IP Library › Granted Patent US 637,098
Granted Patent S1
US 637,098 · App. 29/360,394 · Granted May 3, 2011

Semiconductor testing machine

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Quick Facts
Patent No.
US 637,098
App. No.
29/360,394
Granted
May 3, 2011
Kind
S1
Claims (1)

The ornamental design for a semiconductor testing machine, as shown.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →