Charged particle beam apparatus
View Patent ↗There is provided a compact charged particle beam apparatus with a non-evaporable getter pump which maintains high vacuum even during emission of an electron beam without generating foreign particles. The apparatus comprises: a charged particle source; a charged particle optics which focuses a charged particle beam emitted from the charged particle source on a sample and performs scanning; and means of vacuum pumping which evacuates the charged particle optics. The means of vacuum pumping has a differential pumping structure with two or more vacuum chambers connected through an opening in series. A pump made of non-evaporable getter alloy is placed in an upstream vacuum chamber with a high degree of vacuum, and a gas absorbing surface of the non-evaporable getter alloy is fixed without contact with another part.
1. A charged particle beam apparatus comprising:
a charged particle source;
a charged particle optics which focuses a charged particle beam emitted from the charged particle source on a sample and performs scanning; and
means of vacuum pumping which evacuates the charged particle optics,
wherein:
the means of vacuum pumping has a differential pumping structure with two or more vacuum chambers connected through an opening in series,
a pump made of non-evaporable getter alloy is placed in an upstream vacuum chamber with a high degree of vacuum, and
a gas absorbing surface of the non-evaporable getter alloy is fixed without contact with another part.
2. The charged particle beam apparatus according to claim 1 , wherein the non-evaporable getter pump has a deposition of non-evaporable getter alloy on one side of a metal sheet.
3. The charged particle beam apparatus according to claim 1 , wherein the non-evaporable getter pump is placed in the upstream vacuum chamber and the pump surface on which the non-evaporable getter alloy is deposited is on the vacuum side and the pump surface on which the non-evaporable getter alloy is not deposited is fixed in contact with an inner wall surface of the vacuum chamber with a high degree of vacuum.
4. The charged particle beam apparatus according to claim 1 , wherein the side of the non-evaporable getter pump on which non-evaporable getter alloy is deposited has some areas without non-evaporable getter alloy and means for fixation is provided on the area and fixed in the upstream vacuum chamber.
5. The charged particle beam apparatus according to claim 1 , wherein an additional chamber for the upstream vacuum chamber is provided and pellets made by binding non-evaporable getter alloy particles is placed in the additional chamber.
6. The charged particle beam apparatus according to claim 5 , wherein a porous mesh is placed between the upstream vacuum chamber and the additional chamber.
7. The charged particle beam apparatus according to claim 5 , wherein a heater is located on the lower surface of the additional chamber.
8. The charged particle beam apparatus according to claim 5 , wherein a vacuum gauge is provided in the additional chamber.
9. The charged particle beam apparatus according to claim 5 , wherein an opening between the additional chamber and the upstream vacuum chamber is in a position higher than the pellets.
10. The charged particle beam apparatus according to claim 1 ,
wherein:
the means of vacuum pumping has a differential pumping structure which is comprised of three or more vacuum chambers connected through an opening in series,
a pump made of non-evaporable getter alloy is placed in an upstream vacuum chamber with a high degree of vacuum,
a vacuum chamber which lies downstream of the upstream vacuum chamber and has a lower degree of vacuum than the upstream vacuum chamber is connected with a vacuum chamber which lies downstream of the downstream vacuum chamber and has a lower degree of vacuum than the downstream vacuum chamber through a valve which is able to adjust flow rate, and
a turbo-molecular pump is provided to evacuate the vacuum chamber which has the lowest degree of vacuum.
11. A charged particle beam apparatus comprising:
a charged particle source;
a charged particle optics which focuses a charged particle beam emitted from the charged particle source on a sample and performs scanning; and
means of vacuum pumping which evacuates the charged particle optics,
wherein:
the means of vacuum pumping has a differential pumping structure with two or more vacuum chambers connected through an opening in series, and
a second pump made of grained non-evaporable getter alloy with particles on the order of less than 10 millimeters is placed in an upstream vacuum chamber with a high degree of vacuum.
12. The charged particle beam apparatus according to claim 11 ,
wherein:
a first pump made of non-evaporable getter alloy with finer particles than the grained non-evaporable getter alloy is placed in a first vacuum chamber with a high degree of vacuum located most upstream, and
a second pump made of the grained non-evaporable getter alloy is placed in a second vacuum chamber which is located downstream of the first vacuum chamber and has a lower degree of vacuum than the first vacuum chamber.
13. The charged particle beam apparatus according to claim 12 , wherein a gas absorbing surface of the non-evaporable getter alloy of the first pump is fixed without contact with another part, and the non-evaporable getter alloy particles of the second pump are held around a heater by mesh texture metal.
14. The charged particle beam apparatus according to claim 12 , wherein the non-evaporable getter alloy of the second pump is comprised of particles of about 3 mm square.
15. The charged particle beam apparatus according to claim 14 , wherein a surface of the non-evaporable getter alloy of the second pump has a convexo-concave shape with cycles of several microns to several dozen microns and has an increased effective surface area.
16. The charged particle beam apparatus according to claim 11 , wherein the means of vacuum pumping has a differential pumping structure which is comprised of three or more vacuum chambers connected through an opening in series, and the vacuum chambers are connected by a rough pumping port and vacuum is controlled by a separate valve for each chamber.
17. The charged particle beam apparatus according to claim 1 , wherein the charged beam source is a thermal field emitter electron gun.
18. A charged particle beam apparatus comprising:
an ion source;
an ion illumination optics which focuses an ion beam emitted from the ion source on a sample and performs scanning; and
means of vacuum pumping which evacuates the ion illumination optics,
a surface of the sample being processed by irradiation with the ion beam,
wherein:
the means of vacuum pumping has a differential pumping structure with two or more vacuum chambers connected through an opening in series,
a pump made of non-evaporable getter alloy is placed in an upstream vacuum chamber with a high degree of vacuum, and
a gas absorbing surface of the non-evaporable getter alloy is fixed without contact with another part.
19. The charged particle beam apparatus according to claim 18 , wherein the non-evaporable getter pump has a deposition of non-evaporable getter alloy on one side of a metal sheet.
20. The charged particle beam apparatus according to claim 18 , wherein the non-evaporable getter pump is placed in the upstream vacuum chamber and the pump surface on which the non-evaporable getter alloy is deposited is on the vacuum side and the pump surface on which the non-evaporable getter alloy is not deposited is fixed in contact with an inner wall surface of the vacuum chamber with a high degree of vacuum.