A1 · Dec 19, 2013