Charged particle beam apparatus
An object of the invention is to provide a charged particle beam apparatus which can perform optimized adjustment of a focusing condition of a charged particle beam focused on a sample and optimized adjustment of an orbit of a charged particle emitted from the sample. In order to achieve the above-described object, there is provided a charged particle beam apparatus including a passage restriction member that partially restricts passage of a charged particle emitted from a sample, a first lens that is arranged between the passage restriction member and the sample, and that controls an orbit of the charged particle emitted from the sample, and a second lens that is arranged between the passage restriction member and the charged particle source, and that changes a focusing condition of the charged particle beam in accordance with a control condition of the first lens.
1. A charged particle beam apparatus including a focusing lens for focusing a charged particle beam emitted from a charged particle source and an objective lens for focusing and emitting the charged particle beam focused by the focusing lens to a sample, comprising:
a passage opening restriction member, including a passage opening through which a part of charged particles emitted upward from the sample and the charged particle beam emitted from the charged particle source pass, that partially restricts passage of the charged particle emitted upward from the sample;
a detector configured to detect a new charged particle generated by collision of the passage opening restriction member and the charged particle emitted from the sample and for which a passage is restricted by the passage opening restriction member;
a first lens that is arranged between the passage restriction member and the sample, and that controls an orbit of the charged particle emitted from the sample; and
a second lens that is arranged between the passage restriction member and the charged particle source, and that changes a focusing condition of the charged particle beam in accordance with a control condition of the first lens.
2. The charged particle beam apparatus according to claim 1 ,
wherein the second lens is arranged between an object point of the objective lens and the passage restriction member.
3. The charged particle beam apparatus according to claim 1 , further comprising:
a detector configured to detect the charged particle which is emitted from the sample and passes through the passage opening restriction member or a new charged particle generated by the charged particle colliding with other members.
4. The charged particle beam apparatus according to claim 1 ,
wherein the passage restriction member includes an opening through which the charged particle beam emitted from the charged particle source passes.
5. A charged particle beam apparatus including a focusing lens for focusing a charged particle beam emitted from a charged particle source and an objective lens for focusing and emitting the charged particle beam focused by the focusing lens to a sample, comprising:
a passage opening restriction member, including a passage opening through which a part of charged particles emitted upward from the sample and the charged particle beam emitted from the charged particle source pass, that partially restricts passage of the charged particle emitted upward from the sample;
a detector configured to detect a new charged particle generated by collision of the passage opening restriction member and the charged particle emitted from the sample and for which a passage is restricted by the passage opening restriction member;
a first lens that is arranged between the passage restriction member and the sample;
a second lens that is arranged between the passage restriction member and the charged particle source;
a detector configured to detect the charged particle obtained based on the charged particle beam emitted to the sample; and
a control device configured to control the first lens and the second lens;
wherein the control device is configured to control the first lens so that at least one portion of an image, generated based on an output of the detector, is brought into a predetermined state, and while maintaining the control of the first lens, the control device is configured to control the second lens so that at least one portion of the image is brought into a predetermined state.
6. The charged particle beam apparatus according to claim 5 ,
wherein the second lens is arranged between an object point of the objective lens and the passage restriction member.
7. The charged particle beam apparatus according to claim 5 ,
wherein the control device is configured to control the first lens so that contrast of at least one portion of the image satisfies a predetermined condition.
8. The charged particle beam apparatus according to claim 5 ,
wherein the control device is configured to control the first lens so that contrast of at least one portion of the image satisfies a predetermined condition, and further controls the second lens so that a focus evaluation value of at least one portion of the image satisfies a predetermined condition.
9. The charged particle beam apparatus according to claim 5 ,
wherein the control device is configured to control the first lens so that both a first portion and a second portion inside the image are brought into a predetermined image state, and is configure to further control the second lens so that both the first portion and the second portion are brought into a predetermined image state.
10. The charged particle beam apparatus according to claim 9 ,
wherein the control device is configured to control the first lens so that image contrast of the first portion and the second portion inside the image is brought into a predetermined state, and while maintaining a state of the first lens, the control device is configured to control the second lens so that a focus evaluation value of the first portion and the second portion satisfies a predetermined condition.