Image forming method and charged particle beam apparatus
View Patent ↗An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.
1. An image forming method for scanning a two-dimensional area on a sample with a charged particle beam and forming an image of scanning area, the image forming method comprising the step of:
charging an area which includes a field of view with the charged particle beam, by scanning a first and second lines, by scanning a third line between the first and second scanning lines, and by scanning a plurality of scanning lines between the first and third scanning lines, between the second and third lines so as to repeat scanning new scanning lines located on center lines between already scanned scanning lines, and
forming an image by scanning the field of view included in the charged area with the charged particle beam.
2. An image forming method according to claim 1 , wherein the third scanning line is disposed at equidistance from the first and second scanning lines.
3. An image forming method according to claim 1 , wherein scanning line disposed at the center of the plurality of scanning lines is a fourth scanning line which is scanned next to the third scanning line.
4. An image forming method according to claim 1 , wherein the first and second scanning lines are disposed at the edge of the charged area or a part or area of the charged area.
5. An image forming method according to claim 1 , wherein the charged area on the sample being a single or divided plural areas, and scanning the first, second, and third scanning lines at each area.
6. An image forming method according to claim 5 , wherein the charged area is divided into any one of two parts, four parts, eight parts, sixteen parts, thirty-two parts, and sixty-four parts.
7. A charged particle beam apparatus including a deflector scanning charged particle beam on a sample and a control apparatus for controlling the deflector, wherein:
the control apparatus controls the deflector such that
scanning a first and second lines within a charging area which includes a field of view,
scanning a third line between the first and second scanning lines,
scanning a plurality of scanning lines between the first and third scanning lines, between the second and third lines so as to repeat scanning new lines located on center lines between already scanned scanning lines, and
forming an image by scanning the field of view with the charged particle beam.
8. An image forming method according to claim 7 , wherein the third scanning line is disposed at equidistance from the first and second scanning lines.
9. An image forming method according to claim 7 , wherein scanning line disposed at the center of the plurality of scanning lines is a fourth scanning line which is scanned next to the third scanning line.
10. An image forming method according to claim 7 , wherein the first and second scanning lines are disposed at the edge of the charged area or a part or area of the charged area.
11. An image forming method according to claim 7 , wherein the charged area on the sample being a single or divided plural areas, and scanning the first, second, and third scanning lines at each area.
12. An image forming method according to claim 7 , wherein the charged area is divided into any one of two parts, four parts, eight parts, sixteen parts, thirty-two parts, and sixty-four parts.