IP Library Granted Patent US 8,368,013
Granted Patent B2
US 8,368,013 · App. 13/084,930 · Granted Feb 5, 2013

Analyzer, ionization apparatus and analyzing method

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Quick Facts
Patent No.
US 8,368,013
App. No.
13/084,930
Granted
Feb 5, 2013
Kind
B2
Abstract

An analyzer performs dielectric barrier discharge and ionization of a sample by a reaction between the sample and excited molecules or ions generated by the dielectric barrier discharge at a pressure lower than an atmospheric pressure.

Claims (75)

1. An analyzer comprising:

an ionization chamber including a dielectric barrier discharge part, a gas introduction opening to introduce a gas used for dielectric barrier discharge, a sample mounting part to mount a sample ionized by a plasma component generated by the dielectric barrier discharge, an ion take-out opening to take out the ionized sample, and a gas exhaust;

an exhauster to exhaust air in the ionization chamber from the gas exhaust to cause the ionization chamber to have a pressure lower than an atmospheric pressure; and

an analyzer part to analyze the sample taken out from the ion take-out opening.

2. The analyzer according to claim 1 , wherein:

the dielectric barrier discharge part includes a first electrode, a second electrode, a dielectric part provided between the first and second electrodes, and a power supply to apply an alternating voltage to any one of the first and second electrodes and generate discharge between the first and second electrodes; and

the dielectric barrier discharge is performed at a pressure of 100 Pa or more to 10000 Pa or less.

3. The analyzer according to claim 2 ,

wherein the dielectric barrier discharge is performed at a pressure of 500 Pa or more.

4. The analyzer according to claim 2 ,

wherein the dielectric barrier discharge is performed at a pressure of 1000 Pa or more.

5. The analyzer according to claim 1 ,

wherein as the analyzer part, a mass spectrometer or ion mobility spectrometer is used.

6. The analyzer according to claim 2 , wherein:

the dielectric part of the dielectric barrier discharge part is cylindrical; and

one end of a cylinder is the gas introduction opening, and another end is provided within the ionization chamber.

7. The analyzer according to claim 2 ,

wherein the sample mounting part is the dielectric part of the dielectric barrier discharge part.

8. The analyzer according to claim 2 , wherein:

the sample mounting part includes portions that mount a plurality of samples on concentric circles and a rotational mechanism of the sample mounting part; and

at least one of the portions that mount the plurality of samples is disposed between the first and second electrodes.

9. The analyzer according to claim 1 ,

wherein the sample mounting part includes a heating part that heats a sample to be mounted.

10. The analyzer according to claim 9 ,

wherein the heating part raises up a temperature in stages.

11. The analyzer according to claim 1 , wherein:

the sample mounting part is a detachable cassette-shaped, and is attached to the ionization chamber.

12. The analyzer according to claim 1 ,

wherein the ionization chamber includes the ion take-out opening near the gas exhaust.

13. The analyzer according to claim 1 ,

wherein the gas introduction opening, and the ion take-out opening and the gas exhaust are provided sandwiching the sample mounting part therebetween.

14. The analyzer according to claim 1 ,

wherein the sample is held by a solid phase extractant.

15. The analyzer according to claim 1 ,

wherein the sample is held by a heating wire.

16. An ionization apparatus comprising:

an ionization chamber including a dielectric barrier discharge part, a gas introduction opening to introduce a gas used for dielectric barrier discharge, a sample mounting part to mount a sample ionized by a plasma component generated by the dielectric barrier discharge, an ion take-out opening to take out the ionized sample, and a gas exhaust; and

an exhauster to exhaust air in the ionization chamber from the gas exhaust to cause the ionization chamber to have a pressure lower than an atmospheric pressure.

17. The ionization apparatus according to claim 16 , wherein:

the dielectric barrier discharge part includes a first electrode, a second electrode, a dielectric part provided between the first and second electrodes, and a power supply to apply an alternating voltage to any one of the first and second electrodes and generate discharge between the first and second electrodes; and

the dielectric barrier discharge is performed at a pressure of 100 Pa or more to 10000 Pa or less.

18. An ionization analyzing method comprising the steps of:

introducing a sample into a vessel including a solid phase extractant;

extracting the sample into the solid phase extractant;

mounting the solid phase extractant having extracted thereinto the sample on an ionization chamber including a dielectric barrier discharge part and an ion take-out opening;

exhausting air in the ionization chamber, applying an alternating voltage to an electrode of the dielectric barrier discharge part, and ionizing the sample by the dielectric barrier discharge; and

analyzing an ion taken out from the ion take-out opening.

19. The ionization analyzing method according to claim 18 ,

wherein air in the ionization chamber is exhausted to a pressure of 100 Pa or more to 10000 Pa or less.

20. The ionization analyzing method according to claim 18 , wherein:

the solid phase extractant is included in a lid of the vessel; and

when the lid of the vessel is inserted into the ionization chamber, and the ionization chamber is sealed, the solid phase extractant is mounted.

21. The ionization analyzing method according to claim 18 , wherein:

the solid phase extractant is fitted to an internal wall of the vessel; and

when an opening of the vessel is inserted into the dielectric barrier discharge part and the ion take-out opening, the vessel functions as the ionization chamber.

22. The ionization analyzing method according to claim 18 , wherein:

the vessel has a shape of a syringe; and

when being repeatedly sucked and ejected, the sample is extracted into the solid phase extractant.

23. The ionization analyzing method according to claim 18 , wherein:

a valve is provided between the opening of the vessel and the ion take-out opening; and

when the valve is opened, air in the vessel is exhausted.

24. A measuring apparatus comprising:

a sample mounting part;

a dielectric barrier discharge part to ionize a sample to be mounted;

an opening to introduce a gas used for dielectric barrier discharge;

a measuring part to measure a sample ionized by the dielectric barrier discharge;

an exhaust part to exhaust air so as to perform the dielectric barrier discharge at a pressure lower than an atmospheric pressure;

an input part to input an operation for measurement;

a controller to control the measurement based on an input to the input part; and

a display part to output a measurement state by the measuring part.

25. The measuring apparatus according to claim 24 , wherein:

the sample mounting part includes an inside cover; and

when the inside cover is opened or closed, operations of the dielectric barrier discharge part and the exhaust part are controlled.

26. The measuring apparatus according to claim 24 ,

wherein the sample mounting part inserts a member including a solid phase extractant into which a sample is solid phase extracted and mounts the sample.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2011
From: ISHIMARU, MASAKO; HASHIMOTO, YUICHIRO; HASEGAWA, HIDEKI; YAMADA, MASUYOSHI; SUGIYAMA, MASUYUKI; MOROKUMA, HIDETOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 026387/0561 →