IP Library Granted Patent US 9,229,015
Granted Patent B2
US 9,229,015 · App. 13/141,984 · Granted Jan 5, 2016

Accuracy management method

Inventors: Qing Li (Hitachinaka, JP); Tomonori Mimura (Kasama, JP); Shinichi Fukuzono (Hitachinaka, JP); Naomi Ishii (Mito, JP)
Assignee: Hitachi High-Technologies Corporation
G01N35/00693G01N35/00613G01D18/00G01N35/00712G01N35/025Y10T436/10Y10T436/11
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,229,015
App. No.
13/141,984
Granted
Jan 5, 2016
Kind
B2
Abstract

There is provided a comprehensive accuracy management method attained by including the steps of: displaying operation event information in time series in an accuracy management result chart or a calibration result chart on the same screen; accumulating a characteristic daily measurement value fluctuation pattern on the basis of a kind of an operation event; displaying the latest fluctuation pattern of measurement results and the daily measurement value fluctuation pattern in superposition with each other to warn of fluctuations which differ from the daily measurement value fluctuation pattern; and estimating and reporting the cause of the fluctuations.

Claims (46)

1. An accuracy management method comprising:

a measurement step for repetitively measuring a sample at specified intervals;

a measurement result storing step for storing a plurality of measurement results measured in the measurement step;

a fluctuation pattern extraction step for extracting a fluctuation pattern for at least one inspection item based on a change with time in the measurement results stored in the storing step and an operation event including at least one of changing a lot or vial of an accuracy management material, changing a lot or bottle of a reagent, changing a lot or vial of a calibrator, executing calibration, executing maintenance, or generating an alarm; and

a fluctuation pattern storing step for storing the fluctuation patterns extracted in the fluctuation pattern extraction step.

2. The accuracy management method of claim 1 , wherein

the sample is at least either an accuracy management sample or a calibrator.

3. The accuracy management method of claim 2 , wherein

the accuracy management sample has a known measurement value associated with at least one inspection item.

4. The accuracy management method of claim 1 , wherein

the sample includes concentration calibrator solutions,

the measurement results measured in the measurement step include a concentration of at least one inspection item, a K factor, an absorbance of each concentration calibrator solution, and a dominant wavelength absorbance of each concentration calibrator solution,

the K factor is calculated according to the following equation:

K =( S 2− S 1)/( S 2 Abs−S 1 Abs ),

S2 and S1 are concentration values of the calibrators, and

S2Abs, S1Abs are absorbance values obtained by calibration using the calibrators.

5. The accuracy management method of claim 1 , wherein

the fluctuation pattern is determined based on at least one of a shift tendency, a drift tendency and a stable tendency of the measurement results measured in the measurement step.

6. The accuracy management method of claim 1 , further comprising

a display step for displaying fluctuation patterns for each inspection item for an optionally set period based on the operation event.

7. The accuracy management method of claim 6 , further comprising

a display step for displaying information about the operation events concurrently together with measurement results in time series.

8. The accuracy management method of claim 6 , further comprising

a display step for concurrently displaying the operation events together with measurement results of a common inspection item in time series, the common inspection item being an inspection item for which:

calibration is performed by a same calibrator,

dispensing is performed by a same dispensing mechanism,

measurement is performed by a same measurement module, or

measurement is performed by a same analysis cell.

9. The accuracy management method of claim 6 , further comprising

a fluctuation cause extraction step for extracting a cause of a fluctuation tendency found in accuracy management results or calibration results based on the operation event.

10. The accuracy management method of claim 9 , further comprising

an output step for outputting the fluctuation cause extracted in the fluctuation cause extraction step.

11. The accuracy management method of claim 6 , further comprising

an identification step for identifying a timing of an operation event by displaying at least one of a background color, a style of a marker, a color of the marker, or an icon on an accuracy management chart.

12. The accuracy management method of claim 11 , further comprising

a display step for, in response to receiving a selection of the icon by a user, displaying detailed information about an operation event.

13. The accuracy management method of claim 11 , further comprising

a display step for, when an icon representing a date and time of execution of calibration is clicked, displaying the result of the calibration, and current and previous values of the date and time of execution.

14. The accuracy management method of claim 1 , further comprising

a superimposing step for displaying a latest fluctuation pattern of the measurement results and the fluctuation pattern stored in the fluctuation pattern storing step in superposition with each other.

15. The accuracy management method of claim 14 , further comprising

a determination step for determining whether or not a deviation of the fluctuation pattern of the measurement results from the stored fluctuation pattern is a predetermined value or more.

16. The accuracy management method of claim 15 , further comprising

a notification step for, when a result of the determination step determines that the deviation is the predetermined value or more, notifying of the result of the determination.

17. The accuracy management method of claim 1 , wherein

the inspection item includes T-Cho, TG, ALP, CK, HDL-C or LDL-C.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2011
From: LI, QING; MIMURA, TOMONORI; FUKUZONO, SHINICHI; ISHI, NAOMI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 026891/0948 →
Priority Claims (1)
JP 2008-331830 · Dec 26, 2008 · national
Continuity (1)
Related Publication 20120000268A1 · Jan 5, 2012