Scanning electron microscope
View Patent ↗To provide a low acceleration scanning electron microscope that can discriminate and detect reflected electrons and secondary electrons even with a low probe current, this scanning electron microscope is provided with an electron gun ( 29 ), an aperture ( 26 ), a sample table ( 3 ), an electron optical system ( 4 - 1 ) for making an electron beam ( 31 ) converge on a sample ( 2 ), a deflection means ( 10 ), a secondary electron detector ( 8 ), a reflected electron detector ( 9 ), and a cylindrical electron transport means ( 5 ) in a position between the electron gun ( 29 ) and sample ( 2 ). The reflected electron detector ( 9 ) is provided within the electron transport means ( 5 ) and on a side further away from the electron gun ( 29 ) than the secondary electron detector ( 8 ) and the deflection means ( 10 ). The reception surface ( 9 - 1 ) of the reflected electron detector ( 9 ) is electrically wired so as to have the same potential as the electron transport means ( 5 ).
1. A scanning electron microscope comprising:
an electron source generating an electron beam to be used as a probe;
an aperture limiting a diameter of the electron beam;
a specimen holder on which a specimen to be irradiated with the electron beam is placed;
an objective lens for converging the electron beam on a surface of the specimen;
a deflection means for scanning the electron beam on the specimen to be irradiated with the electron beam;
a secondary electron detector detecting secondary electrons from the specimen;
a backscattered electron detector detecting backscattered electrons from the specimen or conversion electrons deriving from the backscattered electrons; and
a cylindrical electron transport means in a position between the electron source and the specimen to be placed on the specimen holder,
wherein a detector plane of the backscattered electron detector is located inside the electron transport means and on a farther side from the electron source than the secondary electron detector and the deflection means, and
the detector plane of the backscattered electron detector is electrically coupled to have the same potential as the electron transport means.
2. The scanning electron microscope according to claim 1 ,
wherein the objective lens includes an electrostatic lens and a magnetic lens, and
the magnetic lens is of a semi-in-lens type.
3. The scanning electron microscope according to claim 1 ,
wherein the objective lens includes an electrostatic lens and a magnetic lens, and
the magnetic lens is of an out-lens type.
4. The scanning electron microscope according to claim 3 , further including:
an electrode in a gap between the specimen and the electron transport means to convert the backscattered electrons into the conversion electrons.
5. The scanning electron microscope according to claim 3 ,
wherein there are two of the backscattered electron detectors arranged to be line-symmetric with respect to an optical axis, and
the two backscattered electron detectors are arranged so that the principal plane of the magnetic lens is formed closer to the electron source than a specimen side lower end of the two backscattered electron detectors.
6. The scanning electron microscope according to claim 1 , wherein
the backscattered electron detector is a solid state detector, an avalanche diode, or a detector using a scintillator material as a component.
7. The scanning electron microscope according to claim 6 , wherein the detector using the scintillator material is an Everhart-Thornley type detector constituted by a scintillator, a light guide, and a photomultiplier tub.
8. The scanning electron microscope according to claim 7 , wherein the light guide is an optical fiber.
9. The scanning electron microscope according to claim 7 , wherein the light guide and the scintillator are equipped with a scintillator fiber.
10. The scanning electron microscope according to claim 7 , wherein the scintillator is provided with a film of a conductor on its surface.
11. The scanning electron microscope according to claim 1 , wherein the backscattered electron detector has an opening portion for allowing the secondary electrons to pass therethrough.
12. A scanning electron microscope comprising an electron source, a specimen holder, electron optics including an acceleration tube and an objective lens, accelerating and then retarding electrons emitted from the electron source, and irradiating a specimen placed on the specimen holder with the electrons as an electron beam, a secondary electron detector for detecting secondary electrons from the specimen caused by irradiation of the electron beam, and a backscattered electron detector for detecting backscattered electrons or conversion electrons deriving from the backscattered electrons,
wherein the backscattered electron detector has an opening portion in its central portion with its detector plane being located inside the acceleration tube, and
the detector plane of the backscattered electron detector is electrically coupled to have the same potential as the acceleration tube.
13. The scanning electron microscope according to claim 12 , wherein the secondary electron detector detects the secondary electrons having passed through the opening portion of the backscattered electron detector.
14. The scanning electron microscope according to claim 12 , wherein the detector plane of the backscattered electron detector is electrically connected to the acceleration tube via a conductor provided to the detector plane.