IP Library Granted Patent US 8,313,695
Granted Patent B2
US 8,313,695 · App. 13/094,129 · Granted Nov 20, 2012

Automatic analyzer

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Quick Facts
Patent No.
US 8,313,695
App. No.
13/094,129
Granted
Nov 20, 2012
Kind
B2
Abstract

An automatic analyzer for performing analysis of a precision control sample in response to an external factor to alleviate the burden on the operator and perform precision control at appropriate timing, thereby allowing automatic maintenance of the measurement precision. Analysis of a precision control sample is performed by creating an analysis request for the internally held precision control sample and then transferring the precision control sample in response to an external factor occurring, when a calibrator is inputted in the analyzer, the number of remaining reagents under analysis satisfies a predetermined condition (becomes zero or falls below a specified value), the date changes, a specified time runs out, the operator is changed, the number of analyzed samples exceeds a specified value, a specified time period has elapsed, a new reagent is registered, and a measurement failure is detected.

Claims (12)

1. An automatic analyzer comprising:

an analysis unit for analyzing a sample;

a rack transfer system for transferring a sample rack containing a sample vessel which holds the sample to the analysis unit;

a rack input slot for inputting a sample rack to the rack transfer system; and

a sample rack buffer unit for internally holding a precision control sample in the analyzer, the precision control sample being provided in the sample rack; and

control means configured to automatically create, if a measurement result using a precision control sample in relation to a requested item of a sample being analyzed is abnormal, a request for another predetermined measurement of the requested item using a different internally held control sample and to then transfer the different control sample and perform another measurement.

2. The automatic analyzer according to claim 1 , further comprising:

a cooling mechanism for cooling a precision control sample held in the buffer unit.

3. The automatic analyzer according to claim 2 , further comprising:

a temperature increasing mechanism for temporarily increasing the temperature of a precision control sample in the buffer unit so that the quality of the precision control sample does not deteriorate by condensation produced by being taken out to a part of the analyzer which is not cooled from the cooling division.

4. The automatic analyzer according to claim 1 , further comprising:

a second holding mechanism for holding the precision control sample in a second sample providing part in the analysis unit which is different from the rack.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →