Scanning electron microscope

1. A scanning electron microscope which acquires an image by detecting an electron emitted from a sample irradiated with a primary electron beam using a detector, comprising:

an electron source;

an objective lens for converging the primary electron beam emitted from the electron source on the sample;

a control electrode disposed between the objective lens and the sample;

a secondary electron conversion electrode disposed between the objective lens and the detector to generate a secondary electron by impingement of the reflected electron;

a withdrawing electrode that withdraws the secondary electron upward;

an energy filter; and

a control calculation unit which selects a combination of voltages applied to the secondary electron conversion electrode, the withdrawing electrode, and the energy filter.

2. The scanning electron microscope according to claim 1 , wherein the control calculation unit automatically selects a predetermined voltage value based on information about a detection angular range of the reflected electron emitted from the sample.

3. The scanning electron microscope according to claim 2 , wherein the information is selected from multiple predetermined detection angular ranges.

4. The scanning electron microscope according to claim 1 , wherein the control calculation unit automatically selects a control parameter of corresponding image pickup condition based on the information selected from the multiple predetermined detection angular ranges of the reflected electron emitted from the sample.

5. The scanning electron microscope according to claim 4 , wherein the calculation control unit automatically selects the detection angular range suitable for observation based on the information about the sample to be observed.

6. The scanning electron microscope according to claim 1 , wherein an upper magnetic pole of the objective lens serves as the secondary electron conversion electrode.

7. The scanning electron microscope according to claim 1 , wherein the control calculation unit automatically acquires two images derived at two different voltages applied to the energy filter based on the information about the detection angular range of the reflected electron emitted from the sample, and generates a difference image between those images.

8. The scanning electron microscope according to claim 7 , wherein upon acquisition of one of the two images, the voltage applied to the energy filter is set to be lower than the voltage applied to the secondary electron conversion electrode.

9. The scanning electron microscope according to claim 1 , wherein the control calculation unit automatically acquires images under a condition of combining multiple voltages based on the information about detection angular range of the reflected electron emitted from the sample, and generates a difference image between the images.

10. The scanning electron microscope according to claim 1 , wherein the angular range of the detectable reflected electron is widened by increasing a potential difference between the secondary electron conversion electrode and the withdrawing electrode.

11. The scanning electron microscope according to claim 1 , wherein the reflected electron at a high angle from the sample is obtained by decreasing incident energy of the primary electron beam to the sample.

12. The scanning electron microscope according to claim 1 , wherein:

the sample is a magnetic head; and

the voltage of the control electrode is set to a negative side compared with the sample.

13. The scanning electron microscope according to claim 1 , wherein a potential of the secondary electron conversion electrode is set to be negative.

14. The scanning electron microscope according to claim 1 , wherein a potential of the withdrawing electrode is set to a relatively positive side compared with the potential of the secondary electron conversion electrode.

15. The scanning electron microscope according to claim 1 , wherein application of the voltage higher than a half of an acceleration voltage of the electron source to the energy filter is allowed.

16. The scanning electron microscope according to claim 1 , wherein the voltage applied to the energy filter can be selected based on the information about an inner shape of the sample.

17. The scanning electron microscope according to claim 1 , wherein the control calculation unit acquires two images derived at different voltages applied to the energy filter to generate a difference image between the two images based on the information about the inner shape of the sample.

18. A scanning electron microscope comprising:

an electron source;

an objective lens for converging a primary electron beam emitted from the electron source onto a sample;

a control electrode disposed between the objective lens and the sample for discriminating between a secondary electron and a reflected electron which are emitted from the sample irradiated with the primary electron beam;

an upper magnetic pole serving as a secondary electron conversion electrode, which constitutes a part of the objective lens and generates the secondary electron by an impact of the reflected electron;

a withdrawing electrode for withdrawing the secondary electron generated from the upper magnetic pole serving as the secondary electron conversion electrode;

an energy filter disposed above the withdrawing electrode for discriminating between the secondary electron generated from the upper magnetic pole serving as the secondary electron conversion electrode and the reflected electron emitted from the sample; and

a control calculation unit for controlling voltages applied to the upper magnetic pole serving as the secondary electron conversion electrode, the withdrawing electrode, and the energy filter.