Scanning electron microscope
View Patent ↗Disclosed is a scanning electron microscope capable of checking an abrupt change of probe current due to changes in intensities of the respective condenser lenses when the probe current is intended to be changed by changing the intensities of the respective condenser lenses. The scanning electron microscope includes: an electron source for generating a beam of electrons; a first and second condenser lenses each for condensing the beam of electrons; an object lens for narrowly focusing the beam of electrons on a sample; a deflecting system for two-dimensionally scanning over the sample; and a detecting system for detecting secondary electrons generated from the sample due to the irradiation of the beam of electrons on the sample. In the scanning electron microscope, a first and second aperture plates each for blocking parts of the beam of electrons unnecessary for the sample are sequentially arranged between the first and second condenser lenses.
1. A scanning electron microscope including:
an electron source for generating an electron beam;
a first and second condenser lenses each for condensing the electron beam;
an object lens for narrowly focusing the electron beam on a sample;
a deflecting system for two-dimensionally scanning over the sample;
a detecting system for detecting secondary electrons which are generated from the sample due to the irradiation of the electron beam on the sample; and
a first aperture plate having a first aperture and a second aperture plate having a second aperture that are sequentially arranged between the first and second condenser lenses,
wherein the electron beam that passes the second aperture consists of the electron beam whose axis is parallel to a central axis of the first aperture.
2. The scanning electron microscope as recited in claim 1 , wherein the diameter of an aperture of the second aperture plate arranged closer to the sample is set larger than that of an aperture of the first aperture plate arranged closer to the electron source.
3. The scanning electron microscope as recited in claim 1 , wherein the diameter of the aperture of the second aperture plate arranged closer to the sample is set equal to that of the aperture of the first aperture plate arranged closer to the electron source.
4. The scanning electron microscope as recited in claim 1 , wherein each of the aperture plates includes a mechanism of enabling the aperture plate to two-dimensionally move in a plane perpendicular to an optical axis along which the electron beam travels.
5. The scanning electron microscope as recited in claim 2 , wherein each of the aperture plates includes a mechanism of enabling the aperture plate to two-dimensionally move in a plane perpendicular to an optical axis along which the electron beam travels.
6. The scanning electron microscope as recited in claim 3 , wherein each of the aperture plates includes a mechanism of enabling the aperture plate to move two-dimensionally in a plane perpendicular to an optical axis along which the electron beam travels.
7. The scanning electron microscope as recited in claim 1 , comprising a controlling means for controlling the intensities respectively of the condenser lenses in order to change an amount of electrons traveling through the respective aperture plates.
8. The scanning electron microscope as recited in claim 2 , comprising a controlling means for controlling the intensities respectively of the condenser lenses in order to change an amount of electrons traveling through the respective aperture plates.
9. The scanning electron microscope as recited in claim 3 , comprising a controlling means for controlling the intensities respectively of the condenser lenses in order to change an amount of electrons traveling through the respective aperture plates.
10. The scanning electron microscope as recited in claim 4 , comprising a controlling means for controlling the intensities respectively of the condenser lenses in order to change an amount of electrons traveling through the respective aperture plates.