IP Library Granted Patent US 9,080,972
Granted Patent B2
US 9,080,972 · App. 13/979,668 · Granted Jul 14, 2015

Automatic analyzer

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Quick Facts
Patent No.
US 9,080,972
App. No.
13/979,668
Granted
Jul 14, 2015
Kind
B2
Abstract

The scattered light from the measurement target substance passes through a light receiving window, and is received by a detector for +θ scattered light and a detector for −θ scattered light which are arranged symmetrically to each other across an optical axis at an equal angle or an equal interval in a vertical direction. A light source is fixed by a light-source holder (that is a base member on which the light source is arranged), and the detectors are arranged on and fixed to a detector holder (that is a base member on which the detectors are arranged). In this manner, drift of the light quantity data caused by the thermal deformation of the optical system can be corrected by comparing values of the light quantity data of the detectors.

Claims (19)

1. An automatic analyzer comprising:

a reaction disk that retains a plurality of reaction containers disposed circumferentially around the reaction disk and that repeatedly rotates and stops;

a light source disposed on a first base member that irradiates a reaction container with light, the reaction container being arranged at a photometric position and housing a mixture solution of a reagent and a sample retained in reaction container on the reaction disk;

a first detector disposed on a second base member that detects transmitted light from the mixture solution;

one or more pairs of second detectors, that detect scattered light from the mixture solution, disposed on the second base member in a plane perpendicular to a direction of movement of the reaction disk, and the second detectors of each of the one or more pairs of second detectors are disposed symmetrically with respect to the first detector in the plane perpendicular to a direction of movement of the reaction disk and are each positioned at an angle having the same absolute value relative to the optical axis of irradiation of the light from the light source; and

a controller programmed to compensate for thermal deformation of the first detector and the one or more pairs of second detectors by using one of an averaged value of light quantity data and a sum thereof from the first detector and the one or more pairs of second detectors to calculate a concentration of a measurement target substance in the mixture solution,

wherein the first base member and the second base member are disposed on a third base member.

2. The automatic analyzer according to claim 1 ,

wherein, if a ratio of light quantity data or a difference between light quantity data obtained from the one or more pairs of second detectors is out of a previously-set range, the light quantity data is not used for the calculation of the concentration of the measurement target substance.

3. The automatic analyzer according to claim 2 ,

wherein, if an averaged value of light quantity data or a sum thereof from the one or more pairs of second detectors is out of a previously-set range, the light quantity data is not used for the calculation of the concentration of the measurement target substance.

4. The automatic analyzer according to claim 2 ,

wherein a reaction container that houses a reference substance for the calculation of the concentration of the measurement target substance is arranged at the photometric position, and a drift amount of the light quantity data of the reference substance from each of the detectors at previously-set time is calculated prior to the calculation of the concentration of the measurement target substance.

5. The automatic analyzer according to claim 4 ,

wherein, if the drift amount is out of a previously-set range, a process does not proceed to the calculation of the concentration of the measurement target substance.

6. The automatic analyzer according to claim 5 ,

wherein the drift amount is a ratio of light quantity data or difference thereof from the respective detectors.

7. The automatic analyzer according to claim 5 ,

wherein the drift amount is an averaged value of light quantity data or a sum thereof from the respective detectors.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2013
From: MAKINO, AKIHISA; ADACHI, SAKUICHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 030794/0352 →