Granted Patent
S1
US 679,411 · App. 29/411,275 · Granted Apr 2, 2013
Sample holder for an electron microscope
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Claims (1)
We claim the ornamental design for a sample holder for an electron microscope, as shown and described.
Assignments (1)
CHANGE OF NAME AND ADDRESS
Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →