Electron microscope
View Patent ↗Provided is an electron microscope wherein a detector requiring the application of a voltage is used to obtain a micrograph from a sample placed in a gas atmosphere. The electron microscope is provided with a gas inlet device for emitting gas onto a sample, and a gas control device controlling the amount of gas emitted by the gas inlet device so that, during the gas emission by the gas inlet device, the degree of vacuum within the space where the detector ( 49 - 51, 55 ) is installed is continuously maintained to less than a set value.
1. An electron microscope that includes an electron source for irradiation of a sample with an electron beam; and a detector for detecting an electron generated from the sample by irradiation with the electron beam, and generates an image of the sample based on an output from the detector,
the electron microscope comprising:
a gas inlet portion for introducing a gas to the sample;
a display section for displaying the generated image; and
a control unit for controlling the gas inlet portion,
wherein a plurality of the detectors are provided,
the display section simultaneously saves and plays back, as a plurality of moving images, a plurality of images generated based on outputs from the plural detectors, and
an arbitrary shape on the moving image is specified so as to trace the shape by image correlation and a movement trajectory of the shape is displayed.
2. The electron microscope according to claim 1 ,
wherein a drift-free image is displayed on the moving image by specifying an arbitrary shape on the moving image so as to trace the shape in a moving image file by image correlation, and fixing the field to the traced position.
3. An electron microscope that includes an electron source for irradiation of a sample with an electron beam; and a detector for detecting an electron generated from the sample by irradiation with the electron beam, and generates an image of the sample based on an output from the detector,
the electron microscope comprising:
a gas inlet portion for introducing a gas to the sample;
a display section for displaying the generated image; and
a control unit for controlling the gas inlet portion,
wherein a plurality of the detectors are provided,
the display section simultaneously displays a plurality of images generated based on outputs from the plural detectors, and
an arbitrary shape on the image is specified so as to trace the shape by image correlation and a movement trajectory of the shape is displayed.
4. The electron microscope according to claim 3 , further comprising a field moving device for electromagnetically or mechanically moving the field,
wherein a drift-free image is displayed by specifying an arbitrary shape on the image so as to trace the shape on the displayed images by image correlation, and moving the field to a specified position by means of the field moving device.
5. The electron microscope according to claim 3 ,
wherein the movement of a feature point in the image is detected so as to extract a traced shape in each field, and the area and perimeter of the extracted shape are measured.